Ion trap mass spectrometer system and method

• US 5,420,425 A
• Filed: 05/27/1994
• Issued: 05/30/1995
• Est. Priority Date: 05/27/1994
• Status: Expired due to Term

• Current Assignee: Thermo Finnigan LLC (Thermo Fisher Scientific Incorporated)
• Original Assignee: Finnigan Corporation (Thermo Fisher Scientific Incorporated)
• Inventors: Syka, John E. P., Bier, Mark E.
• Primary Examiner(s): Berman, Jack I.
• Application Number:
  US08/250,156
• Time in Patent Office: 368 Days
• Field of Search: 250/292, 250/291, 250/290, 250/283, 250/282
• US Class Current: 250/292
• CPC Class Codes: H01J 49/423 with radial ejection
• CPC Class Codes: H01J 49/424 Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

Abstract

The present invention relates generally to an ion trap mass spectrometer for analyzing ions and more particularly to a substantially quadrupole ion trap mass spectrometer with an enlarged ion occupied volume. Described herein are electrode geometries that enlarge the ion occupied volume. Improved ion sensitivities, detection limits and dynamic range should be realized for the same charge density in these devices because the increased ion occupied volume allows for the storage of a greater number of ions. The essence of this invention is that these ion trap geometries may apply all modes of operation of substantially quadrupole ion traps such as the mass selective instability mode, resonance excitation/ejection, and MSⁿ.

Claims

1. An ion trap mass spectrometer for analyzing ions comprising:

a trapping chamber including at least two electrodes shaped to promote an enlarged ion occupied volume, the trapping chamber having a center axis;

means for establishing and maintaining a substantially quadrupole field in the trapping chamber to trap ions within a predetermined range of mass-to-charge ratios;

means for introducing or forming ions in the trapping chamber where the ions are trapped by the substantially quadrupole field;

means for changing the substantially quadrupole field so that the trapped ions of specific masses become unstable and leave the trapping chamber in a direction orthogonal to the center axis;

means for detecting ions after the ions leave the structure; and

means for providing an output signal indicative of the mass-to-charge ratio of the detected ion.

2. An ion trap mass spectrometer of claim 1 further comprising a means for establishing and maintaining a supplemental AC field of frequency f_res to cause ions of specific mass-to-charge ratios to leave the trapping chamber.

3. An ion trap mass spectrometer of claim 2 further comprising an aperture in at least one electrode through which ions leave the trapping chamber.

4. An ion trap mass spectrometer of claim 2 wherein unstable ions leave the trapping chamber between at least one set of electrodes.

5. An ion trap mass spectrometer of claim 2 further comprising an ion dampening gas.

6. An ion trap mass spectrometer of claim 2 wherein the trapping chamber containing the enlarged ion occupied volume is geometrically configured so that one end of the trapping chamber is connected to the other end of the trapping chamber.

7. An ion trap mass spectrometer of claim 6 wherein the trapping chamber substantially forms a circle.

8. An ion trap mass spectrometer of claim 7 wherein the aperture is located along a portion of the trapping chamber forming a circular face or on a ring for radial ejection.

9. An ion trap mass spectrometer of claim 2 wherein the trapping chamber includes at least two electrodes, one ring electrode and at least one end cap, wherein each electrode is substantially elliptical in shape to contain the enlarged ion occupied volume and the substantially quadrupole field is three-dimensional.

10. An ion trap mass spectrometer of claim 2 wherein the trapping chamber is straight and the substantially quadrupole field is two-dimensional.

11. An ion trap mass spectrometer of claim 2 wherein the trapping chamber is curved and the substantially quadrupole field is two-dimensional and the curvature of the trapping chamber is defined by the ratio R/r₀ where

R=radius of "best fit circle" measured from the center of the "best fit circle" to the center axis of the trapping chamber, and

r₀ =distance from the center axis of the trapping chamber to the vertex of an electrode.

12. An ion trap mass spectrometer of claim 2 wherein the substantially quadrupole field is a three-dimensional substantially quadrupole field.

13. An ion trap mass spectrometer of claim 10 wherein the trapping chamber comprises a central section and at least two end sections.

14. An ion trap mass spectrometer of claim 13 further comprising an elongated aperture located in at least one electrode of the central section through which ions leave the trapping chamber.

15. An ion trap mass spectrometer of claim 13 wherein the difference in the field potential between the central section and the end section is such that the ions are substantially trapped in the central section.

16. An ion trap mass spectrometer of claim 13 wherein the ratio R/r₀ >

0.

