Low-frequency electrostrictive ceramic plate voltage sensor
First Claim
1. A low-frequency electrostrictive ceramic plate voltage sensor comprised of:
- a piezoelectric tube having an inner and outer surface and a first and second end;
an electrostrictive ceramic wafer affixed to the first end of the piezoelectric tube;
means to generate oscillations within the piezoelectric tube attached to the second end of the piezoelectric tube; and
means for measuring an electric-field-dependent stress induced polarization generated within the electrostrictive ceramic wafer resulting from said oscillations generated within the piezoelectric tube, said stress generating an output voltage having a displaced amplitude proportional to a signal voltage sought to be measured.
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Abstract
A stress-driven electrostrictive ceramic low-voltage plate voltage sensor based on the principle of the field-coupling between the strain and polarization in the ceramic material of the device. Application of a dithering or driving voltage to a piezoelectric tube thereby generating an oscillating polarization whose amplitude is proportional to an applied low-frequency voltage. A electrostrictive ceramic wafer material affixed to the piezoelectric tube senses this oscillation and generates a displacement current. The displacement current represents a voltage output that is an amplitude modulated carrier whose displaced amplitude is proportional to an applied unknown signal voltage sought to be determined.
107 Citations
13 Claims
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1. A low-frequency electrostrictive ceramic plate voltage sensor comprised of:
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a piezoelectric tube having an inner and outer surface and a first and second end; an electrostrictive ceramic wafer affixed to the first end of the piezoelectric tube; means to generate oscillations within the piezoelectric tube attached to the second end of the piezoelectric tube; and means for measuring an electric-field-dependent stress induced polarization generated within the electrostrictive ceramic wafer resulting from said oscillations generated within the piezoelectric tube, said stress generating an output voltage having a displaced amplitude proportional to a signal voltage sought to be measured. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A device for measuring the low-frequency voltages comprised of:
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a piezoelectric tube having an inner and outer surface and a first and second end; an electrostrictive ceramic wafer affixed to the first end of the piezoelectric tube; an oscillation applied to the second end of the piezoelectric tube to generate forces within the piezoelectric tube; and
,an electrical circuit to measure forces generated within the electrostrictive wafer that appear as an amplitude modulated carrier whose displaced amplitude is proportional to an input voltage <
VO >
as determined by the equation ##EQU3##
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8. A noise reducer for low-frequency voltages comprised of:
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a piezoelectric tube; means for applying an input voltage comprised of an oscillating voltage having a thermal noise component and an electromagnetic noise component induced by an external electromagnetic interference source superimposed upon the input voltage to the piezoelectric tube; means for measuring the input voltage to determine a measured input voltage; means for referencing the input voltage to provide a quantum of the thermal noise present upon the input voltage by applying a known reference voltage to the input voltage; means for detecting electromagnetic noise component comprising an electronic circuit capable of sensing the electromagnetic noise component induced by the external electromagnetic interference source; means for combining the quantum of thermal noise determined by the means for referencing the input voltage and the electromagnetic noise component detected by the means for detecting electromagnetic noise means to provide a composite noise signal comprising a total of the thermal noise component and the electromagnetic noise component found on the input voltage; and means for subtracting the composite noise signal from the measured input signal to provide a filtered output signal. - View Dependent Claims (9, 10)
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11. A method comprised of the steps:
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generate oscillations within a piezoelectric tube so as to cause an electric-field-dependent stress induced polarization to be produced in an electrostrictive ceramic wafer; and measure a voltage output by the electrostrictive ceramic wafer resulting from the electric-field-dependent stress induced polarization generated therein by the oscillations generated within the piezoelectric tube.
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12. A method for reducing noise in low voltage circuits comprising the steps of:
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apply an oscillating input signal to a first low-frequency electrostrictive ceramic plate voltage sensor to obtain an output signal an electric-field-dependent stress induced polarization representing the input signal containing a true voltage and an induced noise; measure a quantum of thermal noise present in the induced noise present on the input signal utilizing a second low-frequency electrostrictive ceramic plate sensor acting as a reference; measure a noise generated by an electromagnetic field present from an external electromagnetic source capable of inducing noise onto the input signal; add the thermally induced noise measured by the second low-frequency electrostrictive ceramic plate sensor to the electromagnetic noise of the electromagnetic field so as to provide a total noise signal representing the quantum of noise present on the input signal; and subtract the total noise signal from the output signal of the first low-frequency electrostrictive ceramic plate sensor to obtain a filtered output signal representing the input signal free of noise.
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13. An apparatus comprised of:
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a piezoelectric tube; an electrostrictive ceramic wafer; means for generating oscillations within the piezoelectric tube so as to cause an electric-field-dependent stress induced polarization to be produced in the electrostrictive ceramic wafer; and means for measuring a voltage output by the electrostrictive ceramic wafer as a result of the electric-field-dependent stress induced polarization generated in the electrostrictive wafer.
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Specification