Spectrometer provided with an optical shutter

• US 5,457,530 A
• Filed: 08/15/1994
• Issued: 10/10/1995
• Est. Priority Date: 08/27/1993
• Status: Expired due to Fees

• Current Assignee: Minolta Corporation Limited (Konica Minolta Inc.)
• Original Assignee: Minolta Corporation Limited (Konica Minolta Inc.)
• Inventors: Nagai, Yoshiroh
• Primary Examiner(s): EVANS, FANNIE L
• Application Number:
  US08/290,231
• Time in Patent Office: 421 Days
• Field of Search: 356/310, 356/330
• US Class Current: 356/330
• CPC Class Codes: G01J 2003/1273 Order selection
• CPC Class Codes: G01J 3/0229 using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
• CPC Class Codes: G01J 3/0232 using shutters
• CPC Class Codes: G01J 3/06 Scanning arrangements arrangements for order-selection

Abstract

A multi-slit type spectrometer includes a diffractor by which an incident light is diffracted according to wavelengths; an optical shutter array member including a plurality of optical shutter elements arranged in correspondence with wavelength bands diffracted by the diffractor, operable to transmit an incident ray according to an applied voltage, and made of PLZT. Each optical shutter element is applied with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so that the ray passes through the optical shutter element. The spectrometer further includes a photosensor to convert the ray passed through the optical shutter element to an electrical signal, and a calculator to calculate the intensity of the incident ray for each band in accordance with the electrical signal output from the photosensor and the specified applying timing.

Claims

1. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged in correspondence with wavelength bands diffracted by the diffracting means;

operable to transmit an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the wavelength band of the ray incident upon the optical shutter element at a specified timing so that the ray passes through the optical shutter element, the application voltages for the bands differing from one another in accordance with wavelengths which fall within the respective bands;

processing means for receiving the ray which has passed through the optical shutter element and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each wavelength band in accordance with the electrical signal output from the processing means and the specified applying timing.

2. A spectrometer according to claim 1 wherein the applying means includes:

voltage calculation means for calculating for each band an application voltage necessary for the corresponding optical shutter element to transmit the ray having a wavelength which falls within this band; and

voltage application means in responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements.

3. A spectrometer according to claim 2 wherein:

the applying means further includes temperature detecting means for detecting the temperature of the optical shutter array member; and

the voltage calculation means for calculating an application voltage for each band in consideration of the detected temperature.

4. A spectrometer according to claim 1 wherein:

the applying means includes voltage application means for applying the optical shutter elements with their respective corresponding voltages at different applying intervals; and

the light intensity calculating means includes converting means for converting electrical signal outputs from the processing means to digital data at specified sampling timings; and

calculating means for calculating the intensity of the ray for each band by Fourier-transforming the digital data.

5. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

first condenser means for concentrating diffracted rays for specified wavelength bands;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged at concentrated positions of the first condenser means in correspondence with specified wavelength bands;

operable to transmit an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so that the ray passes through the optical shutter element, the application voltages for the bands differing from one another in accordance with wavelengths which fall within the respective bands;

second condenser means for concentrating the ray which has passed through the optical shutter element;

processing means for receiving the concentrated ray and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each band in accordance with the electrical signal output from the processing means and the specified applying timing.

6. A spectrometer according to claim 5 wherein the applying means includes:

voltage calculation means for calculating for each band an application voltage necessary for the corresponding optical shutter element to transmit the ray having a wavelength which falls within this band; and

voltage application means in responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements.

7. A spectrometer according to claim 6 wherein:

the applying means further includes temperature detecting means for detecting the temperature of the optical shutter array member; and

the voltage calculation means for calculating an application voltage for each band in consideration of the detected temperature.

8. A spectrometer according to claim 5 wherein:

the applying means includes voltage application means for applying the optical shutter elements with their respective corresponding voltages at different applying intervals; and

the light intensity calculating means includes converting means for converting electrical signal outputs from the processing means to digital data at specified sampling timings; and

calculating means for calculating the intensity of the ray for each band by Fourier-transforming the digital data.

9. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged in correspondence with wavelength bands diffracted by the diffracting means;

operable to block an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so as to reflect the ray thereat, the application voltages for the bands differing from one another in accordance with wavelengths which fall within the respective bands;

processing means for receiving the ray reflected at the optical shutter element and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each band in accordance with the electrical signal output from the processing means and the specified applying timing.

10. A spectrometer according to claim 9 wherein the applying means includes:

voltage calculation means for calculating for each band an application voltage necessary for the corresponding optical shutter element to block the ray having a wavelength which falls within this band; and

voltage application means in responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements.

11. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

first condenser means for concentrating diffracted rays for specified wavelength bands;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged at concentrated positions of the first condenser means in correspondence with specified wavelength bands;

operable to block an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so as to reflect the ray thereat, the application voltages for the bands differing from one another in accordance with wavelengths which fall within the respective bands;

second condenser means for concentrating the ray which has been reflected at the optical shutter element;

processing means for receiving the concentrated ray and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each band in accordance with the electrical signal output from the processing means and the specified applying timing.

12. A spectrometer according to claim 11, wherein the applying means includes:

voltage calculation means for calculating for each band an application voltage necessary for the corresponding optical shutter element to block the ray having a wavelength which falls within this band; and

voltage application means in responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements.

13. A spectrometer comprising:

a diffractor by which an incident light is diffracted according to wavelengths;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged in correspondence with wavelength bands diffracted by the diffractor;

operable to transmit an incident ray according to an applied voltage; and

made of PLZT;

a voltage applicator by which each optical shutter element is applied with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so that the ray passes through the optical shutter element, the voltage applicator including;

a voltage calculating device which calculates, for each band, an application voltage necessary for the corresponding optical shutter element to transmit the ray having a wavelength which falls within this band; and

a voltage application device which is responsive to the voltage calculating device and applies the calculated voltages to the respective optical shutter elements;

a photosensor which receives the ray which has passed through the optical shutter element to output an electrical signal according to the intensity of the received ray; and

a calculator by which the intensity of the incident ray for each band is calculated in accordance with the electrical signal output from the photosensor and the specified applying timing.

14. A spectrometer comprising:

a diffractor by which an incident light is diffracted according to wavelengths;

a first optical condenser to concentrate diffracted rays for specified wavelength bands;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged at concentrated positions of the first optical condenser in correspondence with specific wavelength bands;

operable to transmit an incident ray according to an applied voltage; and

made of PLZT;

a voltage applicator by which each optical shutter element is applied with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so that the ray passes through the optical shutter element, the voltage applicator including;

a voltage calculating device which calculates for each band an application voltage necessary for the corresponding optical shutter element to transmit the ray having a wavelength which falls within this band; and

a voltage application device which is responsive to the voltage calculating device and applies the calculated voltages to the respective optical shutter elements;

a second optical condenser to concentrate the ray which has passed through the optical shutter element;

a photosensor which receives the concentrated ray to output an electrical signal according to the intensity of the received ray; and

a calculator by which the intensity of the incident ray for each band is calculated in accordance with the electrical signal output from the photosensor and the specified applying timing.

15. A spectrometer comprising:

a diffractor by which an incident light is diffracted according to wavelengths;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged in correspondence with wavelength bands diffracted by the diffractor;

operable to block an incident ray according to an applied voltage; and

made of PLZT;

a voltage applicator by which each optical shutter element is applied with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so as to reflect the ray thereat, the voltage applicator including;

a voltage calculating device which calculates for each band an application voltage necessary for the corresponding optical shutter element to block the ray having a wavelength which falls within this band; and

a voltage application device which is responsive to the voltage calculating device and applies the calculated voltages to the respective optical shutter elements;

a photosensor which receives the ray reflected at the optical shutter element to output an electrical signal according to the intensity of the received ray; and

a calculator by which the intensity of the incident ray for each band is calculated in accordance with the electrical signal output from the photosensor and the specified applying timing.

