Self-configuring test sytstem

• US 5,437,030 A
• Filed: 05/27/1993
• Issued: 07/25/1995
• Est. Priority Date: 10/31/1990
• Status: Expired due to Term

• Current Assignee: Grumman Aerospace Corporation (Northrop Grumman Corporation)
• Original Assignee: Grumman Aerospace Corporation (Northrop Grumman Corporation)
• Inventors: Kennedy, Jeanette, Reitman, William
• Primary Examiner(s): Kriess, Kevin A.
• Assistant Examiner(s): BUTLER, DENNIS
• Application Number:
  US08/069,690
• Time in Patent Office: 789 Days
• Field of Search: 395/650, 395/700, 395/800, 364/230.1, 364/230.3, 364/550, 364/551.01
• US Class Current: 717/164
• CPC Class Codes: G01M 11/00 Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

Abstract

A sensor test system is disclosed for testing the operation of infrared detector modules designed to be placed in earth orbit. The system includes an optical scene test generator (OSTG) for generating a scene representative of the earth'"'"'s surface as seen from a satellites, and an object moving in relation to the earth'"'"'s surface. Sensor chamber is disposed adjacent the OSTG for storing a detector module to be tested. Detector module is efficient within the sensor chamber to expose detector elements to the optical scene generated by the OSTG.

Claims

1. A process of dynamically configuring a set of instructions executed by a computer to permit the computer to implement processing functions defined by an operator, the process comprising:

providing in the computer a library of general function modules ordered by a programmer in predetermined processing priority levels;

linking within the computer only those general function modules necessary for linked modules to implement the defined processing functions, said linking being performed sequentially between modules on the same level, and between modules on different levels, by an operating system independent of operator intervention other than providing the defined processing functions;

communicating test data from external devices to the linked functional modules to implement processing of the test data in accordance with the processing functions by the linked modules, all modules on the same level being run concurrently via parallel processing; and

communicating outputs from the linked functional modules to buffers connected to select data presentation devices.

2. The process as recited in claim 1 wherein the step of linking includes the operating system prioritizing data collection, data processing and data presentation respectively, in response to the defined processing functions.

3. The process as recited in claim 1 wherein the step of linking general function modules is affected by a root program in response to input instructions indicating the defined processing functions.

4. The process as recited in claim 1 wherein the step of linking the general functions modules is affected by linking modules operative to perform generic functions in such a sequence so as to implement the defined processing function.

5. The process as recited in claim 1 wherein the general function modules are linkable to exclude modules that perform functions unnecessary to the defined processing function.

6. The process as recited in claim 1 wherein the general function modules are linkable to effect data collection, data processing and data display.