Optical low-coherence reflectometer using optical attenuation

• US 5,365,335 A
• Filed: 03/18/1994
• Issued: 11/15/1994
• Est. Priority Date: 05/27/1992
• Status: Expired due to Term

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Sorin, Wayne V.
• Primary Examiner(s): Housel, James C.
• Assistant Examiner(s): Pyon, Harold Y.
• Application Number:
  US08/210,656
• Time in Patent Office: 242 Days
• Field of Search: 356/73.1, 356/345, 356/349, 250/227.19, 250/227.27, 385/12
• US Class Current: 356/479
• CPC Class Codes: G01M 11/3172 Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
• CPC Class Codes: G02B 6/266 the optical element being an attenuator

Abstract

A low-coherence reflectometer for use in measuring optical backscattering. The invention utilizes an optical attenuation in the reference arm of a Michelson interferometer to reduce the relative intensity noise. The invention obtains essentially the same performance as obtained with balanced detector schemes while maintaining the simplicity of the Michelson interferometer design and increased scan distance.

Claims

1. An optical interferometer for measuring the optical properties of a device, said interferometer comprising:

source means for providing a low-coherence light signal;

first splitting means for dividing said low-coherence light signal into first and second light signals, said first light signal being applied to said device and said second light signal being directed into a reference optical path, said first splitting means further comprising means for combining light returning from said device and from said reference optical path and applying said combined light to a first optical detector;

means disposed in said reference optical path for attenuating the light signals traveling therein, said attenuation being chosen to reduce the relative intensity noise generated in said first optical detector. Said attenuating means attenuating said light from said reference optical path that is combined with said light returning from said device by said first splitting means;

means for varying the optical path length of said reference optical path relative to the optical path between said splitting means and said device.

2. The optical interferometer of claim 1 wherein said attenuating means comprises a gap in an optical fiber in said reference optical path.

3. The optical interferometer of claim 1 further comprising:

second beam splitting means for applying a portion of the light returning from said source means to a second optical detector and means for subtracting the output of said second optical detector from the output of said first optical detector.