Monolithic micromechanical vibrating string accelerometer with trimmable resonant frequency

• US 5,507,911 A
• Filed: 04/14/1995
• Issued: 04/16/1996
• Est. Priority Date: 10/17/1990
• Status: Expired due to Term

• Current Assignee: Charles Stark Draper Laboratory Incorporated
• Original Assignee: Charles Stark Draper Laboratory Incorporated
• Inventors: Greiff, Paul
• Primary Examiner(s): POWELL, WILLIAM A
• Application Number:
  US08/422,432
• Time in Patent Office: 368 Days
• Field of Search: 156/628.1, 156/647.1, 156/651.1, 156/657.1, 156/659.11, 156/662.1, 437/228, 437/238, 437/225, 216/2, 216/55, 216/62, 216/87, 73/517 R, 73/517 AV
• US Class Current: 73/514.23
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/097 by vibratory elements
• CPC Class Codes: G01P 2015/0814 for translational movement of the mass, e.g. shuttle type
• CPC Class Codes: G01P 2015/0831 the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration
• CPC Class Codes: Y10S 438/978 forming tapered edges on substrate or adjacent layers

Abstract

A monolithic, micromechanical vibrating string accelerometer with a trimmable resonant frequency is fabricated from a silicon substrate which has been selectively etched to provide a resonant structure suspended over an etched pit. The resonant structure comprises an acceleration sensitive mass and at least two flexible elements having resonant frequencies. Each of the flexible elements is disposed generally colinear with at least one acceleration sensitive axis of the accelerometer. One end of at least one of the flexible elements is attached to a tension relief beam for providing stress relief of tensile forces created during the fabrication process. Mass support, beams having a high aspect ratio support the mass over the etched pit while allowing the mass to move freely in the direction colinear with the flexible elements. Also disclosed is a method for fabricating such an accelerometer with high aspect ratio tension relief and mass support beams.

Claims

1. A method for fabricating a monolithic micromechanical vibrating accelerometer with a trimmable resonant frequency, comprising the steps of:

providing a single silicon substrate having an oxidized layer generally covering said substrate;

removing selected regions of said oxidized layer;

etching said silicon substrate with an anisotropic etchant, said etching forming a pit having sidewalls and a bottom;

selectively doping the sidewalls and bottom of said pit in said silicon substrate through the regions of selectively removed oxidized layer, to form etch resistant regions in said silicon substrate; and

etching said silicon substrate with an anisotropic etchant, said etching forming at least one non-etched silicon resonant structure selected from the group consisting of;

an acceleration sensitive mass having a center of gravity;

at least first and second flexible elements generally equally suspending said mass above an etched pit and generally co-planar with a surface of said mass;

first and second tension relief beams attached to said first and second flexible elements; and

first and second mass support beams.

2. The method of claim 1 further including between the step of selectively doping and etching, the steps of:

growing silicon crystal material in regions which have had their oxidized layer removed and have been selectively doped; and

capping said regions with an etch resistant layer to form an etch resistant mass.

3. The method of claim 2 wherein said etch resistant layer includes an oxidized layer.

4. The method of claim 2 wherein said etch resistant layer includes a doped layer.

5. The method of claim 1 further including after the step of etching said silicon substrate, the step of plating said acceleration sensitive mass to bring the center of gravity of said mass to the surface of said mass which is co-planar with said flexible elements.

6. A method of fabricating a micromechanical vibrating string accelerometer with a trimmable resonant frequency, comprising the steps of:

providing a single crystal silicon substrate;

selectively masking and doping surface portions of said substrate in the shape of electrodes;

growing an epitaxial spacer layer over said surface portions of said substrate;

selectively masking and doping surface portions of said epitaxial layer to form structure selected from the group consisting of;

an acceleration sensitive mass;

resonant flexures;

mass support beams; and

trimmable strain relief beams; and

oxidizing said surface portions of said epitaxial layer to form an oxidized layer;

patterning an etch window in said oxidized layer by selectively etching portions of the oxide; and

etching said silicon substrate inside the etch window with an anisotropic etchant to form said accelerometer suspended over a pit in said substrate and said electrodes.

7. The method of claim 6 further comprising the steps of:

anisotropically etching said pit in the silicon substrate;

doping bottom and sidewall portions of said pit to render said doped bottom and sidewall portions etch resistant;

filling said pit with silicon by selective epitaxial deposition; and

doping a top portion of said pit to form an etch resistant mass, wherein said etch resistant mass is used for increasing the inertial mass of said accelerometer.

8. The method of claim 6 further comprising the steps of:

reactive ion etching a slit in said epitaxial layer;

doping the inner surface portions of said slit to render said inner surface portions etch resistant;

selectively filling said slit with silicon; and

doping a top portion of said filled slit to create a beam having a high aspect ratio, wherein said beam provides strain relief mass support beams.

9. The method of claim 7 wherein said selective masking and doping of surface portions of said epitaxial layer form resonant flexures and wherein said method further comprises the step of electroplating a mass opposite said etch resistant mass, said electroplated mass moving the center of gravity or the center of inertia of said accelerometer to the center of a plane containing said resonant flexures.

10. The method of claim 6 same as wherein said selective masking and doping of surface portions of said epitaxial layer forms resonant flexures and wherein said method further the step of forming at least one electroplated bridge structure over said resonant flexures to provide additional electrodes for exciting or sensing motion of said flexures.

11. The method of claim 6 further comprising the steps of depositing a layer of silicon nitride over said surface portions of said substrate and said doped surface portions of said epitaxial layer and patterning said silicon nitride layer;

and

anisotropically etching said silicon nitride layer to form a dielectric lap joint mechanically connecting but electrically isolating regions of said accelerometer.

12. A micromechanical device with a trimmable resonant frequency for detecting acceleration along an acceleration sensitive axis comprising:

a silicon resonant structure suspended over a silicon substrate and comprising an acceleration sensitive mass and at least two flexible elements having a resonant frequency, said at least two flexible elements substantially equally suspending said acceleration sensitive mass, wherein each of said flexible elements is disposed substantially colinear with respect to said acceleration sensitive axis and has first and second ends, with a first one of said flexible elements having its first end attached to a first side of said mass and a second one of said flexible elements having its first end attached to a second side of said mass opposite said first side; and

an opening formed in the second end of at least one of said flexible elements and having a length and width, said opening including an edge located a distance from said at least one flexible element, wherein said distance defines a first tension relief beam flexible in a direction parallel to said acceleration sensitive axis, for deflecting a first distance under longitudinal tension and for providing stress relief of longitudinal tensile forces between said flexible elements and said tension relief beam, thereby establishing a trimmable resonant frequency for said flexible elements.