Apparatus and method for displaying wafer test results in real time
First Claim
1. A method in an integrated circuit (IC) production test system controlled by a computer for displaying results of tests executed on dies of a wafer in real time, the method comprising the steps of:
- (a) displaying, on a display device of the computer, a template having a plurality of cells, each said cell graphically representing a die on the wafer;
(b) inputting, from an IC tester, a test result for a selected die on said wafer;
(c) presenting an indication of said test result in a selected cell of said template; and
(d) repeating steps (b) and (c) for each die on said wafer.
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Accused Products
Abstract
The invention is a method for displaying wafer test results from an integrated circuit tester in real time. The method comprising the steps of: (a) receiving wafer dimensions and die dimensions from a wafer handler; (b) creating a template representative of a wafer having cells representative of a die from the wafer dimensions and the die dimensions; (c) displaying the template; (d) invoking a tester to test a selected die of a selected wafer; (e) receiving test results from the tester; (f) displaying the test results on a selected cell which corresponds to the selected die; and (g) repeating steps (d)-(f) as required.
54 Citations
17 Claims
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1. A method in an integrated circuit (IC) production test system controlled by a computer for displaying results of tests executed on dies of a wafer in real time, the method comprising the steps of:
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(a) displaying, on a display device of the computer, a template having a plurality of cells, each said cell graphically representing a die on the wafer; (b) inputting, from an IC tester, a test result for a selected die on said wafer; (c) presenting an indication of said test result in a selected cell of said template; and (d) repeating steps (b) and (c) for each die on said wafer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An apparatus in an integrated circuit (IC) production test system controlled by a computer for displaying results of tests executed on dies of a wafer in real time, comprising:
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means for displaying, on a display device of the computer, a template of cells which graphically represents the dies on the wafer; means for receiving, from an IC tester, a test result for a selected die on said wafer; means for presenting an indication of said test result in a selected cell of said template; and means for repeatedly invoking said receiving means and said presenting means until a test result has been received for each of said dies on said wafer. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17)
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Specification