Filter method for an x-ray system, and device for carrying out such a filter method

• US 5,394,454 A
• Filed: 05/07/1993
• Issued: 02/28/1995
• Est. Priority Date: 05/09/1992
• Status: Expired due to Fees

• Current Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Harding, Geoffrey
• Primary Examiner(s): Porta, David P.
• Application Number:
  US08/060,174
• Time in Patent Office: 662 Days
• Field of Search: 378/98.11, 378/98.12, 378/98.2, 378/86, 378/87, 378/88, 378/89, 378/156, 378/157
• US Class Current: 378/86
• CPC Class Codes: G21K 1/10 Scattering devices; Absorbing devices; Ionising radiation filters

Abstract

A filter method and device for carrying out the method in conjunction with an X-ray system having a beam path for primary radiation between an X-ray source and an examination zone and a beam path for scattered radiation between the examination zone and a detector device, involve subtractive combination of first and second measurement signals produced by the detector device in response to scattered radiation received in first and second filter arrangements. For production of the first measurement signal a filter is arranged in the beam path for primary radiation and not in the beam path for scattered radiation, while for production of the second measurement signal a filter is arranged in the beam path for scattered radiation and not in the beam path for primary radiation. The latter filter consists of the same material as the filter used for the first measurement, and may be the same filter.

Claims

1. A filter method for an X-ray system, comprising an X-ray source for emitting X-ray quanta and a detector device which supplies at least one measurement signal in order to detect the X-ray quanta having interacted with an object in an examination zone, which method comprises the following steps:

a) a measurement during which a filter is arranged in the beam path between the X-ray source and the examination zone,

b) a measurement during which a filter consisting of the same material as the filter used during the other measurement is arranged in the beam path between the examination zone and the detector device,

c) subtractive combination of the measurement signals obtained from the two measurements.

2. A filter method as claimed in claim 1, characterized in that an essentially monochromatic X-ray source is used, the filter material having an absorption edge at a quantum energy which is slightly lower than the energy of the X-ray quanta emitted by the monochromatic X-ray source, the X-ray quanta being detected by the detector device at an angle which is larger than the angle at which the energy loss of the X-ray quanta due to Compton scattering corresponds exactly to the difference between the energy of the X-ray quanta and the quantum energy at which the filter has an absorption edge.

3. A filter method as claimed in claim 1, characterized in that an essentially monochromatic X-ray source is used, the filter material having an absorption edge at a quantum energy which is slightly lower than the energy of the X-ray quanta emitted by the monochromatic X-ray source, the X-ray quanta being detected by the detector device at an angle which is smaller than the angle at which the energy loss of the X-ray quanta due to Compton scattering corresponds exactly to the difference between the energy of the X-ray quanta and the quantum energy at which the filter material has an absorption edge, the energy of the X-ray quanta being measured in an energy-resolving manner.

4. A method as claimed in claim 1, characterized in that use is made of a polychromatic X-ray source, scattered radiation emanating in a predetermined range of scatter angles being measured by the detector device.

5. A filter method as claimed in claim 2 or 3, characterized in that use is made of an X-ray source emitting tantalum fluorescent radiation and also of an erbium filter.

6. An X-ray system comprising:

an examination zone;

an X-ray source for irradiating the examination zone via a beam path for primary radiation;

a detector device for detecting radiation exiting the examination zone via a beam path for scattered radiation;

filter means selectively arrangeable for filtering radiation either in the beam path for primary radiation or in the beam path for scattered radiation; and

means for subtractive combination of first and second measurement signals formed by the detector device at different times.

7. An X-ray system as claimed in claim 6, wherein one of said first and second measurement signals is formed in response to radiation detected while the filter means is arranged for filtering radiation in the primary beam path and the other of said first and second measurement signals is formed in response to radiation detected while said filter means is arranged for filtering radiation in the beam path for scattered radiation.

8. An X-ray system as claimed in claim 6, wherein said X-ray source is polychromatic and said detector device is arranged for detecting radiation scattered at an angle of approximately 90 degrees with respect to the direction of the primary beam path at the examination zone.

9. An X-ray system as claimed in claim 7, wherein said X-ray source is polychromatic and said detector device is arranged for detecting radiation scattered at an angle of approximately 90 degrees with respect to the direction of the primary beam path at the examination zone.

10. An X-ray system as claimed in claim 6, 7, 8, or 9, wherein said filter means comprises at least one flat filter which is displaceable to either a first position in the beam path for primary radiation or a second position in the beam path for scattered radiation.