System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies

• US 5,381,101 A
• Filed: 12/02/1992
• Issued: 01/10/1995
• Est. Priority Date: 12/02/1992
• Status: Expired due to Term

• Current Assignee: Board of Trustees of the Leland Stanford Junior University (Stanford University)
• Original Assignee: Board of Trustees of the Leland Stanford Junior University (Stanford University)
• Inventors: Bloom, David M., Ho, Francis, Hou, Alfred S.
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): Tobin, Christopher M.
• Application Number:
  US07/984,891
• Time in Patent Office: 769 Days
• Field of Search: 73/105, 73/579, 73/618, 73/620, 250/306, 250/307, 324/158 R, 324/158 P, 324/96, 324/662, 324/676
• US Class Current: 324/676
• CPC Class Codes: G01Q 10/06 Circuits or algorithms therefor
• CPC Class Codes: G01Q 60/32 AC mode
• CPC Class Codes: Y10S 977/849 with scanning probe
• CPC Class Codes: Y10S 977/852 for detection of specific nanostructure sample or nanostructure-related property
• CPC Class Codes: Y10S 977/86 Scanning probe structure
• CPC Class Codes: Y10S 977/861 Scanning tunneling probe
• CPC Class Codes: Y10S 977/864 Electrostatic force probe
• CPC Class Codes: Y10S 977/868 with optical means
• CPC Class Codes: Y10S 977/873 Tip holder

Abstract

A potentiometry apparatus for measuring a periodic electrical waveform existing proximate the surface of a sample such as a semiconductor wafer is disclosed herein. The potentiometry apparatus includes a pulse generator for generating a sequence of electrical pulses at a pulse frequency offset from the frequency of the surface waveform by a mixing frequency. A cantilever coupled to the pulse generator serves to carry the electrical pulses to a position proximate the surface of the sample. In a capacitive displacement mode the cantilever is mechanically displaced so as to generate a time-expanded representation of the electrical surface waveform having a repetition frequency equal to the mixing frequency. During displacement mode operation an optical detection circuit may be employed to monitor deflection of the cantilever. In a tunneling current mode the cantilever is again employed to carry the electrical pulses to a position proximate the surface of the sample. In this mode a tunneling current propagating through the cantilever at the mixing frequency provides a time-expanded representation of the electrical surface waveform.

Claims

1. An apparatus for measuring a periodic electrical waveform existing proximate the surface of a sample, said periodic waveform having a predefined repetition frequency, comprising:

a sampling signal generator that generates a sampling signal having a sample signal repetition frequency offset from said predefined repetition frequency by a difference frequency;

a cantilever coupled to said sampling signal generator for carrying said sampling signal to a position proximate the surface of said sample so as to generate an electrical force on said cantilever that is a nonlinear function of differences in amplitude between said sampling signal and said periodic electrical waveform, said electrical force displacing said cantilever such that said cantilever'"'"'s displacement replicates said electrical waveform at a repetition rate equal to said difference frequency;

wherein said cantilever has a mechanical resonance frequency that limits said cantilever'"'"'s speed of movement, said mechanical resonance frequency is substantially less than said predefined repetition frequency, and said sample signal repetition frequency is set such that said difference frequency is less than said mechanical resonance frequency;

whereby said cantilever low pass filters, with a cutoff frequency corresponding to said mechanical resonance frequency, said electrical force on said cantilever; and

a displacement sensor for detecting said displacement of said cantilever.

2. The apparatus of claim 1 wherein said cantilever includes a tip member and a transmission line connecting said sampling signal generator to said tip member.

3. The apparatus of claim 2 wherein said sampling signal generator generates a periodic pulsed waveform with a repetition frequency equal to said sampling frequency.

4. The apparatus of claim 3 wherein said displacement sensor includes a laser for illuminating a surface associated with said cantilever with a focused optical bean and an optical sensor for detecting where said focused optical beam, after reflection from said surface, impinges on said optical sensor.

5. A method for measuring a periodic electrical waveform existing proximate the surface of a sample, said periodic waveform having a predefined repetition frequency, comprising the steps of:

generating a sampling signal having a sample signal repetition frequency offset from said predefined repetition frequency by a difference frequency;

transmitting said sampling signal along a signal path integrated with a cantilever to a position proximate the surface of said sample so as to generate an electrical force on said cantilever that is a nonlinear function of differences in amplitude between said sampling signal and said periodic electrical waveform, said electrical force displacing said cantilever such that said cantilever'"'"'s displacement replicates said electrical waveform at a repetition rate equal to said difference frequency;

wherein said cantilever has a mechanical resonance frequency that limits said cantilever'"'"'s speed of movement, said mechanical resonance frequency is substantially less than said predefined repetition frequency, and said sample signal repetition frequency is set such that said difference frequency is less than said mechanical resonance frequency;

whereby said cantilever low pass filters, with a cutoff frequency corresponding to said mechanical resonance frequency, said electrical force on said cantilever; and

detecting said displacement of said cantilever.

