Rotation rate sensor with built in test circuit

• US 5,426,970 A
• Filed: 08/02/1993
• Issued: 06/27/1995
• Est. Priority Date: 08/02/1993
• Status: Expired due to Term

• Current Assignee: BEI Sensors & Systems Company Incorporated (Schneider Electric SE)
• Original Assignee: New SD, Inc.
• Inventors: Morris, Harold D., Florida, Alvin V., Macy, David F., Gupta, Piyush K.
• Primary Examiner(s): Williams, Hezron E.
• Assistant Examiner(s): LARKIN, DANIEL SEAN
• Application Number:
  US08/100,759
• Time in Patent Office: 694 Days
• Field of Search: 73/1 D, 73/505, 73/517 R, 73/517 A, 73/517 AV, 310/316, 310/317, 310/370
• US Class Current: 73/1.37
• CPC Class Codes: G01C 19/5607 using vibrating tuning forks double-ended tuning forks using planar vibrating masses suspended at opposite ends G01C19/5719
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

A rotation rate sensor which employs a built-in (i.e. internal) test circuit. The rotation rate sensor includes a piezoelectric structure. Deposited on the piezoelectric structure are at least two pickup high and two pickup low electrodes. A pickup circuit is coupled to the pickup high and pickup low electrodes. During a normal mode of operation, the piezoelectric structure is subject to a rotation about one of its axis. In response, the pickup circuit generates a rate signal which corresponds to the rotation rate of the piezoelectric structure. The test circuit is coupled to the pickup low electrodes. During a test mode of operation, the piezoelectric structure is also subject to a rotation about the axis. But, the test circuit generates at the same time a test signal which is provided to the pickup low electrodes and which corresponds to a pseudo rate of rotation. In response, the pickup circuit generates a rate signal which corresponds to the sum of the actual rate of rotation of the piezoelectric material plus the pseudo rate of rotation.

Claims

1. In a rotation rate sensing circuit for use with a piezoelectric structure which provides a rotation signal corresponding to an actual rotation of the structure:

a test circuit for providing a test signal corresponding to a pseudo rotation of the piezoelectric structure; and

a pickup circuit responsive to the rotation signal and the test signal for providing an output signal which corresponds to the actual rotation and the pseudo rotation of the piezoelectric structure.

2. The sensing circuit of claim 1 further comprising:

a drive circuit for applying a drive signal to the piezoelectric structure to induce vibration of the piezoelectric structure;

the test signal being applied to the piezoelectric structure in phase with the drive signal.

3. The sensing circuit of claim 2 wherein:

the drive circuit includes means for applying a drive current to the piezoelectric structure; and

the test circuit includes means connected between the drive circuit and the pickup circuit for applying a portion of the drive current to the pickup circuit as the test signal.

4. The sensing circuit of claim 3 wherein the test circuit includes an attenuator for reducing the level of the drive current applied to the pickup circuit.

5. The sensing circuit of claim 3 wherein the test circuit includes switching means for applying the current from the drive circuit to the pickup circuit in response to a command signal.

6. The sensing circuit of claim 1 further including:

means coupled to the piezoelectric structure for picking up a drive low signal corresponding to a drive mode vibration of the structure;

means responsive to the drive low signal for generating a drive high signal; and

means for applying the drive high signal to the piezoelectric structure to cause the drive mode vibration of the structure.

7. The sensing circuit of claim 6 wherein the test circuit includes means responsive to the drive high signal for applying the test signal to the piezoelectric structure in phase with the drive high signal.

8. The sensing circuit of claim 6 further including:

a current amplifier for amplifying the drive low signal to provide a current signal; and

means in the test circuit responsive to the current signal for providing the test signal in phase with the current signal.

