Position measuring system using two groups of magnetoresistors spaced differently

• US 5,430,374 A
• Filed: 05/06/1994
• Issued: 07/04/1995
• Est. Priority Date: 05/14/1993
• Status: Expired due to Fees

• Current Assignee: Dr. Johannes Heidenhain GmbH
• Original Assignee: Dr. Johannes Heidenhain GmbH
• Inventors: Metz, Gerald
• Primary Examiner(s): Snow, Walter E.
• Application Number:
  US08/239,043
• Time in Patent Office: 424 Days
• Field of Search: 324/207.21, 324/207.24, 324/207.25, 324/207.13, 324/252, 338/32 R, 327/510
• US Class Current: 324/207.21
• CPC Class Codes: G01D 5/145 influenced by the relative movement between the Hall device and magnetic fields see G01R33/06
• CPC Class Codes: G01P 13/04 Indicating positive or negative direction of a linear movement or clockwise or anti-clockwise direction of a rotational movement

Abstract

In a position measuring system a period graduation is scanned by a scanning unit using two groups of respectively four magneto-resistive elements. To avoid crossings of the connecting strip conductors of the magneto-resistive elements and short-wave interference effects on the measuring accuracy, the magneto-resistive elements of the first group extend over one index period of the graduation at a mutual separation of t/4, while every magneto-resistive element of the second group is disposed in adjoining index periods of the graduation at a mutual separation of 3/4(t). Starting at the center of both groups, the respectively Nth magneto-resistive element of the first group is connected to the Nth magneto-resistive element of the second group free of crossings.

Claims

1. A position measuring system for measuring the relative position of a first object with respect to a second object, the first object and second objects being movable with respect to each other, comprising:

a periodic graduation located on the first object, the periodic graduation having an index period of t;

a scanning unit located on the second object for scanning the periodic graduation, the scanning unit comprising;

a first base arrangement facing the periodic graduation, the base arrangement including;

a first group of at least four magneto-resistive elements, the first group spanning a distance no greater than the index period of the graduation;

a second group of at least four magneto-resistive elements located adjacent to the first group, the second group spanning a distance greater than the index period of the graduation,

the first and second groups separated by a predetermined distance so that a center point exists between the two groups; and

a plurality of conductors for connecting elements of the first group to elements of the second group without crossing the conductors, wherein the Nth element of the first group is directly connected to the Nth element of the second group, where N represents the number element of the first and second groups from the center point.

2. A position measuring system according to claim 1 wherein the first group includes four magneto-resistive elements separated from each other by a distance substantially equal to one quarter of the index period and the second group includes four magneto-resistive elements separated from each other by a distance substantially equal to three quarters of the index period.

3. A position measuring system according to claim 1 wherein the elements of the first group connected to elements of the second group have the same phase relation with respect to the graduation and form a bridge arm of a half bridge and wherein the phase relation of the elements of one bridge arm of a half bridge circuit is phase shifted by t/2 with respect to the phase relation of the elements forming the other bridge arm and position-dependent output signals are taken at the connecting points of the bridge arms.

4. A position measuring system according to claim 2 wherein the elements of the first group connected to elements of the second group have the same phase relation with respect to the graduation and form a bridge arm of a half bridge and wherein the phase relation of the elements of one bridge arm of a half bridge circuit is phase shifted by t/2 with respect to the phase relation of the elements forming the other bridge arm and position-dependent output signals are taken at the connecting points of the bridge arms.

5. A position measuring system according to claim 1 further comprising a second base arrangement having the same configuration as the first base arrangement connected in series with the first base arrangement to form a series circuit wherein the first and second base arrangements are separated from each other in the measuring direction by one index period.

6. A position measuring system according to claim 5 wherein all elements of the first and second base arrangements having the same phase relation are connected in series and form one bridge arm of a half bridge.

7. A position measuring system according to claim 3 further comprising a second base arrangement having the same configuration as the first base arrangement connected in parallel with the first base arrangement wherein the first and second base arrangements are separated from each other in the measuring direction by one index period.

8. A position measuring system according to claim 5 further comprising a plurality of series circuits connected in parallel with one another.

9. A position measuring system according to claim 1 wherein the elements of the first group connected to elements of the second group have a phase relation of 180°

with respect to each other.

10. A position measuring system according to claim 9 wherein the predetermined distance is one half an index period.

11. A position measuring system according to claim 9 wherein the elements of the first group connected to elements of the second group form a full bridge wherein at least four position-dependent output signals phase-shifted by 90°

with respect to each other are output.

12. A position measuring system according to claim 2 wherein the elements of the first group connected to elements of the second group have a phase relation of 180°

with respect to each other.

13. A position measuring system according to claim 12 wherein the predetermined distance is one half an index period.

14. A position measuring system according to claim 12 wherein the elements of the first group connected to elements of the second group form a full bridge wherein at least four position-dependent output signals phase-shifted by 90°

with respect to each other are output.

15. A position measuring system according to claim 9 further comprising a second base arrangement having the same configuration as the first base arrangement connected in series with the first base arrangement to form a series circuit wherein the first and second base arrangements are separated from each other in the measuring direction by one index period.

16. A position measuring system according to claim 9 further comprising a second base arrangement having the same configuration as the first base arrangement connected in parallel with the first base arrangement wherein the first and second base arrangements are separated by one half of an index period.

17. A position measuring system according to claim 15 further comprising a plurality of series circuits connected in parallel.

18. A scanning unit for scanning a periodic graduation comprising:

a first base arrangement facing the periodic graduation, the base arrangement including;

a first base arrangement facing the periodic graduation, the base arrangement including;

a first group of at least four magneto-resistive elements, the first group spanning a distance no greater than the index period of the graduation;

a second group of at least four magneto-resistive elements located adjacent to the first group, the second group spanning a distance greater than the index period of the graduation,

the first and second groups separated by a predetermined distance so that a center point exists between the two groups; and

a plurality of conductors for connecting elements of the first group to elements of the second group without crossing the conductors, wherein the Nth element of the first group is directly connected to the Nth element of the second group, where N represents the number element of the first and second groups from the center point.

19. A position measuring system according to claim 18 wherein the first group includes four magneto-resistive elements separated from each other by a distance substantially equal to one quarter of the index period and the second group includes four magneto-resistive elements separated from each other by a distance substantially equal to three quarters of the index period.

20. A position measuring system according to claim 18 wherein the elements of the first group connected to elements of the second group have the same phase relation with respect to the graduation and form a bridge arm of a half bridge and wherein the phase relation of the elements of one bridge arm of a half bridge circuit is phase shifted by t/2 with respect to the phase relation of the elements forming the other bridge arm and position-dependent output signals are taken at the connecting points of the bridge arms.