Timing markers in time domain reflectometry systems

• US 5,376,888 A
• Filed: 06/09/1993
• Issued: 12/27/1994
• Est. Priority Date: 06/09/1993
• Status: Expired due to Fees

• Current Assignee: Precision Moisture Instruments Incorporated
• Original Assignee: William R. Hook
• Inventors: Hook, William R.
• Primary Examiner(s): Arana, Louis
• Assistant Examiner(s): SOLIS, JOSE M
• Application Number:
  US08/071,748
• Time in Patent Office: 566 Days
• Field of Search: 73/304 R, 73/290 R, 324/532, 324/533, 324/534, 324/643, 324/645, 324/601, 324/535
• US Class Current: 324/643
• CPC Class Codes: G01N 22/04 Investigating moisture content
• CPC Class Codes: G01R 27/06 Measuring reflection coefficients; Measuring standing-wave ratio

Abstract

Time Domain Reflectometry ("TDR") methods and apparatus for measuring propagation velocities of RF pulses to determine material liquid contents, moisture profiles, material levels and dielectric constants including: i) TDR probes and/or probe adaptors, including series averaging probes and multi-segment probes, all employing remotely operable, normally open, variable impedance devices such as diodes; ii) bias insertion and switching networks for rendering selected normally open variable impedance devices conductive one at a time to establish precise unambiguous timing markers T₁ . . . T_n ; iii) an RF cable coupling the probe to a TDR instrument; and, iv) a TDR instrument having: a) a variable impedance device Control Section including a Divide-By-2 circuit and a Diode Drive circuit; b) an RF section containing a Pulse Generator, a Sample-And-Hold circuit, and a Variable Delay circuit; c) a Synchronous Detection Section including a Repetition Rate Generator; filter, AC amplifiers, Analog Multiplier and Low Pass Filter connected in series and receiving sampled signals; d) a Delay circuit and AC amplifier for transmitting a Synchronous Detector Reference signal to the Multiplier; and e), capability for conditioning the TDR instrument to operate in a remotely shortable diode ON/OFF modulation mode or a Time Delay modulation mode. Repetitively sampled reflections are processed through a Synchronous Detection System to convert square wave signals generated by the Sample-And-Hold circuit into DC output signals V(T) representative of the difference function between reflections under shorted and open conditions and/or of the slope of the diode open reflection.

Claims

1. An adaptor for permitting establishment of a fixed timing marker with a conventional probe of the type commonly used in Time Domain Reflectometry measuring systems for measuring the moisture content of a material to be tested and wherein the probe includes a first conductor coupled to one of at least two conductors of an RF cable and "n" spaced parallel second conductors coupled to the remaining one(s) of the at least two conductors of an RF cable where "n" is any whole integer;

said adaptor comprising, in combination;

a) a unitary sleeve-like spade fitting, said fitting having means defining "n"+1 spaced parallel guide-ways adapted to be slidably mounted on the first and "n" second conductors on the probe;

b) a dielectric insulating material separating each of said "n"+1 spaced parallel guideways; and

,

c) variable impedance means mounted on said adaptor for permitting the first conductor on the probe to be selectively coupled to each of the "n" spaced parallel second conductors on the probe.

2. An adaptor as set forth in claim 1 wherein said variable impedance means comprises a first variable impedance device for selectively coupling the first conductor on the probe to each of the "n" spaced parallel second conductors on the probe at a first point and a second variable impedance device for selectively coupling each of the "n" spaced parallel second conductors on the probe to the first conductor on the probe at a second point spaced from the first point.

3. An adaptor as set forth in claims 1 or 2 wherein said variable impedance means comprises at least one diode.