Structure and method for programming antifuses in an integrated circuit array

• US 5,367,207 A
• Filed: 12/04/1990
• Issued: 11/22/1994
• Est. Priority Date: 12/04/1990
• Status: Expired due to Term

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Goetting, F. Erich, Parlour, David B., Mahoney, John E.
• Primary Examiner(s): Westin, Edward P.
• Assistant Examiner(s): SANDERS, ANDREW
• Application Number:
  US07/625,732
• Time in Patent Office: 1,449 Days
• Field of Search: 307/465, 307/468, 307/469, 307/449, 307/202.1, 307/463, 364/784
• US Class Current: 326/38
• CPC Class Codes: G11C 17/18 Auxiliary circuits, e.g. for writing into memory

Abstract

This invention provides a structure and method for interconnecting logic devices through line segments which can be joined by programming antifuses. One of several programming lines can be connected through an interconnect line segment to each terminal of each antifuse in the array. Interconnect line segments connected to opposite terminals of the same antifuse are connected to a different programming line in order to be able to apply different voltages to the two terminals of the antifuse. An addressing structure selectively connects interconnect line segments to their respective programming lines, and programming voltages applied to the programming lines cause a selected antifuse to be programmed. A novel addressing feature sequentially addresses two transistors for the line segments to be connected, and takes advantage of a capacitive pumped decoder to maintain the addressed transistors turned on while programming voltages are applied. The structure also allows for testing of logic devices by applying test voltages to the programming voltage lines and/or sensing logic device output on programming voltage lines. The structure and method also permit measuring resistance of the programmed antifuses. No separate testing overhead structure is needed.

Claims

1. A structure for programming an array of antifuses in an integrated circuit structure comprising:

a set of programming voltage lines to which programming voltages can be applied;

a plurality of antifuses;

a plurality of interconnect line segments, each connected to one terminal of at least one of said antifuses; and

means for selectively connecting each of said interconnect line segments to one of said programming voltage lines and applying a known voltage difference across each of said antifuses regardless of the states of other antifuses.

2. A structure for programming an array of antifuses in an integrated circuit structure as in claim 1 in which said means for selectively connecting each of said interconnect line segments to one of said programming voltage lines comprises, for each of said interconnect line segments:

a programming voltage transistor having a first current carrying terminal connected to said line segment, a second current carrying terminal connected to one of said programming voltage lines, and a control terminal connected to means for turning on said programming voltage transistor.

3. A structure for programming an array of antifuses in an integrated circuit structure as in claim 2 in which said means for turning on said programming voltage transistor comprises;

a pumped decoder, said pumped decoder providing an output voltage sufficient to turn on said programming voltage transistor in response to being addressed with voltages not sufficient to program said antifuses.

4. A structure for programming an array of antifuses in an integrated circuit structure as in claim 3 in which said programming voltage transistor is an NMOS transistor and said pumped decoder provides to said control terminal of said programming voltage transistor a turn-on voltage of magnitude higher than a magnitude of said programming voltages.

5. A structure for programming an array of antifuses in an integrated circuit structure as in claim 1 in which some of said interconnect line segments connect to logic devices in said integrated circuit structure, whereby said programming voltage lines can be used for testing said logic devices without need for programming said antifuses.

6. The structure of claim 1, further comprising means for testing the structure.

7. The structure of claim 6, wherein the means for testing includes resistive means connected between the means for selectively connecting and a supply voltage.

8. A structure for programming an array of antifuses comprising:

a set of programming voltage lines to which programming voltages can be applied;

a plurality of antifuses;

connecting means for connecting a different one of the programming voltage lines to each terminal of an antifuse; and

pumping means connected to each of the connecting means for causing the programming voltages to be applied to the terminals of the antifuse.

9. A method for programming an antifuse in an integrated circuit structure comprising the steps of:

addressing an interconnect line attached to a first terminal of said antifuse, thereby causing said first terminal to be connected to a first programming voltage line;

addressing an interconnect line attached to a second terminal of said antifuse, thereby causing said second terminal to be connected to a second programming voltage line;

simultaneously applying a first programming voltage to said first programming voltage line and a second programming voltage to said second programming voltage line, thereby causing said antifuse to become permanently conductive.

10. A method for programming an antifuse in an integrated circuit structure as in claim 9 in which said steps of addressing said interconnect lines attached to said first and second terminals of said antifuse are performed sequentially such that a time at which said first interconnect line is addressed does not overlap with a time at which said second interconnect line is addressed.

11. A method for programming an antifuse in an integrated circuit structure as in claim 9 in which:

said step of addressing an interconnect line attached to a first terminal of said antifuse comprises applying addressing voltages to horizontal and vertical address lines connected to a first decoder which turns on a transistor which connects said interconnect line to said first programming voltage line; and

said step of addressing an interconnect line attached to a second terminal of said antifuse comprises applying addressing voltages to horizontal and vertical address lines connected to a second decoder which turns on a transistor which connects said interconnect line to said second programming voltage line.

12. A method for programming an antifuse in an integrated circuit structure as in claim 11 in which said transistors are NMOS transistors and said first NMOS transistor has a capacitance sufficient to remain turned on after no longer being addressed for said first programming voltage to be applied to said first interconnect line.

13. A method for programming an antifuse in an integrated circuit structure as in claim 12 in which said step of applying addressing voltages to said first decoder is performed before said step of applying addressing voltages to said second decoder.

14. A method for programming an antifuse as in claim 13 in which said first programming voltage applied to said first programming line is a lower voltage than said second programming voltage applied to said second programming line.

15. In an integrated circuit structure in which antifuses may connect interconnect line segments to a logic device through direct connect line segments connected directly to said logic device and in which programming voltages may be applied through programming voltage lines to said interconnect line segments for programming said antifuses, a method for testing said logic device without programming said antifuses comprising the steps of:

causing some of said direct connect line segments connected to said logic device to be connected to corresponding programming voltage lines; and

applying test voltages to at least one of said programming voltage lines and observing voltages placed by said logic device on at least one of said programming voltage lines.

16. A method for testing as in claim 15 further comprising the step of connecting at least some of said direct connect line segments to a supply voltage source.

17. A method for determining programmed resistance of an antifuse in a structure having

a plurality of antifuses each positioned between a pair of programming transistors, each pair of programming transistors programmably connecting a corresponding antifuse between programming voltage sources, and

at least one pair of measurement transistors formed to be like said programming transistors and connected in series between said programming voltage sources without an intervening antifuse, comprising the steps of:

programming said antifuse;

applying a voltage difference between said programming voltage sources sufficiently low to cause said measurement transistors to operate in their linear range;

turning on said measurement transistors;

measuring current through said measurement transistors and calculating resistance of said measurement transistors;

turning on programming transistors connecting said antifuse to said programming voltage sources;

measuring current through said programming transistors and said antifuse; and

calculating resistance of said antifuse assuming said programming transistors have resistance equal to that of said measurement transistors.

18. A structure for measuring resistance in a programmed antifuse in an array of antifuses in an integrated circuit structure comprising:

a set of programming voltage lines to which programming voltage can be applied;

a plurality of antifuses;

for each antifuse a first programming voltage transistor for programmably connecting a first terminal of said antifuse to a first one of said programming voltage lines, and a second programming voltage transistor for programmably connecting a second terminal of said antifuse to a second one of said programming voltage lines;

at least one pair of measurement transistors connected in series between two of said programming voltage lines, said measurement transistors being manufactured to have the same resistance characteristics as said programming transistors;

whereby resistance of said measurement transistors can be measured and used as a reliable estimate of resistance of said programming transistors.