6. The method of claim 5 wherein said cantilever includes a tip member in electrical communication with said signal path.

7. The method of claim 6 wherein said generating step generates a periodic pulsed waveform with a repetition frequency equal to said sampling frequency.

14. The method of claim 7 wherein said detecting step includes illuminating a surface associated with said cantilever with a focused optical beam so as to cause reflection of the focused optical beam on an optical sensor that detects where said focused optical beam, after reflection from said surface, impinges on said optical sensor.

8. An apparatus for measuring a periodic electrical waveform existing proximate the surface of a sample, said periodic waveform having a predefined repetition frequency, comprising:

a sampling signal generator that generates a sampling signal having a sample signal repetition frequency that is offset from said predefined repetition frequency by a difference frequency;

a mechanical sensor coupled to said sampling signal generator for carrying said sampling signal to a position proximate the surface of said sample so as to generate an electrical force on the mechanical sensor that is a nonlinear function of differences in amplitude between said sampling signal and said periodic electrical waveform, said electrical force displacing said mechanical sensor such that said sensor'"'"'s displacement replicates said electrical waveform at a repetition rate equal to said difference frequency;

wherein said mechanical sensor has a mechanical resonance frequency that limits said mechanical sensor'"'"'s speed of movement, said mechanical resonance frequency is substantially less than said predefined repetition frequency, and said sample signal repetition frequency is set such that said difference frequency is less than said mechanical resonance frequency;

whereby said mechanical sensor low pass filters, with a cutoff frequency corresponding to said mechanical resonance frequency, said electrical force on said mechanical sensor; and

a displacement sensor for detecting said displacement of said mechanical sensor.

9. The apparatus of claim 8 wherein said mechanical sensor includes a tip member and a transmission line connecting said sampling signal generator to said tip member.

10. The apparatus of claim 9 wherein said sampling signal generator generates a periodic pulsed waveform with a repetition frequency equal to said sampling frequency.

11. The apparatus of claim 10 wherein said displacement sensor includes a laser for illuminating a surface associated with said mechanical sensor with a focused optical beam and an optical sensor for detecting where said focused optical beam, after reflection from said surface, impinges on said optical sensor.

12. The apparatus of claim 8 wherein said displacement sensor includes a laser for illuminating a surface associated with said mechanical sensor with a focused optical beam and an optical sensor for detecting where said focused optical beam, after reflection from said surface, impinges on said optical sensor.

13. The apparatus of claim 8 wherein said sampling signal generator generates a periodic pulsed waveform with a repetition frequency equal to said sampling frequency.

15. A method for measuring a periodic electrical waveform existing proximate the surface of a sample, said periodic waveform having a predefined repetition frequency, comprising the steps of:

generating a sampling signal having a sample signal repetition frequency offset from said predefined repetition frequency by a difference frequency;

transmitting said sampling signal along a signal path integrated with a mechanical sensor to a position proximate the surface of said sample so as to generate an electrical force on said mechanical sensor that is a nonlinear function of differences in amplitude between said sampling signal and said periodic electrical waveform, said electrical force displacing said mechanical sensor such that said mechanical sensor'"'"'s displacement replicates said electrical waveform at a repetition rate equal to said difference frequency;

wherein said mechanical sensor has a mechanical resonance frequency that limits said mechanical sensor'"'"'s speed of movement, said mechanical resonance frequency is substantially less than said predefined repetition frequency, and said sample signal repetition frequency is set such that said difference frequency is less than said mechanical resonance frequency;

whereby said mechanical sensor low pass filters, with a cutoff frequency corresponding to said mechanical resonance frequency, said electrical force on said mechanical sensor; and

detecting said displacement of said mechanical sensor.

16. The method of claim 15 wherein said mechanical sensor includes a tip member in electrical communication with said signal path.

17. The method of claim 16 wherein said generating step generates a periodic pulsed waveform with a repetition frequency equal to said sampling frequency.

18. The method of claim 17 wherein said detecting step includes illuminating a surface associated with said mechanical sensor with a focused optical beam so as to cause reflection of the focused optical beam on an optical sensor that detects where said focused optical beam, after reflection from said surface, impinges on said optical sensor.

19. The method of claim 15 wherein said detecting step includes illuminating a surface associated with said mechanical sensor with a focused optical beam so as to cause reflection of the focused optical beam on an optical sensor that detects where said focused optical beam, after reflection from said surface, impinges on said optical sensor.

20. The method of claim 15 wherein said generating step generates a periodic pulsed waveform with a repetition frequency equal to said sampling frequency.