Apparatus for selecting a valid signal from a plurality of redundant measured and modelled sensor signals

• US 5,469,447 A
• Filed: 10/28/1994
• Issued: 11/21/1995
• Est. Priority Date: 05/13/1991
• Status: Expired due to Term

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Reismiller, Paul R., Brunemann, George A. Jr.
• Primary Examiner(s): Beausoliel, Jr., Robert W.
• Assistant Examiner(s): Palys, Joseph E.
• Application Number:
  US08/331,294
• Time in Patent Office: 389 Days
• Field of Search: 371/36, 371/15.1, 371/68.1, 371/68.3, 371/67.1, 371/5.1
• US Class Current: 714/797
• CPC Class Codes: G05B 9/03 with multiple-channel loop, i.e. redundant control systems

Abstract

The present invention provides a method and an apparatus for selecting a valid signal from a plurality of redundant sensor signals wherein the sensor signals may include a plurality of measured and modelled signals. The invention comprises a circuit for generating a plurality of first pass/fail signals by performing a series of tests on the sensor signals. The invention further comprises circuitry for assigning a plurality of weighted values to each of the measured sensor signals according to the first and second pass/fail signals wherein the second pass/fail signals are initialized as pass signals. The invention further comprises of circuitry for summing the weighted values for each measured sensor signal and generating second pass/fail signals for each measured sensor signal. The invention also includes circuitry for assigning selection flags to each sensor signal according to the first and second pass/fail signals and circuitry for selecting the valid signal from the selection flags.

Claims

1. An apparatus for selecting a valid signal from among a plurality of redundant sensor signals comprising:

a plurality of rate/range test circuits for receiving a first measured signal input and outputting a respective ranger/rate flag;

a plurality of comparison signal test circuits for comparing said first measured signal input to a modeled signal input and for outputting a respective first comparison flag;

a plurality of comparison signal test circuits for comparing said first measured input signal to a second measured input signal, and for outputting a respective second comparison flag;

a plurality of validity filters, each having as an input a filter increment signal, and each outputting a respective validity flag; and

validation logic for receiving as inputs said validity flags, said range/rate flags, and said first second comparison flags, and for providing as outputs a plurality of selection flags each selected according to a weighted value of said range/rate flags, said comparison flags, and said validity flags, and for generating a plurality of measured filter increment signals each having a magnitude and sign according to the weight value of said range/rate flags, said comparison flags, and said validity flags where the most negative value represents a valid measured signal and the most positive value represents an invalid measured signal.

2. An apparatus according to claim 1, wherein:

said validity filter logic comprises means for summing each current filter increment input value to the previously stored filter increment value.

3. The apparatus according to claim 2, wherein said validity filter logic further comprises;

means for initially setting said validity flags to pass state;

means for setting said validity flag to an invalid state when said summed value reaches an upper limit;

means for resetting said validity flag to a valid state when said summed value reaches an lower limit; and

means for latching said validity flag to an invalid state when it has been set to an invalid state and reset to a valid state a predetermined number of times.

4. The apparatus according to claim 1, wherein:

each said range/rate test circuit comprising means for generating a range/rate flag when said measured signal values are outside a predetermined range.

5. The apparatus according to claim 4 wherein:

each said range/rate test circuit comprising means for generating a range/rate flag when said measured signal'"'"'s rate of change is outside a predetermined limit.

6. The apparatus according to claim 1 wherein:

each said comparison signal test circuit comprising means for generating a comparison flag when said measured signal values do not substantially equal the corresponding input signal.