Integrated circuit probing apparatus including a capacitor bypass structure

• US 5,373,231 A
• Filed: 06/10/1993
• Issued: 12/13/1994
• Est. Priority Date: 06/10/1993
• Status: Expired due to Term

• Current Assignee: GGB Industries Incorporated
• Original Assignee: G G B Industries Incorporated
• Inventors: Boll, Harry J., Boll, Gregory G.
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): BOWSER, BARRY
• Application Number:
  US08/075,139
• Time in Patent Office: 551 Days
• Field of Search: 324/158 F, 324/158 P, 324/687, 324/537, 324/725
• US Class Current: 324/754.07
• CPC Class Codes: G01R 1/06772 High frequency probes

Abstract

A device for testing the performance of high speed integrated circuits (ICs) while in wafer form or separated from the wafer which includes first and second spaced-apart probes fixedly mounted on a support member for accurately positioning the first and second probes in three dimensions for contacting at least one first point and a second point, respectively, on an IC under test. The first and second probes are interconnected at a predetermined portion of their length by a capacitor means which provides sufficient flexibility so as to facilitate independent movement of the first and second probes and avoid introducing parameters (e.g., inductance) which interfere with high speed testing of the IC. In one embodiment, the first probe is a transmission line probe (e.g., a coaxial line) and the second probe is a wire probe for supplying power to the second point on the IC. In a another embodiment, the first and second probes are wire probes for providing a reference potential and power, respectively, to respective first and second points on the IC. The capacitor means can consist of just a foil type capacitor, or a capacitor in series with a flexible metal strip having dimensions to minimize inductance for electrically interconnecting the first and second probes. The capacitor functions to block direct current and pass A.C. signals when required.

Claims

1. An electronic probe testing apparatus for use in testing a circuit and providing electrical signals between the circuit to be tested and a testing apparatus during a testing of the circuit comprising:

a first probe which is useful for making an electrical connection to at least one first point of the circuit to be tested;

a second probe which is useful for making contact and supplying power to a second point of the circuit to be tested, the second probe being in a predetermined spaced-apart relationship to the first probe; and

capacitor means having a predetermined capacitance for capacitively coupling the first and second probes, comprising a first terminal which is electrically connected to the first probe and a second terminal which is electrically connected to the second probe, the capacitor means being flexible so as to facilitate independent movement of the first and second probes so as to facilitate contacting of the first and second points, respectively, of the circuit during testing thereof without substantially changing the predetermined capacitance thereof.

2. The electronic probe testing apparatus of claim 1 wherein the first probe provides an essentially resistive impedance and comprises a transmission line comprising a first conductor and a second conductor separated by an insulating medium, a first end of the transmission line probe being adapted to contact the first point of the circuit to be tested.

3. The electronic probe testing apparatus of claim 2 wherein the transmission line is a coaxial line comprising a center conductor and an outer shield separated by an insulating medium.

4. The electronic probe testing apparatus of claim 3 further comprising a signal absorbing material surrounding at least a portion of a length of the outer shield of the coaxial line so as to reduce the amplitude of any signals induced on the outside of the outer shield during use of the electronic probe testing apparatus.

5. The electronic probe testing apparatus of claim 3 further comprising a third probe forming a wire probe which is useful for supplying a reference potential to a third point of the circuit to be tested during use of the electronic probe testing apparatus, the third probe being in a spaced-apart relationship to the first and second probes.

6. The electronic probe testing apparatus of claim 1 further comprising a third probe forming a wire probe which is useful for supplying a reference potential to a third point of the circuit to be tested during use of the electronic probe testing apparatus, the third probe being in a predetermined spaced-apart relationship to the first and second probes.

7. The electronic probe testing apparatus of claim 1 further comprising a signal absorbing material surrounding at least a portion of a length of the second probe so as to reduce the amplitude of any signals induced on the second probe during use of the electronic probe testing apparatus.

8. The electronic probe testing apparatus of claim 1 wherein the capacitor means comprises:

a capacitor comprising a first metallic conductor which is electrically connected to one of the first and second probes, a second metallic conductor, and an insulating medium separating the first and second metallic conductors; and

an electrically conducting metallic strip having a first end which is electrically and mechanically connected to the other one of the first and second probes, and an opposing second end which is electrically and mechanically connected to the second metallic conductor of the capacitor, the metallic strip having dimensions which limits inductance thereof and provides sufficient flexibility so as to facilitate independent movement of the first and second probes.

