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Self-diagnostic flame rectification sensing circuit and method therefor

  • US 5,506,569 A
  • Filed: 05/31/1994
  • Issued: 04/09/1996
  • Est. Priority Date: 05/31/1994
  • Status: Expired due to Fees
First Claim
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1. Flame detection apparatus for use in a furnace comprising:

  • a microprocessor having input ports and output ports,an AC voltage power source and a 5 volt DC power supply,a flameprobe having an input lead, a first capacitor having first and second terminals, the first terminal connected to the AC voltage power source, a first resistor having first and second ends, the first end serially connected to the second terminal of the first capacitor, the input lead of the flameprobe connected to a location intermediate the first capacitor and the first end of the first resistor, the second end of the first resistor connected to an input port of the microprocessor through a change of state device having an input and an output, the change of state device changing between first and second states in response to the input of the change of state device, a second capacitor having first and second terminals, the first terminal of the second capacitor connected between the second end of the first resistor and the input of the change of state device, the second terminal of the second capacitor connected to ground, a first charge path for the second capacitor comprising the 5 volt DC power supply connected to a first end of a second resistor having first and second ends, the second end of the second resistor connected to a point between the second end of the first resistor and the input of the change of state device and a second charge path for the second capacitor connected between an output port of the microprocessor and the input of the change of state device, the first charge path being used, in conjunction with the first resistor and the flameprobe, to provide an input to the change of state device controlling the output of the change of state device thereby providing a signal to the microprocessor representative of the presence or absence of a flame, and the second charge path being used during a test procedure initiated by the microprocessor through the second charge path to determine leakage characteristics of the change of state device and the second capacitor.

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