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Probeable substrate substitute for a calibration standard and test fixture

  • US 5,477,137 A
  • Filed: 10/02/1992
  • Issued: 12/19/1995
  • Est. Priority Date: 10/02/1992
  • Status: Expired due to Fees
First Claim
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1. A probeable substrate for receiving an electronic device, the probeable substrate comprising:

  • a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface;

    a first metalized layer in contact with the first dielectric substrate surface and the at least one conductive via hole;

    a second metalized layer in contact with a first portion of the second dielectric substrate surface and in contact with the at least one conductive via hole; and

    first and second test ports in contact with a second portion of the second dielectric substrate surface;

    wherein the electronic device is connected to the first and second test ports for probing via the first and second test ports.

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