Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method

• US 5,363,697 A
• Filed: 04/29/1992
• Issued: 11/15/1994
• Est. Priority Date: 04/30/1991
• Status: Expired due to Term

• Current Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Original Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Inventors: Nakagawa, Tohru
• Primary Examiner(s): Williams, Hezron E.
• Assistant Examiner(s): LARKIN, DANIEL SEAN
• Application Number:
  US07/875,694
• Time in Patent Office: 930 Days
• Field of Search: 73/105, 250/306, 250/307
• US Class Current: 73/105
• CPC Class Codes: B82Y 30/00 Nanotechnology for materials or surface science, e.g. nanocomposites
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 60/42 Functionalisation
• CPC Class Codes: G01Q 60/60 SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes
• CPC Class Codes: Y10S 977/728 Nucleic acids, e.g. DNA or RNA
• CPC Class Codes: Y10S 977/849 with scanning probe
• CPC Class Codes: Y10S 977/852 for detection of specific nanostructure sample or nanostructure-related property
• CPC Class Codes: Y10S 977/853 Biological sample
• CPC Class Codes: Y10S 977/86 Scanning probe structure
• CPC Class Codes: Y10S 977/877 Chemically functionalized
• CPC Class Codes: Y10S 977/879 Material
• CPC Class Codes: Y10S 977/881 Microscopy or spectroscopy, e.g. sem, tem
• CPC Class Codes: Y10S 977/924 using nanostructure as support of dna analysis
• CPC Class Codes: Y10S 977/958 Of biomolecule property

Abstract

This invention relates to a scanning probe microscope which examines or processes directly the structure of substance surfaces at the molecular or atomic level, and a method for processing molecules using a scanning probe microscope and a method for detecting DNA base arrangement. A scanning probe microscope has a probe approaching or contacting the substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is interacted or chemically reacted between the substance surface and the molecules or atom groups which act as a sensor and are fixed on the probe, scanning at an atomic level of precision. Therefore, surface structure within a microscopic region can be examined or processed at the molecular or atomic level. A method for detecting DNA base arrangement with any one of three or four kinds of probes fixed with any one of four different kinds of molecules interacting four kinds of bases consisting of DNA, by approaching single stranded DNA fixed on a substrate, measuring the force and scanning by an atomic force microscope at an atomic level of precision.

Claims

1. A scanning probe microscope comprising a probe approaching or contacting a substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is interacted or chemically reacted between the substance surface and molecules or atom groups which act as a sensor are fixed on the probe to form a chemically adsorbed monomolecular film, and the probe is scanned at an atomic level of precision.

2. The scanning probe microscope according to claim 1, wherein the scanning probe microscope is an atomic force microscope and the physical quantity to be detected is an atomic force.

3. A scanning probe microscope comprising a probe approaching or contacting a substance surface to detect a physical quantity between the substance surface and the probe wherein the probe is separated and transferred to approach or contact the substance surface repeatedly, and wherein the physical quantity is what is interacted or chemically reacted between the substance surface and molecules or atom groups which act as a sensor and are fixed on the probe to form a chemically adsorbed monomolecular film.

4. The scanning probe microscope according to claim 3, wherein the scanning probe microscope is an atomic force microscope and the physical quantity to be detected is an atomic force.

5. A method for processing molecules of a substance surface at the molecular or atomic level comprising strongly interacting or chemically reacting molecules or atom groups fixed to the scanning probe to form a chemically adsorbed monomolecular film, and detecting a physical quantity which is measured through the probe by approaching or contacting the substance surface.

6. The method according to claim 5, wherein the molecules are processed with an atomic force microscope and the physical quantity being interacted between molecules or atom groups which are fixed on the probe and the substance surface is an atomic force.