Test strip analysis system

• US 5,424,035 A
• Filed: 03/29/1994
• Issued: 06/13/1995
• Est. Priority Date: 03/31/1993
• Status: Expired due to Term

• Current Assignee: Boehringer Mannheim GmbH (Roche Holding AG)
• Original Assignee: Boehringer Mannheim GmbH (Roche Holding AG)
• Inventors: Unkrig, Volker, Steeg, Klaus-Dieter, Hones, Joachim
• Primary Examiner(s): Snay, Jeffrey R.
• Application Number:
  US08/219,479
• Time in Patent Office: 441 Days
• Field of Search: 422/55, 422/68.1, 422/82.05, 422/56, 422/58, 436/165, 436/169
• US Class Current: 422/404
• CPC Class Codes: G01N 21/8483 Investigating reagent band test-element handling not specific to a test method G01N33/4875; analytical elements specific to chemical analysis of biological material G01N33/52; autometer with reagent band G01N35/04
• CPC Class Codes: G01N 33/521 Single-layer analytical elements
• CPC Class Codes: G01N 33/525 Multi-layer analytical elements

Abstract

Test strip analysis system includes an analysis apparatus with a test strip holding device (3) and matching test strips. The test strip holding device (3) serves to position the test strip (4) in a defined position relative to a measuring unit (11). It includes a test strip seating device (20) and a guide for the test strip. Exact positioning with simple handling and without sophisticated mechanical elements is achieved by the fact that at least one part of the test strip seating device (20), in the area in which, in the measuring position, the front section (12) of the test strip is located, is formed as a support (24) which is offset in height relative to the middle plane (22) of the test field area (13). The test strip holding device (3) includes a pressure element (33) which, in the measuring position presses between the support (24) and the test field area (13) of the test strip (4) against the side (34) opposite the seating device ( 20) of the latter. The test strip (4) is consequently subjected to bending stress, whereby the particular distance of the at least one test field (6) from the measuring unit (11) is ensured.

Claims

1. A test strip analysis system, comprising:

at least one test strip, said at least one test strip including a front end, a handling end, and a test field area disposed between the handling end and the front end, said test field area including at least one test field thereupon, said test strip also having a front section located between the test field area and the front end, and a handling section located between the at least one test field and the handling end, said at least one test strip including a recess therein;

said test strip analysis system further comprising

an analysis apparatus having test strip positioning means for positioning said at least one test strip in a defined measuring position relative to a measuring unit, said measuring unit being adjacent said test field area when said at least one test strip is positioned in the measuring position, said test strip positioning means including

guide means for laterally guiding said at least one test strip when said at least one test strip is inserted into the test strip positioning means,

fixing means for engaging with said recess in said at least one test strip, when said test strip is in the measuring position in the test strip positioning means,

test strip seating means having a first side for seating a first side of the test strip wherein said seating means is so positioned that said test field area has a predetermined distance from the measuring unit, when said test strip contacting said seating means is positioned in the measuring position,

supporting means for supporting the front section of the test strip, said supporting means being vertically offset relative to a middle plane of the test field area,

a pressure element disposed opposite said first side of said test strip seating means, said pressure element positioned to press against a second side of the test strip when said test strip is in said measuring position, said pressure element being located between the test field area of said test strip and the supporting means when the test strip is in the measuring position,

wherein said test strip is subjected to bending stress by contacting at least the supporting means, the pressure element, and the test strip seating means, thereby ensuring the predetermined distance between the test field area and the measuring unit.

2. A test strip analysis system as recited in claim 1, wherein said test strip seating means is configured such that the first side of the test strip is not contacted by any portion of the test strip seating means in an area of the test strip which is disposed between the supporting means and the pressure element.

3. A test strip analysis system as recited in claim 1, wherein the guide means comprises two guide elements, with one of said guide elements disposed adjacent each lateral side of the test strip, and wherein the pressure element is stationary and connects the two guide elements of the guide means, thereby forming a gap between the test strip seating means and the pressure element, and wherein the test strip is inserted through the gap when being inserted into the test strip holding means.

4. A test strip analysis system as recited in claim 1, wherein a distance between the pressure element and a boundary of the test field area facing the front end of the test strip, when the test strip is inserted into the test strip holding means, is between 0.35 and 0.65 times a distance between the front end boundary of the test field area and the supporting means.

5. A test strip analysis system as recited in claim 1, wherein a length of the test strip seating means is less than a length of the test strip, wherein a handling end of the test strip projects beyond an end of the test strip seating means.

6. A test strip analysis system as recited in claim 1, wherein the guide means includes two guide elements, with each of the guide elements disposed to engage a lateral side of the test strip, and wherein each of said guide elements includes elastic spring elements, said elastic spring elements being configured to press against the lateral edges of the test strip in the handling section thereof, to thereby press the test strip against the test strip seating means.

7. A test strip analysis system as recited in claim 1, wherein said fixing means comprises a stationary retaining element, said stationary retaining element having a lateral surface inclined away from said supporting means, wherein, when said test strip is inserted in said test strip holding means, an edge of the recess engages said inclined lateral surface.

8. A test strip analysis system as recited in claim 7, wherein the edge of the recess engages the stationary retaining element such that the test strip is secured against longitudinal movements in a direction toward the handling end and a direction toward the front end.

9. A test strip analysis system as recited in claim 7, wherein said test strip positioning means includes a stop at an insertion end of the test strip seating means, and wherein a distance between the stop and the retaining element and a distance between the front end of the test strip and an edge of the recess closest to the front end are configured such that when said test strip is in the measuring position, the front end of the test strip contacts the stop, and the edge of the recess closest to the front end engages the inclined lateral surface of the retaining element.

11. A test strip analysis system as recited in claim 1, wherein said predetermined distance between said test field area and said measuring unit is ensured by a force provided by the bending stress which presses the test strip against the test strip seating means.

10. A method for supporting a test strip in a test strip analysis system, comprising the steps of:

providing an analysis apparatus having test strip positioning means for positioning at least one test strip in a defined measuring position relative to a measuring unit, with the test strip positioning means including guide means for laterally guiding the test strip when the test strip is inserted into the test strip positioning means, and fixing means for engaging with a recess in the test strip when the test strip is in a measuring position in the test strip positioning means, test strip seating means having a first side for seating a first side of the test strip at a predetermined position from a measuring unit, wherein said seating means is so positioned that said test field area has a predetermined distance from the measuring unit when said test strip contacting said seating means is positioned in the measuring position and supporting means for supporting the front section of the test strip, with the supporting means being vertically offset relative to a middle plane of the test field area, and a pressure element disposed opposite said first side of the test strip seating means, with the pressure element positioned to press against a second side of the test strip when said test strip is in said measuring position, with the pressure element being located between the test field area of said test strip and the supporting means when the test strip is in the measuring position;

inserting a test strip into the test strip positioning means, such that the test strip is subjected to bending stress by contacting at least the supporting means, the pressure element, and the test strip seating means, thereby ensuring a predetermined distance between the test field area and the measuring unit, by exerting a force on the test strip in a direction of the test strip seating means.