9. A rotation rate sensor comprising:

a piezoelectric structure;

a test circuit for providing a test signal corresponding to a pseudo rotation of the piezoelectric structure;

means for applying the test signal to the piezoelectric structure;

pickup means for picking up from the piezoelectric structure the test signal and a rotation signal which corresponds to an actual rotation of the structure; and

means responsive to the signals picked up from the piezoelectric structure for generating an output signal which corresponds to the actual rotation and the pseudo rotation of the structure.

10. The rotation rate sensor of claim 9 further comprising:

means coupled to the piezoelectric structure for picking up a drive low signal corresponding to a drive mode vibration of the structure;

a drive circuit responsive to the drive low signal for generating a drive high signal; and

means for applying the drive high signal to the piezoelectric structure to cause the drive mode of vibration of the structure.

11. The sensor of claim 10 further including:

a plurality of suspension bridges in the piezoelectric structure; and

electrically conductive leads disposed on the suspension bridges for carrying the test signal, signals picked up from the piezoelectric structure, and the drive signals;

said leads being adapted to be severed by breakage of the bridges upon which they are disposed.

12. The sensor of claim 11 further including:

means for monitoring the output signal to detect breakage of the bridges.

13. The rotation rate sensor of claim 10 wherein the test circuit includes means responsive to the high drive signal for applying the test signal to the piezoelectric structure in phase with the drive high signal.

14. The rotation rate sensor of claim 13 wherein the test circuit includes an attenuator for attenuating the drive high signal to generate the test signal.

15. The rotation rate sensor of claim 10 wherein:

the drive circuit includes a current amplifier for amplifying the drive low signal to produce a current signal; and

the test circuit includes means responsive to the current signal for providing the test signal to the piezoelectric structure in phase with the current signal.

16. The rotation rate sensor of claim 15 wherein the test circuit includes an attenuator for attenuating the current signal to generate said test signal.

17. A rotation rate sensor having a test mode and a normal mode of operation, comprising:

a piezoelectric structure;

a test circuit for providing a test signal corresponding to a pseudo rate of rotation of the piezoelectric structure;

means disposed on the piezoelectric structure for applying the test signal to the piezoelectric structure during the test mode;

pickup means disposed on the piezoelectric structure for picking up from said structure a signal which during the normal mode of operation corresponds to actual rotation of the structure and during the test mode corresponds both to actual rotation of the structure and to the pseudo rate of rotation; and

means responsive to the signal picked up from the piezoelectric structure for generating a test mode output signal which corresponds to a sum of the actual rate of rotation and the pseudo rate of rotation during the test mode and a normal mode output signal corresponding to the actual rate of rotation during the normal mode of operation.

18. The rotation rate sensor of claim 17 wherein the test circuit includes means for switching between the test mode and the normal mode of operation and for providing the test signal only during the test mode.

19. The rotation rate sensor of claim 17 further comprising:

means disposed on the piezoelectric structure for picking up a drive low signal corresponding to a drive mode vibration of the structure;

a drive circuit responsive to the drive low signal for generating a drive high signal;

means for applying the drive high signal to the piezoelectric structure to cause the drive mode vibration of said structure.

20. The rotation rate sensor of claim 19 further including:

a plurality of suspension bridges in the piezoelectric structure; and

electrically conductive leads disposed on the suspension bridges for carrying the test signal, signals picked up from the piezoelectric structure, and the drive signals, said leads being adapted to be severed by breakage of the bridges upon which they are disposed.

21. The rotation rate sensor of claim 19 wherein the test circuit includes means responsive to the drive high signal for providing the test signal in phase with the high drive signal.

22. The rotation rate sensor of claim 19 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for applying a ground signal to the terminal;

the test circuit includes an attenuator coupled to the drive circuit for attenuating the drive signal to generate the test signal, and switching means connected between the attenuator and the pickup low terminal for applying the test signal to the pickup low terminal only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

23. The rotation rate sensor of claim 21 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for providing a ground signal to the terminal;

the test circuit includes an attenuator coupled to the pickup low terminal, and switching means between the drive circuit and the attenuator for providing the signal from the drive circuit to the attenuator only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

24. The rotation rate sensor of claim 19 wherein:

the drive circuit includes a current amplifier for amplifying the drive low signal to produce a current signal; and

the test circuit includes means responsive to the current signal for providing the test signal in phase with the current signal.

