X-ray inspection system and method

• US 5,506,880 A
• Filed: 12/16/1994
• Issued: 04/09/1996
• Est. Priority Date: 12/16/1994
• Status: Expired due to Fees

• Current Assignee: Autoliv ASP Incorporated (Autoliv Incorporated)
• Original Assignee: Morton International Incorporated (Autoliv Incorporated)
• Inventors: Scardino, Paul G., Beaumont, Ringo C.
• Primary Examiner(s): Porta, David P.
• Assistant Examiner(s): Bruce, David Vernon
• Application Number:
  US08/357,716
• Time in Patent Office: 480 Days
• Field of Search: 378/98, 378/98.2, 378/98.3, 378/62, 378/99, 378/18, 378/207, 364/413.13, 364/413.23
• US Class Current: 378/98.2
• CPC Class Codes: H04N 5/32 Transforming X-rays cameras or camera modules for generating image signals from X-rays H04N23/30; circuitry of SSIS for transforming X-rays into image signals H04N25/30
• CPC Class Codes: H05G 1/26 Measuring, controlling or protecting measuring X-ray radiation G01T
• CPC Class Codes: H05G 1/60 Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography

Abstract

An x-ray system and method capable of producing very accurate RTR images corrected for x-ray system inhomogeneities. A three-dimensional correction memory is used to store deviation information relating to system inhomogeneities. The three-dimensional correction memory is indexed by x and y coordinates of the image plane and an attenuation coordinate associated with a plurality of standard samples. The standard samples are exposed in turn, and deviations between the measured attenuation and the nominal attenuation are noted and stored at the x and y coordinates in the attenuation plane for the sample then exposed. The procedure is repeated for a plurality of samples to create a three-dimensional correction array. An object to be imaged creates a set of raw intensity information. The raw information is corrected by accessing the correction memory at the x and y coordinates of each pixel to be corrected and the attenuation coordinate associated with the raw measurement. The deviation information is applied to the raw measurement to produce and store a corrected attenuation factor for each pixel.

Claims

1. A method of producing digital images corrected for x-ray system inhomogeneities, the digital images being representative of the x-ray attenuation of objects to be inspected, the method comprising the steps of:

(a) calibrating for x-ray system inhomogeneities by;

(i) positioning a calibration sample of substantially uniform attenuation coefficient at the image plane;

(ii) operating the detector measure a field of attenuation information for the calibration sample;

(iii) producing a two-dimensional array of attenuation information for the sample wherein the two dimensions are the x and y coordinates of the image plane, and the information stored for each coordinate relates to any deviation between the measured attenuation coefficient and the uniform attenuation coefficient of the sample;

(iv) performing the steps (ii) and (iii) for a plurality of calibration

samples to produce a three-dimensional correction array in which the coordinates are the x and y coordinates of the image plane and the uniform attenuation coefficients of the calibration samples;

(b) positioning an object to be inspected in the image plane and exposing it to x-rays to collect a raw set of attenuation coefficients for the object;

(c) correcting the raw set of attenuation coefficients on a pixel-by-pixel basis by;

(i) obtaining for each pixel a correction value by addressing the three-dimensional correction array at the x and y coordinates of the pixel and the attenuation coefficient coordinate of the raw coefficient to derive a correction factor; and

(ii) applying the correction factor to the raw attenuation coefficient to produce and store a corrected attenuation coefficient.

2. The method as set forth in claim 1 wherein the step of addressing the three-dimensional correction array addresses the array at two planes defined by the uniform attenuation coefficients which bracket the raw attenuation coefficient for the pixel, and further performing the step of interpolating between the correction factors derived from the two planes.

3. The method as set forth in claim 2 wherein the three-dimensional array is configured to store samples for super pixels comprising a subarray of pixels from the image plane, the correction factor for the super pixel being applied to all of the image plane pixels comprising the super pixel.

4. A method of producing digital images corrected for x-ray system inhomogeneities, the digital images being representative of the x-ray attenuation of objects to be inspected, the method comprising the steps of:

(a) adjusting the relative positions of an x-ray source and a planar x-ray detector with respect to an image plane such that the center of the x-ray source is centered on the detector and passes through approximately the center of the image plane;

(b) collimating and adjusting the x-ray beam such that the energy level of all x-ray energy falling on the sensor in the absence of an object in the image plane is within 10% of the energy at the center of the x-ray source;

(c) adjusting the parameters of the x-ray source to suit the requirements of the objects to be inspected;

(d) calibrating for x-ray system inhomogeneities by;

(i) positioning a calibration sample of substantially uniform attenuation coefficient at the image plane;

(ii) operating the detector to measure a field of attenuation information for the calibration sample;

(iii) producing a two-dimensional array of attenuation information for the sample wherein the two dimensions are the x and y coordinates of the image plane, and the information stored for each coordinate relates to any deviation between the measured attenuation coefficient and the uniform attenuation coefficient of the sample;

(iv) performing the steps (ii) and (iii) for a plurality of calibration samples to produce a three-dimensional correction array in which the coordinates are the x and y coordinates of the image plane and the uniform attenuation coefficients of the calibration samples;

(e) positioning an object to be inspected in the image plane and exposing it to x-rays to collect a raw set of attenuation coefficients for the object;

(f) correcting the raw set of attenuation coefficients on a pixel-by-pixel basis by;

(i) obtaining for each pixel a correction value by addressing the three-dimensional correction array at the x and y coordinates of the pixel and the attenuation coefficient coordinate of the raw coefficient to derive a correction factor; and

(ii) applying the correction factor to the raw attenuation coefficient to produce and store a corrected attenuation coefficient.