16. A spectrometer comprising:

a diffractor by which an incident light is diffracted according to wavelengths;

a first optical condenser to concentrate diffracted rays for specified wavelength bands;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged at concentrated positions of the first optical condenser in correspondence with specified wavelength bands;

operable to block an incident ray according to an applied voltage; and

made of PLZT;

a voltage applicator by which each optical shutter element is applied with a voltage corresponding to the band of the ray incident upon the optical shutter element at a specified timing so as to reflect the ray thereat, the voltage applicator including;

a voltage calculating device which calculates for each band an application voltage necessary for the corresponding optical shutter element to block the ray having a wavelength which falls within this band; and

a voltage application device which is responsive to the voltage calculating device and applies the calculated voltages to the respective optical shutter elements;

a second optical condenser to concentrate the ray which has been reflected at the optical shutter element;

a photosensor which receives the concentrated ray to output an electrical signal according to the intensity of the received ray; and

a calculator by which the intensity of the incident ray for each band is calculated in accordance with the electrical signal output from the photosensor and the specified applying timing.

17. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged in correspondence with wavelength bands diffracted by the diffracting means;

operable to transmit an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying to each optical shutter element a voltage corresponding to the band of the ray incident upon the optical shutter element so that the ray passes through the optical shutter element, including;

voltage calculation means for calculating, for each wavelength band, an application voltage necessary for the corresponding optical shutter element to transmit the incident ray having a wavelength which falls within this wavelength band; and

voltage application means responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements;

processing means for receiving the ray which has passed through the optical shutter element and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each wavelength band in accordance with the electrical signal output from the processing means.

18. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

first condenser means for concentrating diffracted rays for specified wavelength bands;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged at concentrated positions of the first condenser means in correspondence with specified wavelength bands;

operable to transmit an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the wavelength band of the ray incident upon the optical shutter element at a specified timing so that the ray passes through the optical shutter element, including;

voltage calculation means for calculating, for each wavelength band, an application voltage necessary for the corresponding optical shutter element to transmit the incident ray having a wavelength which falls within this wavelength band; and

voltage application means responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements;

second condenser means for concentrating the ray which has passed through the optical shutter element;

processing means for receiving the concentrated ray and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each wavelength band in accordance with the electrical signal output from the processing means and the specified applying timing.

19. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged in correspondence with wavelength bands diffracted by the diffracting means;

operable to block an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the wavelength band of the ray incident upon the optical shutter element at a specified timing so as to reflect the ray thereat, including;

voltage calculation means for calculating, for each wavelength band, an application voltage necessary for the corresponding optical shutter element to block the incident ray having a wavelength which falls within this wavelength band; and

voltage application means responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements;

processing means for receiving the ray reflected at the optical shutter element and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each band in accordance with the electrical signal output from the processing means and the specified applying timing.

20. A spectrometer comprising:

diffracting means for diffracting an incident light according to wavelengths;

first condenser means for concentrating diffracted rays for specified wavelength bands;

an optical shutter array member including a plurality of optical shutter elements, the optical shutter elements being;

arranged at concentrated positions of the first condenser means in correspondence with specified wavelength bands;

operable to block an incident ray according to an applied voltage; and

made of PLZT;

applying means for applying each optical shutter element with a voltage corresponding to the wavelength band of the ray incident upon the optical shutter element at a specified timing so as to reflect the ray thereat, including;

voltage calculation means for calculating, for each wavelength band, an application voltage necessary for the corresponding optical shutter element to block the incident ray having a wavelength which falls within this wavelength band; and

voltage application means responsive to the voltage calculation means for applying the calculated voltages to the respective optical shutter elements;

second condenser means for concentrating the ray which has been reflected at the optical shutter element;

processing means for receiving the concentrated ray and outputting an electrical signal according to the intensity of the received ray; and

light intensity calculating means for calculating the intensity of the incident ray for each wavelength band in accordance with the electrical signal output from the processing means and the specified applying timing.