Detector for the detection of chemical species or photons using a field effect transistor

• US 5,431,883 A
• Filed: 01/27/1994
• Issued: 07/11/1995
• Est. Priority Date: 01/24/1991
• Status: Expired due to Fees

• Current Assignee: Andre Barraud
• Original Assignee: Andre Barraud
• Inventors: Barraud, Andre
• Primary Examiner(s): Warden, Robert J.
• Assistant Examiner(s): TRAN, HIEN THI
• Application Number:
  US08/187,808
• Time in Patent Office: 530 Days
• Field of Search: 422/82.01, 422/90, 422/94, 422/98, 73/23.32, 73/25.05, 73/31.05, 73/31.06, 257/253, 257/254
• US Class Current: 422/82.01
• CPC Class Codes: G01N 27/414 Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS

Abstract

The invention relates to a detector or sensor for the detection of chemical species or photons. This detector uses a field effect transistor having a semiconducting material substrate (1) in which are defined a source (3) and a drain (5), a gate (9) separated from the substrate by an insulating layer, an external energy source for polarizing the drain, source and gate of the transistor, a film (11), which is conductive or which can be rendered conductive and which is sensitive to the chemical species or photons to be detected, and an ammeter for measuring an electric current variation of the transistor. The arrangement of the film (11) between the connections of the gate (9) and the drain (5) makes it possible to modify the polarization voltage of the transistor gate under the effect of the species to be detected, which is represented by a variation of the current between the drain and the source, when the transistor is correctly polarized.

Claims

1. Detector for the detection of a chemical species using an enrichment n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:

a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;

an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;

a gate electrical connection for connecting the gate of the transistor to the external circuit;

a drain electrical connection for connecting the drain of the transistor to the external circuit;

a source electrical connection for connecting the source of the transistor to the external circuit;

means external to the transistor connected between the transistor gate and the source for applying a potential difference V_GS ;

means external to the transistor connected between the transistor drain and source for applying a potential difference V_DS ;

a chemical species sensing film deposited between the transistor gate connection and the transistor drain connection, said film being in electrical contact solely between said gate and drain and being electrically sensitive to chemical species to be detected; and

means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said chemical species.

2. Detector according to claim 1, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said chemical species.

3. Detector according to claim 1, further comprising a 10⁴ to 10⁶ Mohms resistor associated with said means for applying a potential difference V_GS, so as to apply V_GS to the gate across said resistor.

4. Detector according to claim 1, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the chemical species to be detected.

5. Detector according to claim 4, wherein the sensing film is formed from monomolecular layers of cobalt II paratetraphenyl-2-oxyoctadecanoic acid porphyrin or iron tetra-N-heptadecyl pyridinium.

6. Detector according to claim 4, wherein the sensing film is a 100 nm to 1 μ

m phthalocyanin film.

7. Detector according to claim 4, wherein the sensing film is polyacetylene.

8. Detector according to claim 1, wherein the sensing film is an inorganic semiconductor material film.

9. Detector according to claim 1, wherein the sensing film is an electrically conductive material, which becomes insulating by reacting with the chemical species to be detected.

10. Detector according to claim 9, wherein the sensing film is a charge transfer complex doped with iodine in order to become conductive.

11. Detector according to claim 10, wherein the sensing film is formed from monomolecular layers of iodine-doped N-docosyl pyridinium tetracyanoquinodimethane.

12. Detector for the detection of a chemical species using a depletion n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:

a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;

an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;

a gate electrical connection for connecting the gate of the transistor to the external circuit;

a drain electrical connection for connecting the drain of the transistor to the external circuit;

a source electrical connection for connecting the source of the transistor to the external circuit;

means external to the transistor connected between the transistor gate and the source for applying a potential difference V_GS ;

means external to the transistor connected between the transistor drain and source for applying a potential difference V_DS ;

a chemical species sensing film deposited between the transistor gate connection and the transistor source connection, said film being in electrical contact solely between said gate and source and being electrically sensitive to chemical species to be detected; and

means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said chemical species.

13. Detector according to claim 12, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said chemical species.

14. Detector according to claim 12, further comprising a 10⁴ to 10⁶ Mohms resistor associated with said means for applying a potential difference V_GS, so as to apply V_GS to the gate across said resistor.

15. Detector according to claim 12, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the chemical species to be detected.

16. Detector according to claim 15, wherein the sensing film is formed from monomolecular layers of cobalt II paratetraphenyl-2-oxyoctadecanoic acid porphyrin or iron tetra-N-heptadecyl pyridinium.

17. Detector according to claim 15, wherein the sensing film is a 100 nm to 1 μ

m phthalocyanin film.

18. Detector according to claim 15, wherein the sensing film is polyacetylene.

19. Detector according to claim 12, wherein the sensing film is an inorganic semiconductor material film.

20. Detector according to claim 12, wherein the sensing film is an electrically conductive material, which becomes insulating by reacting with the chemical species to be detected.

21. Detector according to claim 20, wherein the sensing film is a charge transfer complex doped with iodine in order to become conductive.

22. Detector according to claim 21, wherein the sensing film is formed from monomolecular layers of iodine-doped N-docosyl pyridinium tetracyanoquinodimethane.

23. Detector for the detection of photons using an enrichment n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:

a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;

an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;

a gate electrical connection for connecting the gate of the transistor to the external circuit;

a drain electrical connection for connecting the drain of the transistor to the external circuit;

a source electrical connection for connecting the source of the transistor to the external circuit;

means external to the transistor connected between the transistor gate and the source for applying a potential difference V_GS ;

means external to the transistor connected between the transistor drain and source for applying a potential difference V_DS ;

a photon sensing film deposited between the transistor gate connection and the transistor drain connection, said film being in electrical contact solely between said gate and drain and being electrically sensitive to photons to be detected; and

means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said photons.

24. Detector according to claim 23, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said photons.

25. Detector according to claim 23, further comprising a 10⁴ to 10⁶ Mohms resistor associated with said means for applying a potential difference V_GS, so as to apply V_GS to the gate across said resistor.

26. Detector according to claim 23, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the photons to be detected.

27. Detector according to claim 26, wherein the sensing film is a photosensitive semiconductor film.

28. Detector according to claim 27, wherein the sensing film is a cadmium sulphide film.

29. Detector for the detection of photons using a depletion n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:

a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;

an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;

a gate electrical connection for connecting the gate of the transistor to the external circuit;

a drain electrical connection for connecting the drain of the transistor to the external circuit;

a source electrical connection for connecting the source of the transistor to the external circuit;

means external to the transistor connected between the transistor gate and the source for applying a potential difference V_GS ;

means external to the transistor connected between the transistor drain and source for applying a potential difference V_DS ;

a photon sensing film deposited between the transistor gate connection and the transistor source connection, said film being in electrical contact solely between said gate and source and being electrically sensitive to photons to be detected; and

means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said photons.

30. Detector according to claim 29, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said photons.

31. Detector according to claim 29, further comprising a 10⁴ to 10⁶ Mohms resistor associated with said means for applying a potential difference V_GS, so as to apply V_GS to the gate across said resistor.

32. Detector according to claim 29, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the photons to be detected.

33. Detector according to claim 32, wherein the sensing film is a photosensitive semiconductor film.

34. Detector according to claim 33, wherein the sensing film is a cadmium sulphide film.