5. The method as set forth in claim 4 wherein the step of addressing the three-dimensional correction array addresses the array at two planes defined by the uniform attenuation coefficients which bracket the measured attenuation coefficient for the pixel, and further performing the step of interpolating between the correction factors derived from the two planes.

6. The method as set forth in claim 5 wherein the three-dimensional array is configured to store samples for super pixels comprising a subarray of pixels from the image plane, the correction factor for the super pixel being applied to all of the image plane pixels comprising the super pixel.

7. The method as set forth in claim 4 wherein the x-ray source is maintained energized during the calibrating steps and subsequent inspection of objects.

8. The method as set forth in claim 4 in which the calibrating steps comprise performing the calibration with about 10 calibration samples which span a range of gray scales related to attenuation coefficients having a range of about 250 gray scale units.

9. The method as set forth in claim 4 in which the step of adjusting the relative positions of the x-ray source and sensor comprises aligning the source and sensor such that the center frequency of the x-ray source is coincident with the central region of peak illuminance of the detector.

10. The method as set forth in claim 9 in which each plane of the three-dimensional correction array has a center pixel associated with the central region of peak illuminance of the detector, the attenuation information stored in the three-dimensional array comprises deviations of the raw measurements from the uniform attenuation coefficients of the samples, and the center pixel of each plane is adjusted to have a zero deviation.

11. The method as set forth in claim 4 in which the step of adjusting the parameters of the x-ray source establishes levels of contrast discrimination, sensitivity and resolution required by the objects to be inspected.

12. A radiographic system for inspecting objects and for producing digital RTR images of said objects corrected for x-ray system inhomogeneities, the system comprising in combination:

an x-ray source for exposing an image plane and a quasi-planar x-ray detector for detecting x-rays from the source passing through the image plane, the source and detector having random inhomogeneities which produce attenuation errors in the x-ray intensity readings;

an image processor responsive to the x-ray detector for storing an RTR image of an object, the RTR image comprising digital representations of the x-ray attenuation of the object on a pixel-by-pixel basis;

a three-dimensional correction memory having x and y coordinates corresponding to the pixels of the image and an attenuation coordinate related to the different values of attenuation to be measured by the system;

the system having a calibration mode in which the three-dimensional correction memory is loaded with correction information generated from a plurality of sample attenuators of respective nominal attenuation values sequentially exposed during the calibration procedure, the correction memory containing locations for information relating to deviation between measured and nominal attenuation factors caused by x-ray system inhomogeneities;

the system having an inspection mode for making of a RTR image from a sample, the image processor in the inspection mode being adapted to obtain a set of raw measurements taken from the object, and for each pixel thereof being further adapted to access the three-dimensional correction memory at each set of pixel coordinates in conjunction with the attenuation coordinate corresponding to the raw measurement at said pixel to produce a correction factor and apply it to the raw measurement to produce and store a corrected attention measurement for each said pixel.

13. A system for x-ray inspection of objects for producing RTR images corrected for x-ray system inhomogeneities, the system comprising, in combination:

an x-ray source for exposing an image plane and a quasi-planar x-ray detector for detecting x-rays from the source passing through the image plane, the source and detector having random inhomogeneities which produce attenuation errors in the x-ray intensity readings;

an image memory for collecting and storing attenuation information from the detector for each pixel of the image plane relating to the x-ray intensity information passed through an unknown sample positioned in the image plane, the information relating to the intensity of the radiation measured at each x and y coordinate of an object in the image plane;

a three-dimensional correction memory storing correction information relating to the system inhomogeneities and indexed by the x and y coordinates of the image plane and intensity coordinates relating to a plurality of "standard" attenuation samples of respective varying density representative of samples to be imaged;

means for accessing the correction memory to derive a correction value for the pixels of the image memory, the means for accessing serving to access the correction memory at the x and y coordinates of the image pixel to be corrected and the intensity coordinate approximating the raw intensity information for that pixel; and

means for applying the correction value derived from the correction memory to the raw measurement for the pixel in question to produce and store correct attenuation information for all image pixels.

14. The combination as set forth in claim 13 in which the means for accessing the correction memory accesses said memory at the x and y coordinates of the pixel to be corrected and two intensity coordinates bracketing the raw intensity information for the pixel being corrected, and means for linearly interpolating between the correction values read from the correction memory.

15. The combination as set forth in claim 13 in which the three-dimensional correction memory stores correction information for super pixels comprising a subarray of image plane pixels, the correction information stored for each super pixel being applicable to all of the subpixels of the image plane associated with said super pixel.

16. The combination as set forth in claim 13 in which the x-ray sensor is an image intensifier having a quasi-planar surface adapted to receive x-rays, and a CCD camera associated with the image intensifier for measuring the intensity information.

17. The combination as set forth in claim 13 in which the x-ray source and x-ray detector are associated with means for relative alignment thereof to cause the central frequency ray of the x-ray source to impinge upon approximately the center of the x-ray detector.

18. The combination as set forth in claim 17 in which the three-dimensional correction memory has a central pixel for each plane indexed by the central x and y coordinates, the three-dimensional correction memory storing deviation information between a measured attenuation value for a standard sample and the standard attenuation value associated with that sample, the central pixel of the three-dimensional array being adjusted to store zero deviation information.