Dual beam tunable spectrometer

• US 5,477,321 A
• Filed: 08/31/1994
• Issued: 12/19/1995
• Est. Priority Date: 08/31/1994
• Status: Expired due to Term

• Current Assignee: Bayer Corporation (Bayer AG)
• Original Assignee: Bayer Corporation (Bayer AG)
• Inventors: Johnson, Rick J.
• Primary Examiner(s): EVANS, FANNIE L
• Application Number:
  US08/298,613
• Time in Patent Office: 475 Days
• Field of Search: 356/308, 356/309, 356/369, 356/319, 356/323, 356/325, 356/326, 356/327, 356/328, 356/446-448, 250/339.07, 250/339.11, 250/339.13, 250/338.5
• US Class Current: 356/319
• CPC Class Codes: G01J 3/08 Beam switching arrangements
• CPC Class Codes: G01J 3/1256 using acousto-optic tunable filter; acousto-optic elements or systems G02F1/11, G02F1/33
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08

Abstract

A dual beam tunable spectrometer comprises a radiation source, generating means, a detector, and a shutter arrangement. The radiation source generates an incident radiative beam. The generating means, which includes an acousto-optic tunable filter, receives the incident radiative beam and generates therefrom a reference beam and a sample beam. The detector detects at least part of the reference beam, and detects at least part of the sample beam emitted from a sample following illumination of the sample with the sample beam. The shutter arrangement includes a first shutter selectively permitting passage therethrough of the part of the reference beam and a second shutter selectively permitting passage therethrough of the part of the sample beam. The shutter arrangement opens the first shutter and closes the second shutter to permit the detector to detect only the part of the reference beam. Similarly, the shutter arrangement closes the first shutter and opens the second shutter to permit the detector to detect only the part of the sample beam.

Claims

1. A dual beam tunable spectrometer comprising:

a radiation source generating an incident radiative beam;

generating means, including an acousto-optic tunable filter, for receiving said incident radiative beam and generating therefrom a reference beam and a sample beam;

a detector for detecting at least part of said reference beam, and for detecting at least part of said sample beam emitted from a sample following illumination of the sample with said sample beam; and

a shutter arrangement including a first shutter selectively permitting passage therethrough of said part of said reference beam and a second shutter selectively permitting passage therethrough of said part of said sample beam, said shutter arrangement opening said first shutter and closing said second shutter to permit said detector to detect only said part of said reference beam, said shutter arrangement closing said first shutter and opening said second shutter to permit said detector to detect only said part of said sample beam.

2. The spectrometer of claim 1, wherein said acousto-optic tunable filter processes said incident radiative beam into a zero-order beam, a first polarized first-order beam, and a second polarized first-order beam, said first first-order beam being orthogonally-polarized relative to said second first-order beam.

3. The spectrometer of claim 2, wherein said first first-order beam is said reference beam and said second first-order beam is said sample beam.

4. The spectrometer of claim 3, further including a polarizing beam splitter disposed between the sample and said detector, and further including conveying means for directing said reference beam and said sample beam into opposite sides of said polarizing beam splitter.

5. The spectrometer of claim 4, wherein said polarizing beam splitter is oriented relative to the polarizations of said reference and sample beams so as to convey said part of said reference beam toward said detector when said first shutter is open and to convey a substantial portion of said sample beam onto the sample when said second shutter is open, and wherein said polarizing beam splitter receives radiation reflected from said sample and conveys a randomly-polarized diffusely-reflected portion of said radiation to said detector when said second shutter is open.

6. The spectrometer of claim 5, wherein the polarization of said reference beam is parallel to its plane of incidence relative to said polarizing beam splitter, and wherein the polarization of said sample beam is orthogonal to its plane of incidence relative to said polarizing beam splitter.

7. The spectrometer of claim 4, wherein said conveying means includes a converging lens and a mirror.

8. The spectrometer of claim 1, further including a radio frequency source coupled to said acousto-optic tunable filter, said radio frequency source supplying said acousto-optic tunable filter with a radio frequency tuning signal to control wavelengths of said reference beam and said sample beam.

9. The spectrometer of claim 1, wherein said acousto-optic tunable filter produces a first-order beam, and wherein said generating means includes a first beam splitter for splitting said first-order beam into said reference beam and said sample beam.

10. The spectrometer of claim 9, further including a first optical fiber receiving said sample beam from said first beam splitter and conveying said sample beam to said sample, and a second optical fiber receiving radiation emitted from said sample.

11. The spectrometer of claim 10, wherein an output end of said first optical fiber and an input end of said second optical fiber are arranged on opposite sides of the sample so that said second optical fiber receives radiation transmitted through the sample.

12. The spectrometer of claim 10, wherein an output end of said first optical fiber and an input end of said second optical fiber are arranged on the same side of the sample so that said second optical fiber receives radiation reflected from the sample.

13. The spectrometer of claim 9, further including a second beam splitter disposed adjacent to said detector, said second beam splitter conveying said part of said reference beam toward said detector when said first shutter is open, said second beam splitter conveying said part of said sample beam toward said detector when said second shutter is open.

14. The spectrometer of claim 13, further including conveying means for directing said reference beam from said first beam splitter to said second beam splitter, said first shutter being disposed between said first beam splitter and said second beam splitter.

15. The spectrometer of claim 14, wherein said conveying means includes a converging lens.

16. The spectrometer of claim 13, further including first conveying means for directing said sample beam from said first beam splitter to the sample, and second conveying means for directing said part of said sample beam from the sample to said second beam splitter.

