Calibration of an internal sensor system

• US 5,421,187 A
• Filed: 12/28/1993
• Issued: 06/06/1995
• Est. Priority Date: 12/28/1993
• Status: Expired due to Fees

• Current Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Original Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Inventors: Morgan, Avery A.
• Primary Examiner(s): Chilcot, Jr., Richard E.
• Assistant Examiner(s): Noori, Max H.
• Application Number:
  US08/174,114
• Time in Patent Office: 525 Days
• Field of Search: 73/1 D, 73/1 B, 73/504
• US Class Current: 73/1.78
• CPC Class Codes: G01C 21/16 by integrating acceleration or speed, i.e. inertial navigation
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices

Abstract

A calibration device for establishing a 3-D reference frame for an inertial sensor system. A secondary mounting surface on the calibration device is used to provide a measurement of the reference line required for inertial system installation alignment. This device provides a means for establishing a highly accurate alignment of inertial system sensors relative to the output coordinates, called the "mounting frame", without a requirement for optics or a manual transfer of data. By rotating the inertial sensor system through use of a rate table into planes which are substantially perpendicular to each other, the mounting frame for the sensor system can be established.

Claims

1. An inertial sensor system calibration apparatus for an inertial sensor system mounted within an enclosure, the enclosure having first and second planar reference surfaces, said calibration apparatus comprising:

a rate table; and

a calibration device comprising;

a primary mounting member with a primary mounting surface that is substantially planar;

a secondary mounting member positioned proximate to said primary mounting member, said secondary mounting member has a secondary mounting surface which is substantially planar and substantially perpendicular to the primary mounting surface;

mounting means which fixes the enclosure on said primary and secondary mounting members so that the enclosure reference surface is flush against the primary mounting surface and a reference edge substantially parallel to the secondary mounting surface is established along the second reference surface; and

means to position said primary and secondary mounting members on the rate table so that said first and second mounting members rotate about axes normal to the primary mounting surface and said secondary mounting surface.

2. The inertial sensor system calibration apparatus of claim 1 wherein the reference edge is established by a pair of reference protrusions which extend from the secondary mounting member and contact the second reference surface of the enclosure.

3. The inertial sensor system calibration apparatus of claim 1 wherein the means to position said enclosure on the rate table is comprised of:

at least three points on said primary mounting member which define a first planar surface that is parallel to the primary mounting surface for rotation about an axis normal to the primary mounting surface; and

said secondary mounting surface for rotation about an axis normal to the secondary mounting surface.

4. The inertial sensor system calibration apparatus of claim 3, wherein the primary and secondary mounting members are an integral one piece unit.

5. The inertial sensor system calibration apparatus of claim 2, wherein the pair of identical reference members extend from the second reference surface of the enclosure and contact the secondary mounting surface to establish the reference edge.

6. The inertial sensor system calibration apparatus of claim 1, wherein the mounting means are two reference pins on the first primary mounting surface which mate with a hole and slot in the enclosure reference surface and fixes the enclosure to said first and second mounting members.

7. The inertial sensor system calibration apparatus of claim 6, wherein the reference pins establish a line which is at a known angle with respect to the intersection of the primary and secondary mounting surfaces.

8. A method of calibrating an inertial sensor system comprising the steps of:

mounting an inertial sensor system within an enclosure which has an exterior reference surface and a reference edge;

providing primary and secondary planar mounting surfaces which are substantially perpendicular to each other;

mounting the enclosure on the primary mounting surface with the reference surface flush against the primary mounting surface and the reference edge parallel to the intersection of the primary and secondary planar mounting surfaces;

rotating said enclosure about an axis normal to said primary mounting surface to establish an X-axis for the inertial sensor system;

rotating said enclosure about an axis normal to said secondary mounting surface to establish a directional vector;

calculating the cross product of the directional vector and the X-axis to establish a Y-axis for the inertial sensor system; and

calculating the cross product of the X-axis and the Y-axis to establish a Z-axis for the inertial sensor system.

9. The method of calibrating an inertial sensor system of claim 8, wherein rotation of the enclosure is performed by a rate table.

10. The method of calibrating an inertial sensor system of claim 8, wherein the X-axis is established by mounting the enclosure on a flat plate with the reference surface flush against the flat plate, and rotating the enclosure about an axis perpendicular to the flat plate.