Mounted connector pin test using image processing

• US 5,408,537 A
• Filed: 11/22/1993
• Issued: 04/18/1995
• Est. Priority Date: 11/22/1993
• Status: Expired due to Term

• Current Assignee: American Telephone & Telegraph Company (AT&T, Inc.)
• Original Assignee: AT&T Corporation (AT&T, Inc.)
• Inventors: Major, Kevin M.
• Primary Examiner(s): Mancuso, Joseph
• Assistant Examiner(s): DEL ROSSO, GERARD DOMNICK
• Application Number:
  US08/156,153
• Time in Patent Office: 512 Days
• Field of Search: 382/8, 382/16, 382/19, 382/23, 382/25, 382/26, 382/28, 348/86, 348/87, 348/91
• US Class Current: 382/141
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence
• CPC Class Codes: G06T 2207/30108 Industrial image inspection
• CPC Class Codes: G06T 7/0004 Industrial image inspection

Abstract

A digital image of the connector pins and their mounting surface background is produced from a direction parallel to the pins by a ccd camera with a telocentric lens and a fiber optic ring light. The image is filtered, binarized and blob analyzed by computer to find rows of blobs that represent rows of pins. The attributes and spacing of the pin blobs are then compared against predetermined criteria to determine pin failures.

Claims

1. A method for testing connectors located in equipment and containing arrays of pins to identify individual unsatisfactory pins, the pins in said arrays arranged in rows and projecting from a mounting surface, said method comprising the steps of:

illuminating said pins and said mounting surface in a manner to avoid projecting pin shadows on said mounting surface;

producing and displaying on a display device an image of at least a portion of said mounting surface and said pin rows viewed from a direction approximately parallel to said pins;

entering into memory a binary version of said image comprising a matrix of pixels in horizontal rows and vertical columns;

associating contiguous pixels of one of the two binary brightness values in said binary image into identified blobs;

computing for each said identified blob a predetermined set of descriptive blob attributes, including the blob dimensions and the location of the blob center;

selecting a first group of blobs consisting of the blobs remaining after excluding the blobs whose centers are located in regions of the image that depict regions of the connector under test which do not contain pin arrays;

selecting a second group of blobs consisting of the blobs in said first group whose dimensions are within a predetermined blob dimension range;

generating a histogram of the locations of the centers of the blobs in said second group by horizontal pixel row;

identifying for each histogram peak that exceeds a predetermined number of blob center locations, the respective horizontal pixel row that bisects it;

for each of said identified peak-bisecting horizontal pixel rows, assigning the blobs in said first group whose centers lie within a predetermined distance of the peak-bisecting pixel row to a respective pin blob row, and identifying the blobs so assigned as pin blobs, each corresponding to a pin;

defining for each pin blob row a centerline that is the straight line that passes closest to the centers of the pin blobs assigned to the respective pin blob row, and overlaying said defined pin blob row centerlines on the image displayed on said display device;

calculating the spacings between pin blobs and their respective row centerlines and between adjacent pin blobs;

applying predetermined criteria to said calculated spacings and to the computed blob attributes of said pin blobs to identify corresponding unsatisfactory pins; and

displaying a notation of said identified unsatisfactory pins on said display device.

2. A method as in claim 1, wherein the blob centroid is considered the blob center.

3. A method as in claim 1, wherein the step of defining a pin blob row centerline for each pin blob row is performed using the least squares estimation method.

4. A method as in claim 3, further comprising, after the step of defining a pin blob row centerline for each pin blob row, the steps of:

calculating the slope and Y-intercept of each respective pin blob row centerline;

determining the average slope of the calculated slopes; and

substituting the average slope for each calculated slope that differs from the average slope by more than a predetermined amount.

5. A method as in claim 1, wherein said predetermined set of descriptive blob attributes includes the blob area and the area and outline of the blob box bounded by the pixel rows and columns that form the outer blob boundaries;

and,

in the step of applying predetermined criteria, those pins, the ratio of whose corresponding blob box area to blob area exceeds a predetermined maximum ratio, are identified as unsatisfactory.

6. A method as in claim 5, wherein, in the step of applying predetermined criteria, those pins whose corresponding blob boxes are not intersected by their respective blob row centerlines are identified as unsatisfactory.,

7. A method as in claim 1, wherein, in the step of applying predetermined criteria, when the attributes and spacings of a pin blob fail to meet a selected plurality of a selected subset of said predetermined criteria, its corresponding pin is identified as unsatisfactory.

8. A method as in claim 7, wherein said step of displaying a notation of identified unsatisfactory pins comprises surrounding in said displayed image, pin blobs whose attributes and spacings fail to meet at least one but less than said selected plurality of said selected subset of criteria by respective rectangular boxes, and surrounding pin blobs whose corresponding pins are identified as unsatisfactory by respective circles.

9. Apparatus for testing connectors containing arrays of pins to identify individual unsatisfactory pins,said pins arranged in rows and projecting outward from a mounting surface, said apparatus comprising:

illuminating means for illuminating said pins and said mounting surface in a manner to avoid projecting pin shadows on said mounting surface;

camera means for producing a digital image of said pins and said mounting surface, said digital image comprising a matrix of pixels in horizontal rows and vertical columns;

binarizing means for driving each of the pixels of said digital image to either of two brightness values, black or white, respectively;

memory means for temporarily storing the binarized image;

display means for displaying said binarized image;

blob analysis means for associating contiguous pixels of one of said brightness values in said binarized image into identified blobs, and computing for each identified blob a predetermined set of respective descriptive attributes, including the blob dimensions and the location of the blob center;

approximate pin row identifying means for identifying as approximate pin rows the respective horizontal pixel rows around which blob centers are locally clustered;

pin blob selecting and assigning means for selecting as pin blobs, each representative of a pin, and for assigning to an individual pin blob row those blobs whose centers lie within a predetermined distance of each of said respective identified approximate pin rows;

pin blob row centerline defining means for defining for each respective pin blob row its straight row centerline;

calculating means for calculating the spacings between pin blobs and their respective pin blob row centerlines and between adjacent pin blobs;

pin blob testing means for applying predetermined criteria to said spacings and the blob attributes of said pin blobs to identify unsatisfactory pins; and

control means for controlling said binarizing means memory means, display means, blob analysis means, approximate pin row identifying means, pin blob selecting and assigning means, pin blob row centerline defining means, calculating means and blob testing means.

10. Apparatus as in claim 9, wherein said camera means comprises a telocentric lens.

11. Apparatus as in claim 10, wherein said illuminating means comprises annular light output means for emitting a ring of light concentric with said telocentric lens means.

12. Apparatus as in claim 11, wherein said illuminating means further comprises a light source and fiber optic light conducting means for conducting light from said light source to said annular light output means.

13. Apparatus as in claim 9, further comprising input means for entering predetermined information specific to said pin row arrangement.

14. Apparatus as in claim 9, further comprising robotic positioning means for positioning said camera means to view a predetermined portion of said arranged pins and said mounting surface in response to said entered pin row arrangement information and said control means.