25. The rotation sensor of claim 24 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for applying a ground signal to the terminal;

the test circuit includes an attenuator coupled to the drive circuit for attenuating the current signal to generate the test signal, and switching means connected between the attenuator and the pickup low terminal for applying the test signal to the pickup low terminal only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

26. The rotation rate sensor of claim 24 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for providing a ground signal to the terminal;

the test circuit includes an attenuator coupled to the pickup low terminal, and switching means between the drive circuit and the attenuator for providing the current signal to the attenuator only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

27. A sensor comprising:

a piezoelectric structure;

a test circuit for providing a test signal corresponding to a pseudo deflection of the piezoelectric structure;

means coupled to the test circuit for applying the test signal to the piezoelectric structure;

pickup means for picking up from the structure the test signal and a signal corresponding to an actual deflection of the structure; and

means responsive to the test signal and the signal corresponding to actual deflection for generating an output signal corresponding to the actual and pseudo deflections of the piezoelectric structure.

28. The sensor of claim 27 wherein:

the piezoelectric structure is vibratory;

the test signal corresponds to a pseudo vibration of the piezoelectric structure;

the actual deflection signal corresponds to an actual vibration of the piezoelectric structure; and

the output signal corresponds to the actual and pseudo vibrations of the piezoelectric structure.

29. The sensor of claim 27 further comprising:

a drive circuit for generating a drive signal; and

drive electrodes coupled to the drive circuit and disposed on the piezoelectric structure for applying the drive signal to the piezoelectric structure to induce drive mode deflection of the structure;

the test circuit including means responsive to the drive signal for providing the test signal in phase with the drive signal.

30. The sensor of claim 29 wherein:

the test circuit includes an attenuator for attenuating the drive signal to generate the test signal; and

the means for applying the test signal to the piezoelectric structure comprises electrodes coupled to the attenuator and disposed on the piezoelectric structure for applying the test signal to the structure.

31. The sensor of claim 27 further comprising:

a drive circuit for generating a drive high signal;

drive high electrodes coupled to the drive circuit and disposed on the piezoelectric structure for applying the drive high signal to the structure to induce drive mode deflection of the structure; and

drive low electrodes for picking up a drive low signal from the piezoelectric structure corresponding to the induced drive mode deflection;

the drive circuit including a current amplifier coupled to the drive low electrodes for amplifying the drive low signal to produce a current signal; and

the test circuit including means responsive to the current signal for providing the test signal in phase with the current signal.

32. The sensor of claim 31 wherein:

the test circuit includes an attenuator for attenuating the current signal to generate the test signal; and

the means for applying the test signal to the piezoelectric structure comprises electrodes coupled to the attenuator and disposed on the structure.

33. A sensor having a test mode and a normal mode of operation, the sensor comprising:

a piezoelectric structure;

a test circuit for providing a test signal corresponding to a pseudo rate of deflection of the piezoelectric structure;

means coupled to the test circuit for applying the test signal to the piezoelectric structure during the test mode;

pickup means disposed on the piezoelectric structure for picking up from said structure a signal which during the normal mode of operation corresponds to an actual rate of deflection of the structure and during the test mode corresponds both to the actual rate of deflection of the structure and to the pseudo rate of deflection; and

means responsive to the signal picked up from the piezoelectric structure for generating a test mode output signal which corresponds to a sum of the actual rate of deflection and the pseudo rate of deflection during the test mode and a normal output signal corresponding to the actual rate of deflection during the normal mode of operation.

34. The sensor of claim 33 wherein the test circuit includes means for switching between the test and normal modes and for providing the test signal only during the test mode.

