Infrared-to-visible converter

• US 5,510,627 A
• Filed: 06/29/1994
• Issued: 04/23/1996
• Est. Priority Date: 06/29/1994
• Status: Expired due to Fees

• Current Assignee: United States of America Represented By Secretary of The Navy Chief of Naval Research Office of
• Original Assignee: the united states of america as represented by the secretary of the navy
• Inventors: Snow, Eric S.
• Primary Examiner(s): Jackson, Jr., Jerome
• Application Number:
  US08/267,697
• Time in Patent Office: 664 Days
• Field of Search: 257/21, 257/189, 257/85
• US Class Current: 257/21
• CPC Class Codes: G02F 2/02 Frequency-changing of light, e.g. by quantum counters
• CPC Class Codes: H01L 31/0352 characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions

Abstract

A quantum well infrared photodetector comprises multiple quantum well detectors formed within a single P-N structure forward-biased by an external voltage source, for directly converting infrared radiation having a wavelength in the range of approximately 4-15 μm into visible radiation or near infrared radiation. Multiple quantum well detectors disposed between the P-N contact layers are comprised of alternating gallium arsenide (GaAs) quantum well layers, aluminum gallium arsenide (AlGaAs) barrier layers and alternatively, a blocking layer of aluminum arsenide (AlAs) positioned between a last aluminum gallium arsenide (AlGaAs) barrier layer and the N contact layer; and are forward-biased by the external voltage source in order to produce band-gap luminescence by radiative recombination of excess carriers representative of electrons and holes in the N contact layer when the P contact layer is illuminated with optical energy of incident infrared radiation.

Claims

1. A device for converting a first light radiation into a second light radiations, comprising:

(a) a first contact region doped with first type impurities;

(b) a second contact region disposed on said first contact region, said second contact region being doped with second type impurities opposite to said first type impurities, said first contact region and said second contact region forming a P-N junction;

(c) a quantum well structure comprising a plurality of alternating quantum well layers and barrier layers formed between said first contact region and said second contact region within said P-N junction, both said quantum well layers and said barrier layers being heavily doped with said first type impurities;

(d) a blocking layer disposed between a last barrier layer and said second contact region, said blocking layer being an aluminum arsenide block layer formed to prevent holes from the second contact region from drifting into said quantum well structure; and

(e) a voltage source electrically connected to said first and second contact regions, for forward biasing said P-N junction to enable said device to emit said second light radiation by radiative recombination of excess carriers representative of electrons and holes in said second contact region, when said first contact region is illuminated with said first light radiation.

2. The device as claimed in claim 1, further comprised of said aluminum arsenide block layer having a thickness within the range of 100-1000Å

.

3. The device as claimed in claim 2, further comprised of said aluminum arsenide block layer having a thickness about 300Å

.

4. A device for converting a first light radiation into a second light radiation, comprising:

(a) a first contact region doped with first type impurities;

(b) a second contact region disposed on said first contact region, said second contact region being doped with second type impurities opposite to said type impurities, said first contact region and said second contact region forming a P-N junction;

(c) a quantum well structure comprising a plurality of alternating quantum well layers and barrier layers formed between said first contact region and said second contact region within said P-N junction, both quantum well layers and said barrier layers being heavily doped with said first type impurities, said quantum well structure comprising approximately 50-100 alternating quantum well layers and barrier layers, said quantum well layers being formed by gallium arsenide having a thickness in the range of 10-500 Angstroms and said barrier layers being formed by aluminum gallium arsenide having a thickness in the range of 50-500 Angstroms;

(d) a blocking layer disposed between a last barrier layer and said second contact region; and

(e) a voltage source electrically connected to said first and second contact regions, for forward biasing said P-N junction to enable said device to emit said second light radiation by radiative recombination of excess carriers representative of electrons and holes in said second contact region, when said first contact region is illuminated with said first light radiation.

5. The device for converting a first light radiation into a second light radiation, comprising:

(a) a first contact region doped with first type impurities;

(b) a second contact region disposed on said first contact region, said second contact region being doped with second type impurities opposite to said type impurities, said first contact region and said second contact region forming a P-N junction;

(c) a quantum well structure comprising a plurality of alternating quantum well layers and barrier layers formed between said first contact region and said second contact region within said P-N junction, both quantum well layers and said barrier layers being heavily doped with said first type impurities, said quantum well structure comprising approximately 50-100 alternating quantum well layers and barrier layers, said quantum well layers being formed by gallium arsenide having a thickness in the range of 20-300 Angstroms and said barrier layers being formed by aluminum gallium arsenide having a thickness in the

(d) a blocking layer disposed between a last barrier layer and said second contact region; and

(e) a voltage source electrically connected to said first and second contact regions, for forward biasing said P-N junction to enable said device to emit said second light radiation by radiative recombination of excess carriers representative of electrons and holes in said second contact region, when said first contact region is illuminated with said first light radiation.

