Variable frequency oscillator controlled EEPROM charge pump

• US 5,418,751 A
• Filed: 09/29/1993
• Issued: 05/23/1995
• Est. Priority Date: 09/29/1993
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Kaiser, Ulrich
• Primary Examiner(s): Popek, Joseph A.
• Assistant Examiner(s): DINH, SON T
• Application Number:
  US08/129,214
• Time in Patent Office: 601 Days
• Field of Search: 365/211, 365/212, 365/189.09, 365/226, 307/310, 307/296
• US Class Current: 365/211
• CPC Class Codes: G11C 16/30 Power supply circuits

Abstract

Semiconductor circuit provides an EEPROM programming charge pump (18), and includes a leakage current measuring device (12), a plurality of interconnected current mirrors, and a current controlled oscillator (16) for providing programming power to such EEPROM. The leakage current sensor (12) generates current nonlinearly related to device ambient temperature of the semiconductor circuit, the current mirrors combining and scaling the leakage current (14) with a constant current to provide a composite current altering frequency of the oscillator (16). The oscillator output is constrained accordingly to provide EEPROM charge pump (18) programming power proportional to the oscillator (16) frequency for ensuring that only that amount of programming power appropriate to the ambient temperature is delivered, achieving high economy of total EEPROM programming power utilization, as for an EEPROM of a miniaturized, self-contained responder of a read/write transponder system resident on a single semiconductor integrated circuit chip.

Claims

1. Semiconductor circuit comprising an EEPROM programming charge pump, a current controlled oscillator for providing power to such an EEPROM charge pump, leakage current sensing means, responsive to ambient temperature of the circuit, and means, responsive to the leakage current sensing means, for increasing frequency of the oscillator as a nonlinear function of rise in the ambient temperature such that the output frequency of the oscillator is constrained accordingly for providing EEPROM charge pump power at a level appropriate to the ambient temperature whereby to achieve high economy of total EEPROM programming power utilization.

2. Semiconductor circuit according to claim 1, the leakage current sensing means comprising a leakage current measuring device for generating a leakage current signal which increases as a nonlinear function of the device ambient temperature, the means responsive to the leakage current sensing comprising a plurality of interconnected current mirrors, the current mirrors combining and scaling the leakage current with a constant current to provide a composite current for controlling oscillator frequency.

3. Semiconductor circuit according to claim 2, wherein the means for measuring leakage current comprises a MOSFET device of the semiconductor circuit.

4. A semiconductor circuit as set forth in claim 1 wherein the semiconductor circuit is that of a read/write transponder including a capacitor charged by the energy of radio frequency interrogation as sole power source for read/write transponder operation.

5. A semiconductor circuit for providing a programming charge pump for an EEPROM, the circuit comprising a leakage current measuring means which is responsive to ambient temperature of the circuit, a plurality of interconnected current mirrors, and a current controlled oscillator for providing programming power to such an EEPROM, the leakage current measuring device generating a current nonlinearly related to device ambient temperature of the semiconductor circuit, the current mirrors combining and scaling the leakage current with a constant current to provide a composite current which increases the frequency of the oscillator, the output frequency of the said oscillator being constrained accordingly for providing EEPROM charge pump programming power in proportion to the oscillator frequency for ensuring that only that amount of programming power appropriate to the ambient temperature is delivered, whereby to achieve high economy of total EEPROM programming power utilization.

6. A semiconductor circuit as set forth in claim 5, wherein the leakage current measuring means measures the leakage current of an EEPROM device of the semiconductor circuit.

7. A semiconductor circuit as set forth in claim 6, wherein the leakage current measuring means comprises a MOSFET device of the semiconductor circuit.

8. A semiconductor circuit as set forth in claim 6, wherein the current mirrors are constituted by pairs of MOSFET devices of the semiconductor circuit.

9. A semiconductor circuit as set forth in claim 8, the oscillator comprising a current controlled digital ring oscillator which is frequency controlled in response to the composite current.