17. A method of scanning ions in an ion trap mass spectrometer by using the mass spectrometer of claim 1, comprising the steps:

establishing and maintaining a substantially quadrupole field in which ions within a predetermined range of mass-to-charge ratios can be trapped in the trapping chamber;

introducing ions in the trapping chamber wherein ions within the predetermined range of mass-to-charge ratios are trapped;

changing the substantially quadrupole field so that the trapped ions of specific mass-to-charge ratios become unstable and leave the trapping chamber in a direction substantially orthogonal to a center axis;

detecting the unstable ions after they leave the trapping chamber; and

providing an output signal indicative of ion mass-to-charge ratio.

18. A method of scanning ions in an ion trap mass spectrometer by using the mass spectrometer of claim 2, comprising the steps:

establishing and maintaining a substantially quadrupole field in which ions within a predetermined range of mass-to-charge ratios can be trapped in the trapping chamber;

introducing ions in the trapping chamber wherein ions within the predetermined range of mass-to-charge ratios are trapped;

applying a primary supplemental AC field of frequency f_res to a set of electrodes, where

f_res =kf±

f_u

k=integer where k={0, ±

1, ±

2, ±

3, . . . }

f=frequency of the RF component of the substantially quadrupole field

f_u fundamental frequency for the secular motion of a given ion at q_u eject along the u coordinate axis, and f_u <

f,

the primary supplemental AC field superimposed on the substantially quadrupole field to form a combined field so that trapped ions of specific mass-to-charge ratios develop unstable trajectories that cause them to leave the trapping chamber;

changing the combined field so that at least a portion of the remaining trapped ions of specific mass-to-charge ratios become unstable and leave the trapping chamber in a direction substantially orthogonal to a center axis;

detecting the unstable ions after they leave the trapping chamber; and

providing an output signal indicative of ion mass-to-charge ratio.

19. A method of scanning ions as in claim 18 wherein the combined field is changed by changing the magnitude of the substantially quadrupole field.

20. A method of scanning ions as in claim 18 wherein the combined field is changed by changing the frequency f of the substantially quadrupole field.

21. A method of scanning ions as in claim 18 wherein the combined field is changed by changing the magnitude of the primary supplemental AC field while changing the amplitude of the RF component of the substantially quadrupole field.

22. A method of scanning ions as in claim 18 wherein the combined field is changed by changing the frequency f_res of the primary supplemental AC field.

23. A method of scanning ions in an ion trap mass spectrometer by using the mass spectrometer of claim 2, comprising the steps:

establishing and maintaining a substantially quadrupole field in which ions within a predetermined range of mass-to-charge ratios can be trapped in the trapping chamber;

introducing ions in the trapping chamber wherein ions within the predetermined range of mass-to-charge ratios are trapped;

changing the substantially quadrupole field so that the trapped ions of specific mass-to-charge ratios become unstable and leave the trapping chamber so that the remaining selected or isolated ions in the trapping chamber can be further manipulated;

adjusting the substantially quadrupole field to be able to trap product ions of the remaining ions in the trapping chamber;

dissociating or reacting remaining ions with a neutral gas to form product ions;

changing the substantially quadrupole field to remove, for detection, ions whose mass-to-charge ratios lie within a desired range of mass-to-charge ratios;

detecting the ions after they leave the trapping chamber in a direction substantially orthogonal to a center axis; and

providing an output signal indicative of the removed ion mass-to-charge ratio.

24. A method of scanning ions as in claim 23 wherein the step of removing ions from the trapping chamber into a detector further includes the steps:

applying a supplemental AC field superimposed on the substantially quadrupole field to form a combined field;

changing the combined field to remove, for detection, ions whose mass-to-charge ratios lie within a desired range of mass-to-charge ratios.

25. A method of scanning ions as in claim 24 wherein the combined field is changed by changing the frequency of the supplemental AC field.

26. A method of scanning ions as in claim 24 wherein the combined field is changed by changing the magnitude of the substantially quadrupole field.

27. A method of scanning ions as in claim 24 wherein the combined field is changed by changing the frequency f of the substantially quadrupole field.

28. A method of scanning ions as in claim 24 wherein the combined field is changed by changing the magnitude of the supplemental AC field while changing the amplitude of the RF component of the substantially quadrupole field.

29. A method of scanning ions in an ion trap mass spectrometer, comprising the steps:

establishing and maintaining a substantially quadrupole field in which ions within a predetermined range of mass-to-charge ratios can be trapped in the trapping chamber;

introducing ions in the trapping chamber wherein ions within the predetermined range of mass-to-charge ratios are trapped;

creating an enlarged ion occupied volume without an increase in space charge within a trapping chamber;

changing the substantially quadrupole field so that the trapped ions of specific mass-to-charge ratios become unstable and leave the trapping chamber in a direction substantially orthogonal to a center axis;

detecting the unstable ions after they leave the trapping chamber; and

providing an output signal indicative of ion mass-to-charge ratio.