Interferometric system for the detection and location of reflecting faults of light-guiding structures

• US 5,500,733 A
• Filed: 07/25/1994
• Issued: 03/19/1996
• Est. Priority Date: 07/27/1992
• Status: Expired due to Fees

• Current Assignee: Orange S.A.
• Original Assignee: Orange S.A.
• Inventors: Boisrobert, Christian, Dontenwille, Michel, Lucas, Jean-Francois
• Primary Examiner(s): Turner, Samuel A.
• Application Number:
  US08/211,220
• Time in Patent Office: 603 Days
• Field of Search: 356/345, 356/357, 356/73.1, 359/34, 385/12, 385/13, 250/227.14, 250/227.15, 250/227.27, 250/227.19
• US Class Current: 356/479
• CPC Class Codes: G01M 11/3172 Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Abstract

An interferometric system for sensing and locating reflective defects in light-conducting structures comprises a mono-mode laser source (6), an incoherent source (4) with substantially the same central wavelength as the laser source, first and second couplers (10, 20) connected to the sources and to light sensors (52, 54), a first support (36) movable in one direction (D) and connected to the ends of the first and second couplers, a second support (38) oscillating in the same direction (D), reflectors (42, 43) attached to the second support opposite the ends of the first and second couplers. A third support support (40) is movable in the same direction (D) and connected to one end of the second coupler (20), a further stationary reflector (48) opposite said end, of the second coupler. The first coupler is connected to an optical waveguide (2), and devices (56, 58) for locating reflective defects in the waveguide.

Claims

1. Interferometric system for the detection and location of reflecting faults of a light guiding structure (2), said system comprising:

an incoherent light source (4),

a monomode laser source (6), whose wavelength is substantially equal to a central wavelength of the incoherent source,

first (10) and second (20) optical couplers, each of said first and second couplers (10,

     20) having first and second branches, said first branches (11,

     21) being optically coupled to the incoherent light source and to the laser source,

a first support (36) displaceable in translation in a given direction and to which are fixed ends of the second branches (12,

     22) of the first and second couplers,

a second support (38) adapted to oscillate in said given direction,

first (42) and second (43) light reflectors fixed to the second support (38) and respectively placed facing the ends of the second branches (12,

     22) of the first and second couplers in order to reflect the light passing out of the same,

a third support (40) displaceable in translation in the given direction and to which is fixed an end of a third branch (23) of the second coupler (20),

a third light reflector (48) fixed and positioned facing said end of the third branch (23) of the second coupler (20) in order to reflect the light passing out of the end of the third branch of the second coupler, a third branch (13) of the first coupler (10) being optically coupled to the guiding structure (2),

first (52) and second (54) photodetectors respectively optically coupled to fourth branches (14,

     24) of the first (10) and second (20) couplers,

an interference fringe counter (56) having an input which receives signals from the second photodetector (54) and

means (58) for analyzing signals supplied by the first and second photodetectors (52,

     54), said analyzing means serving to locate reflecting faults of the guiding structure (2), with the aid of appropriate displacements of the first, second and third supports and the counter.

2. An interferometric system according to claim 1, further comprising a third optical coupler (30), whose first (31) and second (32) branches are respectively optically coupled to the incoherent source (4) and to the laser source (6) and whose third (33) and fourth (34) branches are respectively optically coupled to the first branches (11, 21) of the first (10) and second (20) couplers.

3. An interferometric system according to claim 1, wherein the analysis means comprise a two-channel oscilloscope (58) respectively receiving the signals supplied by the first (52) and second (54) photodetectors, said oscilloscope displaying the interferograms corresponding to the signals.

4. An interferometric system according to claim 1,k further comprising piezoelectric means (39) able to oscillate the second support (38) in the given direction.

5. An interferometric system according to claim 4, further comprising means (66, 68, 70, 72, 78, 80, 84, 86) for regulating the displacement speed of the second support (38), said regulating means imposing a constant displacement speed on the second support.

6. An interferometric system according to claim 5, wherein the regulating means comprise a Michelson interferometer having a light source (66), whose coherence length is greater than an amplitude of displacement of the second support (38), two arms respectively terminated by two light reflectors (70, 72), whereof one of said two light reflectors (72) is rendered rigidly integral with the second support (38) and a third photodetector (68), as well as means (78, 80, 84, 86) for controlling the piezoelectric means (39) as a function of the signals supplied by said third photodetector (68), said control means imposing a constant displacement speed on the second support via the piezoelectric means.