Device for measurement of electrical impedance of organic and biological materials

• US 5,353,802 A
• Filed: 04/16/1993
• Issued: 10/11/1994
• Est. Priority Date: 10/18/1990
• Status: Expired due to Term

• Current Assignee: Centrum For Dentalteknik Och Biomaterial
• Original Assignee: Centrum For Dentalteknik Och Biomaterial
• Inventors: Ollmar, Stig
• Primary Examiner(s): Sykes, Angela D.
• Application Number:
  US08/039,361
• Time in Patent Office: 543 Days
• Field of Search: 128/734-735, 128/741, 128/632, 128/635-636, 128/639, 128/642-644
• US Class Current: 600/547
• CPC Class Codes: A61B 3/16 for measuring intraocular pressure, e.g. tonometers
• CPC Class Codes: A61B 5/0531 Measuring skin impedance

Abstract

A device and method for noninvasive depth-selective detection and characterization of surface phenomena in organic and biological material such as tissues by surface measurement of the electrical impedance of the material. The device includes a probe with a plurality of measuring electrodes separated by a control electrode. Measuring equipment measures impedance in a desired frequency range. An adjustable amplifier maintains a chosen control signal derived from the potential of one of the measuring electrodes at the control electrode without loading the measuring electrode. Depth selectivity is achieved by controlling the extension of the electric field in the vicinity of the measuring electrodes by the control electrode actively driven with the same frequency as the measuring electrodes.

Claims

1. A device for depth-selective measurement of electrical impedance in a test portion of organic or biological materials comprising:

a probe having a plurality of measuring electrodes and a control electrode located between at least two of the measuring electrodes, one of the measuring electrodes also forming a predetermined reference electrode;

voltage and impedance measuring means for applying electrical potential over the measuring electrodes and for measuring electrical impedance of the test portion between the measuring electrodes; and

an amplifier that has a high-impedance input that is electrically connected to the reference electrode, the reference electrode remaining substantially unloaded by the amplifier, the amplifier also having a low-impedance output that is electrically connected to the control electrode;

an electric control field being adapted to extend from the control electrode into the test portion; and

a dynamic electrical potential of the control electrode being maintained during impedance measuring of the test portion.

2. A device as defined in claim 1, in which the amplitude of the electrical potential applied over the measuring electrodes is no more than 50 millivolts.

3. A device as defined in claim 2, in which the amplitude of the electrical potential applied over the measuring electrodes is no more than 25 millivolts.

4. A device as defined in claim 1, further including control means for varying a transfer function of the amplifier with respect to both gain and phase.

5. A device as defined in claim 4, in which a gain of the amplifier is variable within the range 0.01 to 10.00 and corresponds to a desired field penetration depth and the phase of the amplifier is set at a minimum phase value.

6. A device as defined in claim 1, said probe having a contact surface and said device further including:

electrically insulating material between the measuring electrodes and the control electrode;

the measuring electrodes, the control electrode and the insulating material being flush with one another at the contact surface;

whereby;

any residual liquid layer between the probe and the test portion during operation of the device is minimized.

7. A device as defined in claim 6, further including a conductive shield surrounding the probe except for the contact surface and maintained at the potential of the control electrode.

8. A device as defined in claim 1, in which the voltage and impedance measuring means applies the electrical potential over the measuring electrodes at a first and a second frequency for measurement of irritation impedance values in the test portion.

9. A device as defined in claim 8, in which the first frequency is greater than 100 kHz and the second frequency is less than 100 kHz, the electrical potential when at the first frequency forming a normalizing signal corresponding to the geometry of the test portion.

10. A device as defined in claim 1, in which the voltage and impedance measuring means further measures impedance at a predetermined number of predetermined frequencies.

11. A device as defined in claim 1, in which the measuring electrodes and the control electrode are substantially annular and concentric and are separated by an insulating material.

12. A device as defined in claim 1, in which the distance between the control electrode and each respective one of the measuring electrodes is substantially equal to a respective one of a predetermined number of penetration depths.

13. A device as defined in claim 12, in which:

the number of measuring electrodes is greater than two, with a predetermined one of the measuring electrodes forming a primary measuring electrode and with the remaining measuring electrodes forming switchable electrodes; and

further including depth selection means for electrically connecting and disconnecting selected ones of the switchable electrodes to each other and to the control electrode.

14. A method for depth-selective, non-invasive characterization of a test portion of organic and biological materials, comprising the following steps:

A) applying to a test surface of the test portion a probe that includes a plurality of measuring electrodes and a control electrode located between at least two of the measuring electrodes, one of the measuring electrodes also forming a predetermined reference electrode;

B) applying electrical voltage to the measuring electrodes;

C) applying a variable voltage to the control electrode with a predetermined phase shift and non-zero amplitude gain relative to the electrical voltage of a predetermined one of the measuring electrodes; and

D) measuring electrical impedance of the test portion between the measuring electrodes.

15. A method as defined in claim 14, further including the steps of varying the voltage applied to the control electrode until the phase shift achieves a minimum and setting the predetermined phase shift to the minimum.

16. A method as defined in claim 14, further including the following steps:

A) measuring impedance values in the test portion by applying voltage to the measuring electrodes sequentially at a plurality of frequencies, including a first frequency, which forms a normalization frequency, and a second frequency, which is lower than the first frequency; and

B) calculating an irritation impedance value as a predetermined function of the measured impedance values at the plurality of frequencies.

17. A method as defined in claim 14, further including the following steps:

A) determining a desired measurement electric field depth; and

B) changing the distance between the control electrode and selected ones of the measuring electrodes to correspond to the desired measurement electric field depth by selectively switching the selected measuring electrodes into electrical contact with the control electrode.