Probeable substrate substitute for a calibration standard and test fixture
First Claim
1. A probeable substrate for receiving an electronic device, the probeable substrate comprising:
- a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface;
a first metalized layer in contact with the first dielectric substrate surface and the at least one conductive via hole;
a second metalized layer in contact with a first portion of the second dielectric substrate surface and in contact with the at least one conductive via hole; and
first and second test ports in contact with a second portion of the second dielectric substrate surface;
wherein the electronic device is connected to the first and second test ports for probing via the first and second test ports.
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Accused Products
Abstract
A method and apparatus for a probeable substrate substitute for a calibration standard and test fixture. The probestrate includes a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface. A first metalized layer is in contact with the first dielectric substrate surface and the at least one conductive via hole. A second metalized layer is in contact with a first portion of the second dielectric substrate surface and with the at least one conductive via hole. The first and second test ports contact a second portion of the second dielectric substrate surface. An electronic device can be connected to the first and second test ports with bond wires for characterization via contact of the first and second test ports with standard test station equipment.
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Citations
13 Claims
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1. A probeable substrate for receiving an electronic device, the probeable substrate comprising:
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a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface; a first metalized layer in contact with the first dielectric substrate surface and the at least one conductive via hole; a second metalized layer in contact with a first portion of the second dielectric substrate surface and in contact with the at least one conductive via hole; and first and second test ports in contact with a second portion of the second dielectric substrate surface;
wherein the electronic device is connected to the first and second test ports for probing via the first and second test ports. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A test fixture for probing an integrated circuit comprising:
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a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface; a first metalized layer in contact with the first dielectric substrate surface and in contact with the at least one conductive via hole; a second metalized layer in contact with a first portion of the second dielectric substrate surface and in contact with the at least one conductive via hole; and first and second test ports in contact with a second portion of the second dielectric substrate surface;
wherein the integrated circuit is connected to the first and second test ports for probing via the first and second test ports. - View Dependent Claims (9, 10, 11, 12, 13)
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Specification