High pass optical filter

• US 5,483,387 A
• Filed: 07/22/1994
• Issued: 01/09/1996
• Est. Priority Date: 07/22/1994
• Status: Expired due to Term

• Current Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Original Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Inventors: Ohnstein, Thomas, Zook, James D., Bauhahn, Paul E.
• Primary Examiner(s): Dzierzynski, Paul M.
• Assistant Examiner(s): Sikder, Mohammad Y.
• Application Number:
  US08/279,762
• Time in Patent Office: 536 Days
• Field of Search: 359/66, 359/82, 359/885, 359/886, 359/887, 359/888, 359/889, 359/890, 359/891, 359/892, 359/326, 359/850, 359/852, 359/578, 359/579, 359/498, 348/342, 348/341, 348/345, 348/357, 348/750
• US Class Current: 359/885
• CPC Class Codes: G02B 5/204 in which spectral selection is performed by means of a conductive grid or array, e.g. frequency selective surfaces for use with wavelengths longer than the infrared light H01Q15/0006

Abstract

A microstructure device having a array of deep lamellar structures resembling parallel plates has sharp high pass cut-off behavior associated with incident TE polarized radiation. When two such microstructures are disposed in an orthogonal orientation, they act like a 2-D array of rectangular waveguides with the cut-off behavior determined by the separation of the respective parallel plates. Another embodiment of the present invention employs a linear drive to articulate the array of coupled parallel plates to tune the filter to the operative incident radiation relatively independent of the angle of incidence. The microstructure finds application placed proximate the focal plane of an array of radiation sensitive material so that very high resolution multispectral images may be generated. When the array is articulated by a linear actuator, a preselected cut-off frequency may be tuned so that multispectral imaging occurs independent of the imaging technology employed, with applications for remote sensing of chemical agents, satellite surveys of agricultural resources, meteorological conditions, or environmental quality. When disposed in a gas absorption cell, opposing an IR source and proximate an IR detector the tunable filter can be used for gas analysis.

Claims

1. An optical filter for altering incident radiation ranging from sub-micron to multi-millimeter wavelengths, comprising:

a base member having a radiation transmission aperture formed therethrough;

an array of deep lamellar structures coupled to the base member and disposed across at least a portion of the radiation transmission aperture

wherein the array of deep lamellar structures further comprise a plurality of substantially identical parallel plate members coupled so that each successive parallel plate member is equidistant from the next successive parallel plate member.

2. The filter of claim 1, wherein the array of deep lamellar structures has a first parallel plate member which is rigidly fixed to the base member and a last parallel plate member which is movably coupled with respect to the base member.

3. The filter of claim 1 wherein each parallel plate member of the array of deep lamellar structures is formed of a highly reflective material.

4. The filter of claim 3 wherein each parallel plate member of the array of deep lamellar structures is formed of a metal.

5. The filter of claim 1 wherein each parallel plate member of the array of deep lamellar structures is coated with a material that is highly reflective to the incident radiation.

6. The filter of claim 5 wherein an upper portion of each parallel plate member exposed to the initial impingement of the incident radiation is tapered uniformly on the opposing lateral faces of each parallel plate member.

7. The filter of claim 6 wherein a lower portion opposite the upper portion of each parallel plate member is tapered uniformly on opposing lateral faces of each plate.

8. The filter of claim 5, further comprising a second array, similar to the first array of deep lamellar structures, disposed proximate the first array of deep lamellar structures and wherein each of the respective parallel plate members of the first array of deep lamellar structures and each of the respective parallel plate members of the second array are oriented orthogonal to each other so that a two-dimensional lattice structure is formed.

9. The filter of claim 8, wherein each successive parallel plate member associated with the second array are spaced apart from each other equally at a different distance than the parallel plate members of the first array of deep lamellar structures are spaced from the next successive plates of the first array of deep lamellar structures.

10. A tunable optical filter for altering incident radiation ranging from sub-micron to multi-millimeter wavelengths, comprising:

a substrate having an aperture for admitting radiation therethrough;

a stationary structure connected to the substrate proximate the aperture;

a filter endpiece member flexibly coupled to at least one portion of the filter array and disposed proximate the aperture and opposing the stationary structure across from the aperture;

a filter array subassembly flexibly coupled between the filter endpiece member and a closure member, wherein the array subassembly further comprises;

a plurality of parallel plate members having a first plate member coupled to the closure member and a last plate coupled to the filter endpiece member;

a plurality of flexures mechanically coupling successive parallel plate members one to the other; and

drive means coupled to the endpiece for controllably driving the filter array subassembly with respect to the stationary structure.

11. An optical filter for altering incident radiation ranging from sub-micron to multi-millimeter wavelengths, comprising:

a base member having a radiation transmission aperture formed therethrough;

an array of deep lameliar structures coupled to the base member and disposed across at least a portion of the radiation transmission aperture, wherein the array of deep lameliar structures further comprises an array of substantially identical parallel plate members coupled together along at least two opposing lateral edges so that each parallel plate member is equidistant from the next successive parallel plate member; and

linear actuator means for controllably articulating the array of deep lameliar structures.

12. The filter of claim 11, wherein a first parallel plate member is fixed to the base member and a last parallel plate member of the array is coupled to the base member.

13. The filter of claim 11 wherein each parallel plate member is formed of a highly reflective material.

14. The filter of claim 13 wherein each parallel plate member is formed of a metal.

15. The filter of claim 11 wherein each parallel plate member is coated with a material that is highly reflective to the incident radiation.

16. The filter of claim 15 wherein an upper portion of each of the parallel plate members nearest a point of initial impingement upon the parallel plate members of the incident radiation is tapered uniformly on the both lateral faces.

17. The filter of claim 16 wherein a lower portion, opposite the upper portion, of each of the parallel plate members is tapered uniformly on both lateral faces of each plate.

18. The filter of claim 15, further comprising a second array of deep lamellar structures, similar to the first array of deep lamellar structures, and disposed proximate the first array, wherein the plates of the first array of deep lameliar structures and the second array of deep lamellar structures are oriented orthogonal to each other.

19. The filter of claim 18, wherein each successive parallel plate member associated with the second array of deep lamellar structures are spaced apart from each other a different distance than the parallel plate members of the first array of the deep lamellar structures are spaced from the next successive parallel plate members of the first array of deep lameliar structures.

20. The filter of claim 15, wherein the linear actuator means is constrained to linear motion by at least one lateral guide spring member connected to the linear actuator at a first end of the guide spring member and coupled to the substrate at a second end of the guide spring member.