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X-ray monitoring system

  • US 5,428,657 A
  • Filed: 03/22/1994
  • Issued: 06/27/1995
  • Est. Priority Date: 03/22/1994
  • Status: Expired due to Fees
First Claim
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1. A method of locating and identifying unwanted matter or defects in a piece of material comprising the steps of:

  • directing a collimated X-ray beam onto the piece of material;

    detecting and measuring the Rayleigh scattering of X-ray energy from the material;

    detecting and measuring the Compton back-scatter of X-ray energy from the material;

    verifying the presence or absence of defects or unwanted matter and the location and identity thereof by comparing the scattering measurements;

    verifying the identity of the unwanted matter by determining the ratio of the Rayleigh-to-Compton measured scatter; and

    comparing the thus determined ratio to the known ratios for different materials to determine substantially unambiguously the identity of the unwanted matter.

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