System for measuring timing relationship between two signals

• US 5,499,190 A
• Filed: 01/15/1993
• Issued: 03/12/1996
• Est. Priority Date: 01/16/1992
• Status: Expired due to Fees

• Current Assignee: Hamamatsu Photonics KK
• Original Assignee: Hamamatsu Photonics KK
• Inventors: Takahashi, Hironori, Aoshima, Shinichiro, Urakami, Tsuneyuki, Hirano, Isuke
• Primary Examiner(s): Cosimano, Edward R.
• Application Number:
  US08/005,091
• Time in Patent Office: 1,152 Days
• Field of Search: 324/621, 324/622, 364/480, 364/481, 364/486, 364/569, 364/579, 371/1
• US Class Current: 702/71
• CPC Class Codes: G01R 13/347 using electro-optic elements
• CPC Class Codes: G01R 31/308 using non-ionising electromagnetic radiation, e.g. optical radiation investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00
• CPC Class Codes: G04F 13/02 using optical means
• CPC Class Codes: H03K 5/26 the characteristic being duration, interval, position, frequency, or sequence

Abstract

A system for measuring timing relationship between two signals for accurately measuring a timing relationship between signals includes an electro-optic measuring unit and a waveform storage and processing unit. The electro-optic measuring unit samples electrical signals from a device under measurement via a strobe light so as to measure the signal waveform. The electro-optic unit uses a laser diode as a light source. The waveform storage and processing unit stores the electrical signal waveforms measured by the electro-optic measuring unit in digital form. The waveform storage and processing unit also calculates a correlation between two stored electrical signal waveforms via a correlation calculation unit, and also detects a peak of the correlation to detect a timing relationship between the signals.

Claims

1. A system for measuring a timing relationship between at least two signals comprising:

first means for measuring waveforms of said at least two signals; and

second means for storing said signals and establishing a reference point for said signals and processing said stored signals to detect a time difference between said signals;

wherein said first means includes an optical system for converting an electrical field of each of said signals to a light signal by light modulation for detecting said signal, and a measuring system for measuring said waveform of each of said signals based upon said electrical field of the signal detected by said first means.

2. A system according to claim 1 wherein said second means stores one of said at least two signals and then said first means measures another signal, and said second means processes the signal waveforms to determine the time difference of the signals.

3. A system according to claim 1 wherein said second means calculates a correlation of the stored signal waveforms and detects the time difference from the correlation.

4. A system according to claim 3 wherein said second means Fourier-Transforms the two stored signal waveforms, Fourier-reverse-transforms a product of a conjugation function of one of the Fourier transformed waveforms with the other to determine the correlation of the signal waveforms.

5. A system according to claim 1 wherein said optical system is a two-channel system.

6. A system according to claim 5 wherein said optical system includes a first probe disposable in a vicinity of a first signal path and having an electro-optical effect, a first light source for supplying a light to said first probe, a first detector for detecting the light light-modulated by said first probe, a second probe disposable in a vicinity of a second signal path and having an electro-optical effect, a second light source for supplying a light to said second probe, and a second detector for detecting the light light-modulated by said second probe.

7. A system according to a claim 5 wherein said optical system includes a probe disposable in a vicinity of first and second signal paths and having an electro-optical effect, a light source for supplying a light to said probe, an optical circuit for directing the light from said light source into vicinity of said first and second paths of said probe, and first and second detectors for detecting the light light-modulated by said probe in the vicinity of each of the first and second signal paths.

8. A system according to claim 1 wherein said optical system includes a probe disposable in a vicinity of a path of the signal and having an electro-optical effect, a light source for supplying a light to said probe, and a detector for detecting the light light-modulated by said probe.

9. A system according to claim 8 wherein the light light-modulated by said probe is reflected by a reflection film formed on a bottom surface of said probe and detected by said detector.

10. A system according to claim 8 wherein said light source is a laser light source having a short pulse laser beam output.

11. A system according to claim 8 wherein said measuring system includes a control circuit for driving said light source to produce a pulsed light beam, and a measuring unit for detecting said waveform by lock-in amplification of output of said detector, based upon drive timing of said control circuit.

12. A system according to claim 11 wherein said measuring system further includes a drive circuit for supplying a driving signal to a circuit under measurement including a signal path, and said control circuit drives said light source with a gradually offset timing as compared to timing of a pulse supplied by said drive circuit.

