Interferential position measuring device
First Claim
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1. An interference device for generating signals, comprising:
- a light source;
at least two diffraction elements with identical or different diffraction structures; and
detectors for detecting diffracted, mutually interfering fractional beams, wherein each of the diffraction structures of the diffraction elements has a scale period d=d(x) that varies continuously as a function of x, a direction of graduation of the diffraction element.
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Abstract
The invention relates to an interference device having a light source, detectors, and at least two diffraction elements with identical or only slightly different diffraction structures, wherein the parameters of the diffraction structures of the diffraction elements vary continuously as a function of location.
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Citations
29 Claims
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1. An interference device for generating signals, comprising:
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a light source; at least two diffraction elements with identical or different diffraction structures; and detectors for detecting diffracted, mutually interfering fractional beams, wherein each of the diffraction structures of the diffraction elements has a scale period d=d(x) that varies continuously as a function of x, a direction of graduation of the diffraction element. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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26. An interference device for generating signals, comprising:
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a light source; a single diffraction element having a diffraction structure to produce mutually interfering fractional beams, and wherein said diffraction structure has a scale period d=d(x) that varies continuously as a function of x, a direction of graduation of the diffraction element. - View Dependent Claims (27, 28)
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29. A zero sensor, comprising:
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a light source; at least two diffraction elements with identical or different diffraction structures; and detectors for detecting diffracted, mutually interfering fractional beams, wherein each of the diffraction structures of the diffraction elements has a scale period d=d(x) that varies continuously as a function of x, a direction of graduation of the diffraction element.
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Specification