Automated method and apparatus for calibration of laser scanning in a selective laser sintering apparatus

• US 5,430,666 A
• Filed: 12/18/1992
• Issued: 07/04/1995
• Est. Priority Date: 12/18/1992
• Status: Expired due to Fees

• Current Assignee: 3D Systems, Inc. (3D Systems Corporation)
• Original Assignee: DTM Corporation (3D Systems Corporation)
• Inventors: Davison, Michael R., DeAngelis, Francesco E., Leigh, David K.
• Primary Examiner(s): Ramirez, Ellis B.
• Assistant Examiner(s): KEMPER, MELANIE A
• Application Number:
  US07/992,559
• Time in Patent Office: 928 Days
• Field of Search: 364/571.01, 364/571.02, 364/571.04, 364/571.05, 364/571.07, 364/571.08, 364/579, 364/580, 364/167.01, 364/474.28, 364/474.35, 250/252.1, 250/491.1, 73/1 R, 356/373, 356/375, 382/30, 382/32, 346/109
• US Class Current: 250/491.1
• CPC Class Codes: B29C 64/153 using layers of powder being selectively joined, e.g. by selective laser sintering or melting
• CPC Class Codes: B33Y 10/00 Processes of additive manufacturing
• CPC Class Codes: B33Y 30/00 Apparatus for additive manufacturing; Details thereof or accessories therefor
• CPC Class Codes: G05B 19/4015 going to a reference at the beginning of machine cycle, e.g. for calibration
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

A method and apparatus for calibrating the scan of a laser over a planar surface that includes defining an error table having x-dimension and y-dimension correction factors, and also a scale factor, for each of a plurality of regions of the planar target surface. The scale factor is initially set to a value to account for differences in the size of the image field to be scanned and the overall scan field in the CAD data base. Adjustment is performed to each scale factor to account for theoretical differences due to the use of a perpendicular galvanometer-driven mirror scanning system. A sheet with a large number of square cells is then placed over the target surface, after rotational alignment, and the laser marks each cell. The sheet is then converted into digital form by scanning, and the location of the laser mark relative to the centroid of the cell is used to update the correction factors for that cell.

Claims

1. A method of calibrating a system for scanning a directed energy beam over a planar surface, comprising the steps of:

defining an error table corresponding to an image field, said image field being a portion of the planar surface, said error table including a plurality of values, each value associated with one of a plurality of regions of said image field;

placing a sheet over the planar surface, said sheet having a plurality of cells defined thereupon, each cell corresponding to one of the plurality of regions of said image field;

directing the energy beam in such a manner as to burn a mark in each of said plurality of cells on said sheet;

converting the image of said sheet to a computer-readable form;

determining a distance of each mark relative to a selected location in its associated cell by operating a computer on the converted image of said sheet; and

adjusting each of said plurality of values in said error table according to the distance of each mark relative to the selected location in its associated cell.

2. The method of claim 1, wherein said defining step comprises determining a scale factor for each of said plurality of values corresponding to its associated region of said image field.

3. The method of claim 2, wherein said system comprises:

a laser;

first and second scanning mirrors;

and wherein said defining step uses a distance between said first mirror and said planar surface, and a distance between said first and second scanning mirrors, in defining each of said plurality of values.

4. The method of claim 3, wherein said defining step comprises

defining each of said plurality of values using a ratio of a projected arc across its associated region to a length of its associated region.

5. The method of claim 1, wherein said plurality of values include a x-dimension correction factor and a y-dimension correction factor corresponding to each region of said image field.

6. The method of claim 5, wherein said plurality of values also include a scale factor corresponding to each region of said image field.

7. The method of claim 1, further comprising:

after said adjusting step, repeating said placing, directing, converting, determining and adjusting steps for a second sheet.

8. The method of claim 7, further comprising:

after each adjusting step, comparing a statistic of the distances of the marks relative to the selected location in its associated cell to a limit;

wherein the repeating of said placing, directing, converting, determining and adjusting steps is performed responsive to said comparing step.

9. The method of claim 1, wherein the selected location in each of said cells is its centroid.

10. A system for fabricating an article by scanning a directed energy beam over a planar surface, comprising:

a source of an energy beam;

first and second mirrors for controlling the scanning of the energy beam over the planar surface in first and second perpendicular directions, respectively;

a sheet disposed over the planar surface, said sheet having a plurality of cells defined thereupon, each of said cells markable by the energy beam;

means for controlling said source and said first and second mirrors; and

a computer for;

defining an error table having a plurality of values, each of said plurality of values associated with one of said plurality of cells of said sheet; and

for

adjusting said plurality of values in said error table responsive to the distance between a mark in each of said cells and a selected location in its associated cell.

11. The system of claim 10, further comprising:

a mounting disk for holding said sheet at the planar surface.

12. The system of claim 11, wherein said mounting disk comprises alignment pins, said alignment pins mating with alignment holes in said sheet.

13. The system of claim 11, wherein each of said plurality of values comprises first and second correction factors, corresponding to the first and second perpendicular directions, respectively.

14. The system of claim 11, wherein said computer is also for measuring a statistic, over all of said plurality of values in said error table, of the distance between the mark in each of said cells and the selected location in the associated cell.

15. The system of claim 11, wherein the selected location in each cell is the centroid of the cell.

16. The system of claim 11, wherein the orientation of said mounting disk is adjustable.

17. The system of claim 10, wherein said source comprises a laser.