Radio frequency measuring apparatus

• US 5,483,172 A
• Filed: 06/22/1993
• Issued: 01/09/1996
• Est. Priority Date: 06/22/1992
• Status: Expired due to Fees

• Current Assignee: David J. Radford
• Original Assignee: David J. Radford
• Inventors: Radford, David J.
• Primary Examiner(s): Regan, Maura K.
• Application Number:
  US08/079,801
• Time in Patent Office: 931 Days
• Field of Search: 324/652, 324/663, 324/682, 324/674, 324/675, 324/685, 73/61.43, 73/61.44, 331/65
• US Class Current: 324/693
• CPC Class Codes: G01N 27/221 by investigating the dielectric properties using microwaves G01N22/00; measuring loss factors or dielectric constants per se G01R27/26
• CPC Class Codes: G01N 33/02 Food
• CPC Class Codes: G01R 27/2623 Measuring-systems or electronic circuits G01R27/2635, G01R27/2682 take precedence

Abstract

A device is provided for measuring dielectric constant and conductance of a material such as massecuite, the device including a pair of electrodes which are switchably connected to a tank circuit which includes a variable frequency oscillator operating at radio frequencies, and two reference frequencies are measured with the electrodes disconnected from the oscillator and two measurement frequencies with the electrodes coupled to the oscillator tank circuit, the differences between the reference and measurement frequencies being used to compute the inductance and dielectric constant or composition of the material. The frequency is modified by not more than about 10 MHz and may be achieved either by switchably introducing additional inductance or capacitance into the tank circuit to modify its frequency or by having the electrodes switchable between a pair or oscillators operating at known radio frequencies.

Claims

1. A device for measuring a composition of a material comprising:

a pair of electrodes immersed in the material to be measured which are switchably coupled to the tank circuit of a variable frequency oscillator operating at radio frequencies through means for reducing damping of the tank circuit;

additional capacitance or inductance switchably introduced to modify the frequency of the tank circuit to thereby form two frequencies which are measured with the electrodes connected to the oscillator, whereby errors due to oscillator drift are minimized by intermittently taking a succession of frequency measurements followed by reference frequencies with the electrodes disconnected from the oscillator, a time difference between frequency measurements being of the order of seconds; and

means for computing the differences between the measured and reference frequencies and using these differences to derive at least one signal representative of the composition of the material being measured.

2. Device according to claim 1, wherein a microprocessor is used to switch the additional inductance or capacitance in and out of the oscillator tank circuit, and to switch the electrodes in and out of the tank circuit to produce the two measurement frequencies and the two reference frequencies.

3. Device according to claim 2, wherein the microprocessor is programmed to calculate differences between the measurement and reference frequencies and to compute at least one measurement signal representative of one of the group comprising dielectric constant, electrical resistance, and composition of the material between the electrodes.

4. Device according to claim 1, wherein separate oscillators operating at different frequencies are used as an alternative to switching additional inductance or capacitance into the tank circuit to modify the resonating frequency of the variable frequency oscillator.

5. A device for measuring a composition of a material comprising:

a pair of electrodes immersed in a material to be measured which are switchably coupled to tank circuits of two variable frequency oscillators;

means for reducing damping of the tank circuits;

means for measuring two frequencies with the electrodes connected to the oscillator, errors due to drift of the oscillators being minimized by intermittently taking a succession of frequency measurements followed by reference frequencies with the electrodes disconnected from the oscillator, the time differences between frequency measurements being of the order of seconds;

means for calibrating the device against materials of known compositions; and

means for computing a difference between the measured and reference frequencies to produce at least one signal representative of the composition of the material being measured.

6. Device according to claim 5, further comprising a microprocessor used to switch additional inductance or capacitance in and out of the oscillator tank circuits, and to switch the electrodes in and out of the tank circuit to produce the two measurement and two reference frequencies.