9. The electronic probe testing apparatus of claim 1 wherein the second probe is stiffer than the capacitor means and a portion of the first probe which is useful for making an electrical connection to the circuit to be tested is stiffer than the capacitor means.

10. The electronic probe testing apparatus of claim 1 further comprising positioning means which is useful to facilitate accurate positioning of the first and second probes in three dimensions so as to bring tips of the first and second probes in contact with the first and second points, respectively, of the circuit under test.

11. The electronic probe testing apparatus of claim 1 wherein the capacitor means comprises a foil type capacitor comprising a first conductor which is electrically and mechanically connected to the first probe, a second conductor which is electrically and mechanically connected to the second probe, and an insulating medium separating the first and second conductors, the capacitor having sufficiently flexibility so as to facilitate independent movement of the first and second probes.

31. The electronic probe testing apparatus of claim 1 wherein the second probe is a wire probe.

12. An electronic probe testing apparatus for use in testing a circuit and providing electrical signals between the circuit to be tested and a testing apparatus during a testing of the circuit comprising:

a first probe comprising a transmission line having a first conductor and a second conductor separated by an insulating medium that provides an essentially resistive impedance, a first end of the first probe being adapted to contact the at least one first point of the circuit to be tested;

a second probe which is useful for making contact and supplying power to a second point of the circuit to be tested, the second probe being in a predetermined spaced-apart relationship to the first probe; and

a capacitor having a predetermined capacitance and comprising a first metallic conductor which is electrically connected to one of the first probe and the second probe, a second metallic conductor connected to the other one of the first probe and the second probe, and an insulating medium separating the first and second metallic conductors, the capacitor having dimensions which limits inductance thereof and sufficient flexibility to facilitate independent movement of the first probe and the second probe without substantially changing the predetermined capacitance thereof.

13. The electronic probe testing apparatus of claim 12 wherein the first probe is a coaxial line comprising a center conductor and an outer shield separated by an insulating medium.

14. The electronic probe testing apparatus of claim 13 further comprising a signal absorbing material surrounding at least a portion of a length of the outer shield of the coaxial line so as to reduce the amplitude of any signals induced on the outside of the outer shield during use of the electronic probe testing apparatus.

15. The electronic probe testing apparatus of claim 13 further comprising a third probe in the form of a wire probe which is useful for supplying a reference potential to a third point of the circuit to be tested during use of the electronic probe testing apparatus, the third probe being in a predetermined spaced-apart relationship to the first and second probes.

16. The electronic probe testing apparatus of claim 12 further comprising a third probe in the form of a wire probe which is useful for supplying a reference potential to a third point of the circuit to be tested during use of the electronic probe testing apparatus, the third probe being in a predetermined spaced-apart relationship to the first and second probes.

17. The electronic probe testing apparatus of claim 12 further comprising a signal absorbing material surrounding at least a portion of a length of the second probe so as to reduce the amplitude of any signals induced on the second probe during use of the electronic probe testing apparatus.

18. The electronic probe testing apparatus of claim 12 further comprising positioning means for facilitating accurate positioning of the first probe and the second probe in three dimensions so as to bring tips of the first probe and the second probe in contact with the first and second points, respectively, of the circuit under test.

19. The electronic probe testing apparatus of claim 12 wherein the capacitor means comprises a foil type capacitor comprising a first conductor which is electrically and mechanically connected to the first probe, a second conductor which is electrically and mechanically connected to the second probe, and an insulating medium separating the first and second conductors, the capacitor being sufficiently flexible so as to facilitate independent movement of the first probe and the second probe.

20. An electronic probe testing apparatus for use in testing a circuit and providing electrical signals between the circuit to be tested and a testing apparatus during a testing of the circuit comprising:

a transmission line probe that provides an essentially resistive impedance and comprises a first conductor and a second conductor separated by an insulating medium, a first end of the transmission line probe being adapted to contact at least one first point of the circuit to be tested;

a wire probe which is useful for making contact and supplying power to a second point of the circuit to be tested, the wire probe being in a predetermined spaced-apart relationship to the transmission line probe;

a capacitor having a predetermined capacitance and comprising a first metallic conductor which is electrically connected to one of the transmission line probe and the wire probe, a second metallic conductor, and an insulating medium separating the first and second metallic conductors;

an electrically conducting metallic strip having a first end which is electrically connected to the other one of the transmission line probe and the wire probe, and an opposing second end which is electrically and mechanically connected to the second metallic conductor of the capacitor, the metallic strip having dimensions which limits inductance thereof and provides for sufficient flexibility so as to facilitate independent movement of the transmission line probe and the wire probe without substantially changing the predetermined capacitance of the capacitor.