17. The spectrometer of claim 16, wherein said first conveying means includes a first converging lens and a first optical fiber, and said second conveying means includes a second converging lens and a second optical fiber.

18. The spectrometer of claim 16, wherein said second shutter is disposed between said second conveying means and said second beam splitter.

19. A dual beam tunable spectrometer comprising:

a radiation source generating an incident radiative beam;

an acousto-optic tunable filter receiving said incident radiative beam and generating therefrom a first-order beam;

a first beam splitter arranged to receive said first-order beam and split said first-order beam into a reference beam and a sample beam;

a second beam splitter arranged to receive said reference beam and convey at least part of said reference beam to a detector, said second beam splitter arranged to receive at least part of said sample beam emitted from a sample following illumination of the sample with said sample beam and to convey said part of said sample beam to said detector; and

a shutter arrangement arranged to permit said detector to detect only one of said part of said reference beam and said part of said sample beam at any given time.

20. The spectrometer of claim 19, wherein said shutter arrangement includes a first shutter disposed between said first beam splitter and said second beam splitter to selectively permit passage therethrough of said reference beam.

21. The spectrometer of claim 20, wherein said shutter arrangement includes a second shutter disposed between the sample and said second beam splitter to selectively permit passage therethrough of said part of said sample beam, said first shutter being open and said second shutter being closed to permit said detector to detect only said part of said reference beam, said first shutter being closed and said second shutter being opened to permit said detector to detect only said part of said sample beam.

22. A dual beam tunable spectrometer comprising:

a radiation source generating an incident radiative beam;

an acousto-optic tunable filter receiving said incident radiative beam and generating therefrom a first-order beam;

first conveying means for directing said incident radiative beam from said radiation source to said acousto-optic tunable filter;

a first beam splitter arranged to receive said first-order beam and split said first-order beam into a reference beam and a sample beam;

second conveying means for directing said first-order beam from said acousto-optic tunable filter to said first beam splitter;

a second beam splitter arranged to receive said reference beam and convey at least part of said reference beam to a detector, said second beam splitter arranged to receive at least part of said sample beam emitted from a sample following illumination of the sample with said sample beam and to convey said part of said sample beam to said detector;

third conveying means for directing said reference beam from said first beam splitter to said second beam splitter;

fourth conveying means for directing said sample beam from said first beam splitter to the sample;

fifth conveying means for directing said part of said sample beam from the sample to said second beam splitter; and

a shutter arrangement including a first shutter disposed along said third conveying means to selectively permit passage therethrough of said reference beam, and a second shutter disposed along one of said fourth and fifth conveying means to selectively permit passage therethrough of said sample beam, said shutter arrangement opening said first shutter and closing said second shutter to permit said detector to detect only said part of said reference beam, said shutter arrangement closing said first shutter and opening said second shutter to permit said detector to detect only said part of said sample beam.

23. The spectrometer of claim 22, wherein said second shutter is disposed along said fifth conveying means.

24. A dual beam tunable reflectance spectrometer comprising:

a radiation source generating an incident radiative beam;

an acousto-optic tunable filter receiving said incident radiative beam and generating therefrom first and second orthogonally-polarized first-order beams;

a polarizing beam splitter arranged to convey at least part of said first first-order beam toward a detector and to direct at least part of said second first-order beam toward a sample at an incidence angle of approximately 90 degrees relative to the sample, said polarizing beam splitter further arranged to receive radiation reflected from the sample at a reflection angle of approximately 90 degrees relative to the sample and convey a randomly-polarized diffusely-reflected portion of the reflected radiation to said detector;

first conveying means for directing said first first-order beam from said acousto-optic tunable filter into one side of said polarizing beam splitter, and second conveying means for directing said second first-order beam from said acousto-optic tunable filter into an opposite side of said polarizing beam splitter; and

first and second shutters disposed along said respective first and second conveying means to selectively permit passage therethrough of said respective first and second first-order beams, said first and second shutters being operative to permit only one of said first and second first-order beams to reach said polarizing beam splitter at a given time.

25. A method of measuring the concentration of an analyte in a sample, comprising the steps of:

generating an incident radiative beam with a radiation source;

conveying the radiative beam to an acousto-optic tunable filter;

generating a first-order beam with the acousto-optic tunable filter;

splitting the first-order beam into a reference beam and a sample beam using a first beam splitter;

conveying the reference beam from the first beam splitter to a second beam splitter;

conveying a portion of the reference beam into a detector using the second beam splitter;

cutting off conveyance of the reference beam to the second beam splitter using a shutter;

conveying the sample beam to the sample and conveying a portion of the sample beam transmitted through or reflected from the sample to the second beam splitter; and

conveying the portion of the sample beam into the detector via the second beam splitter.

26. A method of measuring the concentration of an analyte in a sample, comprising the steps of:

generating an incident radiative beam with a radiation source;

conveying the radiative beam to an acousto-optic tunable filter;

generating first and second orthogonally-polarized first-order beams with the acousto-optic tunable filter, the first first-order beam corresponding to a reference beam and the second first-order beam corresponding to a sample beam;

conveying the reference beam from the acousto-optic tunable filter to a polarizing beam splitter;

conveying a portion of the reference beam into a detector using the polarizing beam splitter;

cutting off conveyance of the reference beam to the polarizing beam splitter using a shutter;

conveying the sample beam from the acousto-optic tunable filter to the polarizing beam splitter;

conveying at least part of the sample beam toward the sample at an angle of approximately 90 degrees relative to the sample; and

conveying a randomly-polarized diffusely-reflected portion of the sample beam to the detector via the polarizing beam splitter.