6. A device for converting infrared radiation-into-visible radiation, comprising:

a first contact region doped with n-type impurities;

a second contact region disposed on said first contact region, said second contact region being doped with p-type impurities, said first contact region and said second contact region forming a P-N junction;

a multiple quantum well structure comprising a plurality of alternating gallium arsenide quantum well layers and aluminum gallium arsenide barrier layers formed between said first contact region and said second contact region within said P-N junction, both said gallium arsenide quantum well layers and said aluminum gallium arsenide barrier layers being doped with said n-type impurities and forming a double heterojunction structure;

an aluminum arsenide block layer disposed between a last aluminum gallium arsenide barrier layer and said second contact region; and

means for forward biasing said P-N junction to enable said device to emit visible radiation by radiative recombination of excess carriers representative of electrons and holes in said second contact region, when said first contact region is illuminated with infrared radiation.

7. The device as claimed in claim 6, wherein said multiple quantum well structure comprises a center region having a wider band-gap than the adjacent first and second contact regions of said P-N junction.

8. The device as claimed in claim 6, wherein said aluminum arsenide layer is formed to prevent holes from the second contact region from drifting into the multiple quantum well structure.

9. The device as claimed in claim 6, further comprised of said multiple quantum well structure comprising approximately 50-100 alternating gallium arsenide quantum well layers and aluminum gallium arsenide barrier layers.

10. The device as claimed in claim 6 wherein each of said aluminum gallium arsenide barrier layers has a thickness in the range of 50-500 Angstroms, and each of said gallium arsenide well layers has a thickness in the range of 10-500 Angstroms.

11. The device as claimed in claim 6, further comprised of each of said aluminum gallium arsenide barrier layers having a thickness in the range of 200-300 Angstroms, and each of said gallium arsenide well layers having a thickness in the range of 20-300 Angstroms.

12. The device as claimed in claim 6, wherein each of said N-type and P-type contact layers each has a thickness in the range of 0.05-1 μ

m, and both are positioned to accept a bias potential within the range of 1.5-10 Volts from said voltage source.

13. A converter for converting infrared radiation into near infrared radiation, comprising:

a substrate;

a first contact region disposed on said substrate, said first contact region being formed by gallium arsenide materials and doped with n-type impurities;

a second contact region formed by said gallium arsenide materials and doped with p-type impurities, said first contact region and said second contact region forming a P-N junction;

a multiple quantum well structure comprising a plurality of alternating gallium arsenide quantum well layers and aluminum gallium arsenide barrier layers formed between said first contact region and said second contact region, said gallium arsenide quantum well layers and said aluminum gallium arsenide barrier layers being heavily doped with said n-type impurities, for responding to an infrared radiation of a first wavelength, said aluminum gallium arsenide barrier layers having a thickness in the range of 50-500 Angstroms and each of said gallium arsenide well layers having a thickness in the range of 10-500 Angstroms; and

means for forward biasing said P-N junction to enable said converter to emit near infrared radiation of a second wavelength different form said first wavelength by radiative recombination of excess carriers representative of electrons and holes in the second contact region, when said first contact region is illuminated with said infrared radiation of said first wavelength.

14. A converter for converting infrared radiation into near infrared radiation, comprising:

a substrate;

a first contact region disposed on said substrate, said first contact region being formed by gallium arsenide materials and doped with n-type impurities;

a second contact region formed by said gallium arsenide materials and doped with p-type impurities, said first contact region and said second contact region forming a P-N junction;

a multiple quantum well structure comprising a plurality of alternating gallium arsenide quantum well layers and aluminum gallium arsenide barrier layers formed between said first contact region and said second contact region, said gallium arsenide quantum well layers and said aluminum gallium arsenide barrier layers being heavily doped with said n-type impurities, for responding to an infrared radiation of a first wavelength, said aluminum gallium arsenide barrier layers having a thickness in the range of 200-300 Angstroms and each of said gallium arsenide well layers having a thickness in the range of 20-300 Angstroms; and

means for forward biasing said P-N junction to enable said converter to emit near infrared radiation of a second wavelength different form said first wavelength by radiative recombination of excess carriers representative of electrons and holes in the second contact region, when said first contact region is illuminated with said infrared radiation of said first wavelength.