13. A system according to claim 1, wherein said optical system includes:

probe means having a first probe comprising an electro-optic material having an optical characteristic which is changeable by an electric field of a sample;

a light source for emitting light to said probe means;

detecting means including a first photodetector which detects reflected light from said first probe, said reflected light being modulated by said first probe, said detecting means outputting a first electric signal and a second electric signal,

wherein said second means includes;

a processing unit which stores data based on said first and second electric signals, said processing unit calculating a time difference between said first and second electric signals output from said detecting means by using said data.

14. A system according to claim 13, wherein said first probe includes a reflection film formed on a bottom surface thereof for reflecting light to said detector.

15. A system according to claim 13, wherein said light source is a laser having a short, pulsed output.

16. A system according to claim 13, wherein said probe means further comprises a second probe comprising an electro-optic material having an optical characteristic changeable by an electric field of said sample;

wherein said detecting means further comprises a second photodetector for detecting reflected light modulated by said second probe; and

wherein said first photodetector outputs said first electric signal to said processing unit, and said second photodetector outputs said second electric signal to said processing unit.

17. A system according to claim 13, wherein said detecting means further comprises a second photodetector for detecting reflected light from said first probe;

wherein said first detector outputs said first electric signal to said processing unit; and

wherein said second detector outputs said second electric signal to said processing unit.

18. A system according to claim 13, wherein said processing unit calculates a cross-correlation of said first electric signal and second electric signal to detect the time difference from the cross-correlation.

19. A system according to claim 13, further comprising:

a drive circuit for supplying a signal to said sample;

a control circuit for driving said light source to produce pulsed light, said control circuit being connected to said light source and said drive circuit; and

a measuring unit for detecting a first waveform of said first electric signal and a second waveform of said second electric signal by lock-in amplification of the output of said detecting means, wherein said processing unit calculates a cross-correlation of said first waveform and said second waveform by using the stored data and detects the time difference from the cross-correlation.

20. A system according to claim 13, further comprising:

a drive circuit for supplying a signal to said sample;

a control circuit for driving said light source to produce pulsed light, said control circuit being connected to said light source and said drive circuit; and

a measuring unit for detecting a first waveform of said first electric signal and a second waveform of said second electric signal by lock-in amplification of the output of said detecting means, wherein said processing unit Fourier-transforms said first and second waveforms, wherein said processing unit Fourier-reverse-transforms a product of a conjugation function of the Fourier-transformed first waveform and the Fourier-transformed second waveform to determine a cross-correlation of the first and second waveforms, and wherein said processing unit detects the time difference from the cross-correlation.

21. A system according to claim 13, further comprising:

a drive circuit for supplying a signal to said sample;

a control circuit for driving said light source to produce pulsed light, said control circuit being connected to said light source and said drive circuit; and

a measuring unit for detecting a first waveform of said first electric signal and a second waveform of said second electric signal by lock-in amplification of the output of said detecting means, wherein said processing unit calculates a cross-correlation of said first waveform and said second waveform by using the stored data to detect the time difference from the cross-correlation, wherein said calculation of the cross-correlation conforms to the following condition,

I=F^-1 {F(w)^* x G(w)}, where

t is time;

I is a function of the correlation;

f(t) represents a function of the first waveform;

g(t) represents a function of the second waveform;

F(w) is a Fourier transform of f(t);

G(w) is a Fourier transform of g(t);

F^-1 shows a Fourier reverse transform; and

F(w)^* is a function of a complex conjugate variable in F(w).

22. A system according to claim 13, wherein said processing unit stores said first electric signal before said first photodetector outputs said second electric signal to said processing unit.

23. A system according to claim 13, wherein said processing unit modifies said first and second electric signals by filtering the first and second electric signals.

24. A system according to claim 13, further comprising:

a control circuit for driving said light source to produce pulsed light; and

a measuring unit for detecting waveforms of said first and second electric signals by lock-in amplification of the outputs of said detecting means.

25. A system according to claim 24, further comprising a drive circuit for supplying a drive signal to said sample, wherein said control circuit drives said light source with a timing gradually offset compared to timing of the drive signal supplied by said drive circuit.

26. A system for measuring a timing relationship between at least two signals comprising:

first means for measuring waveforms of said at least two signals; and

second means for storing said signals and establishing a reference point for said signals and processing said stored signals to detect a time difference between said signals;

wherein said first means includes a pulse signal source for supplying pulse signals to pins of an IC under measurement, a plurality of channels for receiving said at least two signals with a number of said channels corresponding to the pins connected to said pulse signal source, means for measuring said at least two signals, and means for adjusting timing of the pulses supplied from said pulse signal source to said pins in accordance with the time difference detected by said second means.