Procedure for enhancing resolution of spectral information
First Claim
Patent Images
1. A method of examining a sample to determine the presence or absence of a component therein comprising:
- producing a spectral image of a sample in the form of spectral data,spectroscopically producing spectral data from a sample representing the composition of said sample,producing from said spectral data an interferogram of said sample between 0 and Lf ;
producing by the Fourier self-deconvolution method FSD a data set from the obtained interferogram in an interval from 0 to Lt where Lt <
Lf, said data set comprising data points O to M where M is the number of data points in said data set;
computing from said data set by the maximum entropy method MEM prediction error filter coefficients {ak }, where k=0,1,2,. . .M;
predicting data beyond Lt in the interferogram using said prediction error filter coefficients {ak }, and the data points 0 to M in said data set to achieve maximum line narrowing with minimum distortion in the resulting spectrum, andexamining lines in said spectrum to detect presence or absence of a component in the composition of said sample, whereby the narrowing of the lines and the minimization of distortion facilitates the examination and detection of said component.
0 Assignments
0 Petitions
Accused Products
Abstract
A procedure for enhancing the resolution of spectral data, in which the Fourier self-deconvolution method FSD is used to produce from the input spectrum a data set in an interval 0-Lt, the maximum entropy method MEM is used to compute prediction error filter coefficients {ak } from this data, and by the linear prediction method LP, using coefficients {ak } and data points 0 to M. Data are predicted in the interferogram I(x) beyond Lt, whereby output spectrum maximum line narrowing with minimum distortion is achieved.
-
Citations
8 Claims
-
1. A method of examining a sample to determine the presence or absence of a component therein comprising:
-
producing a spectral image of a sample in the form of spectral data, spectroscopically producing spectral data from a sample representing the composition of said sample, producing from said spectral data an interferogram of said sample between 0 and Lf ; producing by the Fourier self-deconvolution method FSD a data set from the obtained interferogram in an interval from 0 to Lt where Lt <
Lf, said data set comprising data points O to M where M is the number of data points in said data set;computing from said data set by the maximum entropy method MEM prediction error filter coefficients {ak }, where k=0,1,2,. . .M; predicting data beyond Lt in the interferogram using said prediction error filter coefficients {ak }, and the data points 0 to M in said data set to achieve maximum line narrowing with minimum distortion in the resulting spectrum, and examining lines in said spectrum to detect presence or absence of a component in the composition of said sample, whereby the narrowing of the lines and the minimization of distortion facilitates the examination and detection of said component. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
Specification