21. The electronic probe testing apparatus of claim 20 wherein the transmission line probe is a coaxial line comprising a center conductor and an outer shield separated by an insulating medium.

22. The electronic probe testing apparatus of claim 21 further comprising a signal absorbing material surrounding at least a portion of a length of the outer shield of the coaxial line so as to reduce the amplitude of any signals induced on the outside of the outer shield during use of the electronic probe testing apparatus.

23. The electronic probe testing apparatus of claim 20 further comprising a second wire probe which is useful for supplying a reference potential to a third point of the circuit to be tested during use of the electronic probe testing apparatus, the second probe being in a predetermined spaced-apart relationship to the transmission line probe and the first probe.

24. The electronic probe testing apparatus of claim 23 further comprising a second flexible metal strip having a first end which is electrically and mechanically connected to the second wire probe, and an opposing second end which is electrically connected to the second metallic conductor of the capacitor and to one of the first and second conductors of the transmission line probe, the metallic strip having dimensions which limits inductance thereof and provides for sufficient flexibility so as to facilitate independent movement of the second wire probe and the transmission line probe.

25. The electronic probe testing apparatus of claim 20 further comprising a signal absorbing material surrounding at least a portion of a length of the wire probe so as to reduce the amplitude of any signals induced on the wire probe during use of the electronic probe testing apparatus.

26. The electronic probe testing apparatus of claim 20 further comprising positioning means which is useful to facilitate accurate positioning of the transmission line probe and the wire probe in three dimensions so as to bring tips of the transmission line probe and the wire probe in contact with the first and second points, respectively, of the circuit under test.

27. An electronic probe testing apparatus for use in testing a circuit and providing electrical signals between the circuit to be tested and a testing apparatus during a testing of the circuit comprising:

a first wire probe which is useful for supplying a reference potential to a first point of the circuit to be tested;

a second wire probe which is useful for supplying power to a second point of the circuit to be tested, the second probe being in a predetermined spaced-apart relationship to the first probe; and

capacitor means having a predetermined comprising a first terminal which is electrically connected to the first wire probe and a second terminal which is electrically connected to the second wire probe, the capacitor means having a flexibility so as to facilitate independent movement of the first and second wire probes for contacting the first and second points, respectively, of the circuit to be tested without substantially changing the predetermined capacitance thereof.

28. The electronic probe testing apparatus of claim 27 wherein the capacitor means comprises:

a capacitor comprising a first metallic conductor which is electrically connected to one of the first and second wire probes, a second metallic conductor, and an insulating medium separating the first and second metallic conductors; and

an electrically conducting metallic strip having a first end which is electrically connected to the other one of the first and second wire probes, and an opposing second end which is electrically and mechanically connected to the second metallic conductor of the capacitor, the metallic strip having dimensions which limits inductance thereof and provides sufficient flexibility so as to facilitate independent movement of the first and second wire probes.

29. The electronic probe testing apparatus of claim 27 further comprising positioning means which is useful to facilitate accurate positioning of the first and second wire probes in three dimensions so as to bring tips of the first and second wire probes in contact with the first and second points, respectively, of the circuit under test.

30. The electronic probe testing apparatus of claim 27 wherein the capacitor means comprises a foil type capacitor comprising a first conductor which is electrically and mechanically connected to the first wire probe, a second conductor which is electrically and mechanically connected to the second wire probe, and an insulating medium separating the first and second conductors, the capacitor being sufficiently flexible so as to facilitate independent movement of the first and second wire probes.

32. Electronic probe testing apparatus comprising:

a first probe which is useful for making an electrical connection to at least one first point of an electrical device to be tested;

a second probe which is useful for making an electrical connection to a second point of the electrical device, the second probe being in a predetermined spaced-apart relationship to the first probe; and

capacitor means, which has a predetermined capacitance, for capacitively coupling the first and second probes, the capacitor means comprising a first terminal which is electrically connected to the first probe and a second terminal which is electrically connected to the second probe and being sufficiently flexible to facilitate independent movement of the first and second probes so as to facilitate contacting of the first and second points, respectively, of the electrical device during testing thereof without substantially changing the predetermined capacitance thereof.