Automatic testing method and testing apparatus for devices

• US 5,414,639 A
• Filed: 01/19/1994
• Issued: 05/09/1995
• Est. Priority Date: 01/19/1993
• Status: Expired due to Term

• Current Assignee: Sony Corporation (Sony Group Corp.)
• Original Assignee: Sony Corporation (Sony Group Corp.)
• Inventors: Yoshimura, Hideaki, Sugimoto, Takatoshi, Suzuki, Masayuki
• Primary Examiner(s): Teska, Kevin J.
• Assistant Examiner(s): Walker, Tyrone V.
• Application Number:
  US08/183,358
• Time in Patent Office: 475 Days
• Field of Search: 364/489, 364/491, 364/578-580, 371/23, 371/27, 371/16.2, 371/16.1, 324/73 R, 324/158 R, 324/73.1
• US Class Current: 324/73.1
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/31905 Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
• CPC Class Codes: G01R 31/31908 Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
• CPC Class Codes: G01R 31/31926 Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Abstract

In a testing method and a testing circuit design apparatus for a multi-terminal device, the testing circuit design apparatus includes an input unit for inputting data of an ideal testing circuit, a storage unit for storing the data of the ideal testing circuit input from the input unit, a knowledge base unit having a knowledge base in which a knowledge base and a testing method suitable for a tester of each manufacturer are described, and a testing circuit conversion unit for converting the data of the ideal testing circuit written in the storage unit to data of an actual testing circuit actually used for characteristic measurement on the basis of each knowledge base of the knowledge base unit, and for writing the converted data into the storage unit. The number n of points under test of the device board and the number M of resources of the tester are read out, and the number n of the points under test and the number M of the resources are compared with each other. The tester and the device board are connected to each other in accordance with a comparison result.

Claims

1. A connection method for connecting a tester for measuring characteristics of a multi-terminal device, and wherein a device board is disposed between the multi-terminal device and the tester, comprising the steps of:

reading out a number n of points under test of the device board and a number M of resources of the tester;

comparing the number n of the points under test and the number M of the resources of the tester, and connecting the tester and the device board in accordance with a result of the comparison;

determining a minimum number N of the M resources which are required to perform all testings when the comparison result is n>

M;

determining set values which are allotted to the N resources;

connecting the N resources and the n points under test to each other through relays so that a testing condition is satisfied;

determining set conditions for each resource and relays for each testing item; and

adding identification information with last (N-M+1) resources when N>

M.

2. The connection method as claimed in claim 1, further comprising the steps of:

preparing a net list for directly connecting the resources of the tester to the points under test in a one-to-one correspondence when the comparison result is that n≦

M, and directly setting a set value of each point under test for each testing item as a set value for each resource.

3. The connection method as claimed in claim 1, further comprising the steps of:

reading out the number of points under test to be connected to each resource; and

when there is any unused surplus resource, successively connecting said surplus resource to a point under test which is connected to a largest number of relays.

4. The connection method as claimed in claim 1, further comprising the steps of:

reading out the number of points under test to be connected to each resource; and

when a resource is connected to only one point under test, directly connecting the resource to said point under test.

5. A testing circuit design apparatus for a multi-terminal device, comprising:

an input unit for inputting data of an ideal testing circuit;

a storage unit for storing the data of the ideal testing circuit input from said input unit;

a knowledge base unit having a knowledge base and a testing method suitable for a tester of each manufacturer;

a testing circuit conversion unit for converting the data of the ideal testing circuit written in said storage unit to data of an actual testing circuit actually used for characteristic measurement on the basis of each knowledge base of said knowledge base unit, and for writing the converted data into said storage unit;

net lists for the input ideal testing circuit for each testing item input from said input unit being stored in said storage unit;

a circuit composite unit for reading plural net lists from said storage unit to read elements connected to each terminal of said multi-terminal device and for compositing an overall testing circuit;

said circuit composite unit arranging elements connected to each terminal of said multi-terminal device so that the same elements are not overlapped at a same terminal;

a make relay interposed between the terminal and each element; and

an ON/OFF condition of said make relay for each testing item being stored in said storage unit,

6. The testing circuit design apparatus as claimed in claim 5, further comprising a circuit simulator for checking an operation of said actual testing circuit on the basis of the storage data of said storage unit.

7. A connection method for connecting a tester for measuring characteristics of a multi-terminal device, and wherein a device board is disposed between the multi-terminal device and the tester, comprising the steps of:

determining a number n of points under test of the device board and a number M of resources of the tester;

comparing the number n of the points under test and the number M of the resources of the tester, and connecting the tester and the device board in accordance with a result of the comparison;

when n is <

M, directly connecting the resources of the tester to the points under test in a one-to-one correspondence and directly setting a set value of each point under test for each testing item as a set value for each resource; and

when n is >

M, a set condition of each testing item for each point under test between the device board and the tester resource is determined, and if a plurality of different points under test have the same set condition over all the testing items, these points under test are grouped as one point under test for connection to one of the resources.