Laser thickness gauge

• US 5,442,573 A
• Filed: 04/28/1993
• Issued: 08/15/1995
• Est. Priority Date: 04/28/1992
• Status: Expired due to Fees

• Current Assignee: Taymor Industries, Inc.
• Original Assignee: Taymor Industries, Inc.
• Inventors: Torres, Cristian, Bredberg, Robert E.
• Primary Examiner(s): Cosimano, Edward R.
• Application Number:
  US08/053,512
• Time in Patent Office: 839 Days
• Field of Search: 364/563, 364/560, 356/4, 356/375, 356/381, 356/382, 356/1, 356/2, 340/619, 340/618, 250/560, 250/561
• US Class Current: 702/172
• CPC Class Codes: G01B 11/06 for measuring thickness ; e.g. of sheet material thickness measurement by thermal means G01B21/085

Abstract

An apparatus for determining the position of a surface of a specimen relative to a reference point. The apparatus has a beam source which produces a narrow beam and a beam splitter splits the narrow beam into a primary beam and the secondary beam. The primary and secondary beams are directed by the beam splitter or by a reflector onto the surface of the specimen. The impact points of the primary and secondary beams on the surface of the specimen form images which are monitored by a photo-sensor array. A processor uses the images of the impact points to calculate the distance between the surface of the specimen and the reference point. The use of two such apparatus allows for the thickness of the specimen to be measured.

Claims

1. An apparatus for determining the position of a specimen relative to a reference point comprising;

(a) source means for producing a beam of electromagnetic radiation;

(b) splitting means for splitting said beam into a primary beam and a secondary beam;

(c) reflecting means for directing said primary and secondary beams onto a surface of said specimen when in a measuring position between the source means and the reference point such that each of said primary and said secondary beams impinge said surface at an angle and converge at said reference point;

(d) means for sensing the points at which said primary and said secondary beams impinge said surface of said specimen and for producing a signal related thereto; and

(e) means for processing said signal to determine the position of said surface of said specimen relative to said reference point.

2. An apparatus as claimed in claim 1, wherein said reflecting means comprises two reflectors, one of said reflectors directing said primary beam onto a surface of said specimen and the other of said reflectors directing said secondary beam onto said surface, such that said primary and secondary beam impinge onto said surface, such that said primary and secondary beams are inclined in opposite directions with respect to said surface.

3. An apparatus as claimed in claim 2, wherein the source means, the splitting means and the reflecting means are aligned with one another.

4. An apparatus as claimed in claim 2, wherein each of the two reflectors is pivotally mounted around a pivot axis that extends through a plane of the reflector and which is generally perpendicular to a plane containing the primary and secondary beams.

5. An apparatus as claimed in claim 4, wherein said means for sensing comprises a photosensor array and a lens system for focusing said points onto said photosensor array.

6. An apparatus as claimed in claim 5, wherein said photosensor array comprises a CCD line scan camera.

7. An apparatus as claimed in claim 5, which includes electric motor means for the reflecting means, for pivotally adjustment thereof about their respective pivot axes, and for the lens system for adjustment thereof.

8. An apparatus as claimed in claim 7, wherein the electric motors are connected to the processing means, for automatic adjustment thereof.

9. An apparatus as claimed in claim 5 which includes single electric motor driving a common shaft, and gear means connecting the shaft to each of the reflectors, the processor being connected to and controlling the electric motor.

10. An apparatus as claimed in claim 1, 3 or 7, further including means for calibrating the apparatus, the means for calibrating having a plurality of reference surfaces and a movement mechanism upon which the reference surfaces are mounted, the movement mechanism being capable of sequentially moving the reference surfaces into measuring position with the location of each reference surface in the measuring position being known, whereby the apparatus can be calibrated by the reference surfaces.

11. An apparatus as claimed in claim 10, wherein the reference surfaces are secured to a common shaft which moves the reference surfaces by rotation thereof.

12. A system comprising a first apparatus and a second apparatus as claimed in claim 1, 3 or 7, with the first apparatus arranged to determine the position of one surface of a specimen, relative to a first respective reference point, and the second apparatus arranged to determine the position of another and opposite surface of the specimen relative to a second respective reference point, and the means for processing being coupled to the first and second apparatus and including means for computing the thickness of the specimen from the positions determined by the first and second apparatus respectively.

13. A system comprising at least three apparatus as claimed in claim 1, 3 or 7, wherein each of the three apparatus are arranged to determine a position for a separate portion of one surface of a specimen and including processor means for determining the flatness of the specimen from the positions determined by the three apparatus.

14. A system as claimed in claim 13, wherein the three apparatus are spaced both longitudinally and horizontally from one another.

15. An apparatus for determining the position of a planar surface or specimen relative to a reference point, the apparatus comprising;

source means for producing a pair of beams included at opposite directions to the planar surface of the specimen;

means for sensing the points at which said beams impinge said surface of said specimen and for producing a signal related thereto;

means for processing said signal to determine the position of said surface of said specimen relative to said reference point;

calibration means comprising a plurality of reference surfaces; and

a movement mechanism to which the reference surfaces are mount, which movement mechanism is capable of moving each reference surface sequentially to a measuring position, with the location of each reference surface in the measurement position relative to the reference point being known, whereby to permit calibration of the apparatus.

16. An apparatus as claimed in claim 15, wherein the movement mechanism comprises a shaft to which the reference surfaces are secured, and which moves the reference surfaces by rotation thereof.

17. An apparatus as claimed in claim 15 or 16, which includes a second sources means for determining the position of a second planar surface of the specimen, opposite and parallel to the first-mentioned planar surface, which includes a plurality of reference elements, each of which includes upper and lower reference surfaces for enabling each apparatus to be calibrated thereby.