Built-in current sensor for I.sub.DDQ testing

• US 5,392,293 A
• Filed: 02/26/1993
• Issued: 02/21/1995
• Est. Priority Date: 02/26/1993
• Status: Expired due to Term

• Current Assignee: American Telephone & Telegraph Company (AT&T, Inc.)
• Original Assignee: AT&T Corporation (AT&T, Inc.)
• Inventors: Hsue, Ching-Wen
• Primary Examiner(s): Beausoliel, Jr., Robert W.
• Assistant Examiner(s): LE, DIEU MINH T
• Application Number:
  US08/023,458
• Time in Patent Office: 725 Days
• Field of Search: 371/15.1, 371/21.4, 371/25.1, 371/21.3, 371/27, 371/3, 371/72, 371/23, 371/24, 371/22.5, 324/73.1, 324/158 R, 340/650, 340/636, 340/825.54, 340/928, 307/311, 307/296.8, 307/296.7, 361/42, 361/86, 361/101, 361/90-92, 361/88
• US Class Current: 324/762.02
• CPC Class Codes: G01R 31/3004 Current or voltage test
• CPC Class Codes: G01R 31/3008 Quiescent current [IDDQ] test or leakage current test
• CPC Class Codes: G01R 31/3193 with comparison between actual response and known fault free response receiver details G01R31/31924
• CPC Class Codes: H03F 1/301 in MOSFET amplifiers H03F1/303, H03F1/305, H03F1/308 take precedence

Abstract

A current sensor (10), for sensing a quiescent current (I_DDQ) drawn by an integrated circuit (12) from a supply voltage V_DD includes a current sink and voltage transducer (14) for sinking current from the integrated circuit during a logic transition and for providing a voltage indicative of the quiescent current when the circuit operates in its quiescent state. A comparator (18) compares this voltage to a reference voltage representative of a prescribed quiescent current. The comparator is coupled to a preamplifier stage (38) which serves to generate an indicating voltage in accordance with the comparator output signal. The indicating voltage from the preamplifier stage is stabilized by a stabilizing circuit (58) against variations in the supply voltage V_DD to assure that the indicating voltage provides an accurate measure of whether the quiescent current I_DDQ is above or below a prescribed current.

Claims

1. A method for detecting faults in an integrated circuit powered from a supply voltage V_DD, composing the steps of:

sinking current drawn by the integrated circuit during each interval that the circuit undergoes a logic transition;

sensing the current drawn by the integrated circuit during intervals other than when the integrated circuit undergoes a logic transition;

translating the sensed current to a corresponding sensed voltage;

comparing the sensed voltage to a reference voltage representative of a quiescent current expected to be drawn by the integrated circuit during intervals other when the integrated circuit undergoes a logic transition;

generating an indicating voltage in accordance with a difference between the sensed and reference voltages so as to indicate whether the quiescent current of the integrated circuit is above a expected quiescent current; and

stabilizing the indicating voltage against variations in the supply voltage V_DD.

2. The method according to claim 1 wherein the steps of sinking current and sensing the current drawn by the integrated circuit device are practiced by passing current from the integrated circuit through a diode coupled in series-aiding fashion between the integrated circuit and a negative bias voltage V_ss.

3. The method according to claim 2 wherein the current passing in the diode is regulated to control a sensitivity of the current sensed thereby.

4. The method according to claim 3 wherein the current in the diode is regulated by the steps of:

coupling a field effect transistor between a circuit ground and the junction of the diode and the integrated circuit; and

controlling the current passing in the transistor.

5. A current sensor for measuring a quiescent current drawn by an integrated circuit, when supplied with a supply voltage V_DD, to detect possible faults, comprising:

a current sink and voltage transducer coupled to the integrated circuit for sinking current from the integrated circuit during intervals that the integrated circuit undergoes a logic transition and for providing a voltage in accordance with a quiescent current in the integrated circuit drawn during intervals other than when the integrated circuit undergoes a logic transition;

a voltage comparator for comparing the voltage provided by the current sink and voltage transducer to a reference voltage representative of a prescribed quiescent current for the integrated circuit;

a pre-amplifier stage coupled to the voltage comparator for providing an indicating voltage varying in accordance with a difference between the voltage provided by the current sink and voltage transducer and the reference voltage; and

a stabilizing stage coupled to the pre-amplifer stage for stabilizing the indicating voltage against variations in the supply voltage.

6. The apparatus according to claim 5 wherein the current sink and voltage transducer comprises a diode coupled in series-aiding fashion with the integrated circuit between the supply voltage V_DD and a negative bias voltage V_ss.

7. The apparatus according to claim 6 wherein the voltage comparator comprises:

first and second field effect transistors having their drain-to-source portions coupled in series-aiding fashion between a fixed voltage and circuit ground, the first transistor having its gate coupled to a junction between the transistors and the second transistor having its gate coupled to the current sink and voltage transducer;

third and fourth field effect transistors having their drain-to-source portions coupled in series-aiding fashion between a fixed voltage and circuit ground, the third transistor having its gate coupled to the junction between the third and fourth transistors; and

a second diode coupled between a gate of the fourth transistor and the negative voltage bias supply V_ss.

8. The apparatus according to claim 7 further including means for regulating the current in each of the first and second diodes.

9. The apparatus according to claim 8 wherein the means for regulating the current in each of the first and second diodes comprises:

a fifth field effect transistor having its source-to-drain portion coupled between a junction of the first diode and the integrated circuit, and circuit ground;

a sixth field effect transistor having its source-to-drain portion coupled across the second diode; and

a voltage divider network for supplying a portion of the supply voltage V_DD to a gate of each of the fifth and sixth transistors.

10. The apparatus according to claim 9 wherein the voltage divider network comprises:

seventh and eighth field effect transistors having their drain-to-source portions coupled in series-aiding fashion between the supply voltage V_DD and circuit ground, each transistor having its gate coupled to the source thereof, the junction between the seventh and eighth transistors coupled to the gate of the fifth and sixth transistors.

11. The apparatus according to claim 5 wherein the stabilizing stage comprises:

a pair of field effect transistors having their source-to-drain portions coupled in series-opposing fashion between the supply voltage V_DD and circuit ground, a first one of the pair of transistors being supplied at its gate with the output of the pre-amplifier stage and the other transistor of the pair having its gate coupled to a junction between the transistors.

12. The apparatus according to claim 5 further including an amplifier-inverter for amplifying and inverting the indicating voltage stabilized by the stabilizing stage.