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Charged particle beam scattering system

  • US 5,440,133 A
  • Filed: 08/06/1993
  • Issued: 08/08/1995
  • Est. Priority Date: 07/02/1993
  • Status: Expired due to Term
First Claim
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1. A radiation treatment apparatus, comprising:

  • a source of charged particles which provides a charged particle beam; and

    a scattering foil in the path of the particle beam, said scattering foil being comprised of a high z material which substantially changes the diameter of the particle beam without substantially changing the energy of the particles, said beam intercepting said scattering foil at a beam intercept portion, said scattering foil having a thickness at said beam intercept portion of said scattering foil, said scattering foil being configured so that said thickness at said beam intercept portion is continuously adjustable through a range of thicknesses, the thickness of said scattering foil being uniform throughout said beam intercept portion through said range of thicknesses.

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