Touch probe

• US 5,404,649 A
• Filed: 04/28/1994
• Issued: 04/11/1995
• Est. Priority Date: 11/09/1991
• Status: Expired due to Term

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw Metrology Limited (Renishaw PLC)
• Inventors: McMurtry, David R., Dabbs, John C., Hajdukiewicz, Peter, Hellier, Peter K., Hellen, Graham A.
• Primary Examiner(s): Cuchlinski, Jr., William A.
• Assistant Examiner(s): BENNETT, GEORGE B
• Application Number:
  US08/234,411
• Time in Patent Office: 348 Days
• Field of Search: 33/503, 33/504, 33/556, 33/557, 33/558, 33/559, 33/560, 33/561, 33/DIG. 1, 33/DIG. 13, 279/128
• US Class Current: 33/503
• CPC Class Codes: B23Q 5/58 Safety devices protecting the operator B23Q11/0089
• CPC Class Codes: G01B 21/047 Accessories, e.g. for positioning, for tool-setting, for measuring probes
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor
• CPC Class Codes: G01B 7/012 Contact-making feeler heads therefor
• CPC Class Codes: Y10S 33/01 Magnetic
• CPC Class Codes: Y10S 33/13 Wire and strain gauges

Abstract

A magazine has a plurality of storage ports 400 each of which retains a stylus module 314 for use in measuring workpiece dimensions on a coordinate measuring machine. Each storage port 400 is configured as a pair of jaws provided by docking inserts 414. A permanent magnet 418 is mounted on each docking insert 414. The lower casing of the stylus module 314 is urged against the inwardly facing edges 416 of the docking inserts 414 by the magnetic attraction force due the magnets 418. The stylus module 314 is engaged with a retaining module (on the quill of the machine) by moving the retaining module in a downward sense to engage the stylus module 314; further downward movement disengages the stylus module 314 from the storage port 400, thus enabling engagement of such a stylus module and removal of the module from the storage port in a single continuous movement.

Claims

1. A touch probe for use on a coordinate positioning machine, comprising:

a fixed structure by which the probe may be supported on a movable arm of the machine;

a retaining member supported on the fixed structure;

a module, comprising a supporting structure and a stylus connected to said supporting structure, the stylus having a stem and a sensing tip provided at a free end of the stem;

a magnetic bias for exchangeably, releasably biasing said supporting structure into a first rest position on said retaining member, thereby to enable exchange of said module,

said magnetic bias enabling tilting displacement of said supporting structure relative to said retaining member out of said first rest position in response to a displacing force, and return of said supporting structure to said first rest position on said retaining member, under the influence of said magnetic bias when said displacing force is removed.

2. A touch probe according to claim 1, wherein said retaining member is supported on the fixed structure in a second rest position, from which said retaining member is displaceable in response to said displacing force, and to which said retaining member may return when said displacing force is removed.

3. A touch probe according to claim 2, wherein said retaining member is supported on said fixed structure on a strain sensitive load cell, for sensing strain in said stylus responsive to contact between said sensing tip and a surface.

4. A touch probe according to claim 2, wherein the supporting structure of said module comprises a supporting body to which said stylus is directly connected.

5. A touch probe according to claim 1, further comprising a first magnetic member on said retaining member and a second magnetic member on said supporting structure, said first and second magnetic members providing said magnetic bias.