Method of manufacturing electronic component and measuring characteristics of same
First Claim
1. A method for manufacturing multilayer electronic components, comprising the steps of:
- preparing a mother laminate, to be cut along at least one cutting line for obtaining a plurality of multilayer electronic components, said mother laminate being formed by stacking a plurality of mother insulating sheets having internal circuit elements located thereon for forming said multilayer electronic components, said internal circuit elements being located in respective regions formed when said mother laminate is divided along said at least one cutting line;
forming a groove in said mother laminate along said at least one cutting line to electrically isolate adjacent electronic components;
applying a plurality of external electrodes on at least one surface of said groove so that said plurality of external electrodes are electrically connected with said internal circuit elements; and
dividing said mother laminate along said at least one groove.
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Accused Products
Abstract
A method of manufacturing a multilayer electronic component having one major surface which can be completely used as a mounting surface for another electronic component to form a composite component includes the steps of forming a groove in the mother laminate along a cutting line, forming external electrodes on side surfaces of the groove and then dividing the mother laminate along the cutting line to divide the groove thereby forming a plurality of multilayer electronic components that are independent of each other. The method of forming the electronic components allows for measuring electrical characteristics of the individual multilayer electronic components while the components are still part of the mother laminate.
55 Citations
8 Claims
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1. A method for manufacturing multilayer electronic components, comprising the steps of:
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preparing a mother laminate, to be cut along at least one cutting line for obtaining a plurality of multilayer electronic components, said mother laminate being formed by stacking a plurality of mother insulating sheets having internal circuit elements located thereon for forming said multilayer electronic components, said internal circuit elements being located in respective regions formed when said mother laminate is divided along said at least one cutting line; forming a groove in said mother laminate along said at least one cutting line to electrically isolate adjacent electronic components; applying a plurality of external electrodes on at least one surface of said groove so that said plurality of external electrodes are electrically connected with said internal circuit elements; and dividing said mother laminate along said at least one groove. - View Dependent Claims (2, 3, 4, 5)
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6. A method for measuring characteristics of multilayer electronic components, comprising the steps of:
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preparing a mother laminate, to be cut along at least one cutting line for obtaining a plurality of multilayer electronic components, said mother laminate being formed by stacking a plurality of mother insulating sheets having internal circuit elements located thereon for forming said multilayer electronic components, said internal circuit elements being located in respective regions formed when said mother laminate is divided along said at least one cutting line; forming a groove in said mother laminate along said at least one cutting line to electrically isolate adjacent electronic components; applying a plurality of external electrodes on at least one surface of said groove to be electrically connected with said internal circuit elements; and measuring electric characteristics of at least one of said multilayer electronic components via said external electrodes while said multilayer electronic components are part of said mother laminate. - View Dependent Claims (7, 8)
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Specification