35. The sensor of claim 33 wherein

the piezoelectric structure is vibratory;

the test signal corresponds to a pseudo vibration of the piezoelectric structure;

the actual deflection signal corresponds to an actual vibration of the piezoelectric structure; and

the output signal corresponds to a sum of actual and pseudo vibrations of the piezoelectric structure.

36. The sensor of claim 35 further comprising:

a drive circuit for generating a drive signal; and

drive electrodes coupled to the drive circuit and disposed on the piezoelectric structure for applying the drive signal to the structure to induce drive mode vibration of the structure;

the test circuit including means responsive to the drive signal for providing the test signal in phase with the drive signal.

37. The sensor of claim 36 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for applying a ground signal to the terminal;

the test circuit includes an attenuator coupled to the drive circuit for attenuating the drive signal to generate the test signal, and switching means connected between the attenuator and the pickup low terminal for applying the test signal to the pickup low terminal only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

38. The rotation rate sensor of claim 36 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for providing a ground signal to the terminal;

the test circuit includes an attenuator coupled to the pickup low terminal, and switching means between the drive circuit and the attenuator for providing the signal from the drive circuit to the attenuator only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

39. The sensor of claim 35 further comprising:

a drive circuit for generating a drive high signal;

drive high electrodes coupled to the drive circuit and disposed on the piezoelectric structure for applying the drive high signal to the structure to induce drive mode vibration of the structure; and

drive low electrodes disposed on the piezoelectric structure for picking up a drive low signal from the structure corresponding to the induced drive mode vibration;

the drive circuit including a current amplifier coupled to the drive low electrodes for amplifying the drive low signal to produce a current signal; and

the test circuit including means responsive to the current signal for providing the test signal in phase with the current signal.

40. The sensor of claim 39 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for applying a ground signal to the terminal;

the test circuit includes an attenuator coupled to the drive circuit for attenuating the current signal to generate the test signal, and switching means connected between the attenuator and the pickup low terminal for applying the test signal to the pickup low terminal only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

41. The sensor of claim 39 wherein:

the means for applying the test signal to the piezoelectric structure includes a pickup low terminal and a resistor coupled between the pickup low terminal and ground for providing a ground signal to the terminal;

the test circuit includes an attenuator coupled to the pickup low terminal, and switching means between the drive circuit and the attenuator for providing the current signal to the attenuator only during the test mode; and

the means for applying the test signal to the piezoelectric structure comprises pickup low electrodes coupled to the pickup low terminal and disposed on the piezoelectric structure for applying the test signal to the structure during the test mode and for applying the ground signal to the structure during the normal mode.

42. A sensor comprising:

a vibratory element which provides a signal corresponding to an actual deflection of the element;

a test circuit for providing a test signal corresponding to a pseudo deflection of the vibratory element; and

means responsive to the signal corresponding to the actual deflection and to the test signal for providing an output signal corresponding to the actual deflection and the pseudo deflection.

43. The sensor of claim 42 further including:

means for applying a drive signal to the vibratory element to produce drive mode vibration of the element; and

means in the test circuit responsive to the drive signal for providing the test signal in phase with the drive signal.

44. The sensor of claim 42 further including:

means coupled to the vibratory element for picking up a drive low signal corresponding to a drive mode vibration of said element;

means responsive to the drive low signal for providing a drive high signal; and

means for applying the drive high signal to the vibratory element to cause the drive mode vibration of the element.

45. The sensor of claim 44 wherein the test circuit includes means responsive to the drive high signal for providing the test signal in phase with the drive high signal.

46. The sensor of claim 44 wherein the test circuit includes an attenuator for attenuating the drive high signal to provide the test signal.

47. The sensor of claim 44 further including:

a current amplifier for amplifying the drive low signal to produce a current signal; and

means responsive to the current signal for providing the test signal in phase with the current signal.

48. The sensor of claim 47 wherein the test circuit includes means for attenuating the current signal to produce the test signal.

49. The sensor of claim 44 wherein the means for providing the drive high signal includes an amplifier with automatic gain control.