Low noise and narrow linewidth external cavity semiconductor laser for coherent frequency and time domain reflectometry

• US 5,511,086 A
• Filed: 03/22/1995
• Issued: 04/23/1996
• Est. Priority Date: 03/22/1995
• Status: Expired due to Fees

• Current Assignee: Texas A&M University System
• Original Assignee: Texas A&M University System
• Inventors: Su, Chin B.
• Primary Examiner(s): Scott, Jr., Leon
• Application Number:
  US08/408,739
• Time in Patent Office: 398 Days
• Field of Search: 372/98, 372/92, 372/102, 372/26, 372/31, 372/32, 372/20, 372/19, 372/96, 372/28, 372/94
• US Class Current: 372/31
• CPC Class Codes: H01S 5/0687 Stabilising the frequency of the laser
• CPC Class Codes: H01S 5/141 using a wavelength selective device, e.g. a grating or etalon H01S5/146 takes precedence

Abstract

A semiconductor laser (10) having an external cavity used for coherent frequency and time domain reflectometry is provided. The laser (10) provides a very stable single longitudinal mode characteristic, a very narrow lasing linewidth, and a very low noise optical output. The laser (10) includes a semiconductor optical amplifier (14) emitting a coherent light beam from one facet, a phase modulator (22) receiving the coherent light beam and linearly varying an optical frequency of the laser, and an etalon (32) selecting and stabilizing one longitudinal mode of the laser cavity for lasing, narrowing the linewidth and reducing the noise. A computer-controlled and piezoelectric actuated wavelength-selective grating (58) varies the length of the laser cavity and thereby tuning the optical frequency of the selected longitudinal mode to track the transmission frequency of the etalon by maintaining maximum power intensity thereby stabilizing the selected mode. A selected portion of the coherent light beam is directed back to the semiconductor optical amplifier (14) and further amplified. A reference portion of the light beam is coherently mixed with a backscattered signal portion of the light beam to yield reflectometry measurement or detection.

Claims

1. A semiconductor laser having an external cavity used for coherent frequency and time domain reflectometry comprising:

a semiconductor optical amplifier having a front and back facet and emitting a coherent light beam from said front facet;

a phase modulator receiving said coherent light beam and linearly varying an optical frequency of the laser;

an etalon selecting and stabilizing one longitudinal mode of the laser cavity for lasing, narrowing the lasing linewidth and reducing the noise of the laser;

means for varying the length of the laser cavity and thereby tuning the optical frequency of said selected longitudinal mode to track the transmission frequency of the etalon by maintaining maximum power intensity; and

means for communicating and directing a portion of said coherent light beam to said back facet of said semiconductor optical amplifier;

whereby a reference portion of said coherent light beam is coherently mixed with a back scattered signal portion of said light beam to yield coherent frequency and time domain reflectometry measurement or detection.

2. The laser, as set forth in claim 1, wherein said means for varying the laser cavity length comprises:

a detector receiving a portion of said coherent light beam and detecting its power intensity;

a wavelength selective grating; and

a piezoelectric drive coupled to said grating and varying a position thereof in response to said detected power intensity of said portion of said coherent light beam.

3. The laser, as set forth in claim 1, wherein said phase modulator applies a periodic ramp waveform modulation voltage for modulating the optical frequency of the laser.

4. The laser, as set forth in claim 1, further comprising:

a partially reflecting optical plate generating said reference portion of the coherent light beam; and

a detector receiving and sensing said reference portion of the coherent light beam.

5. The laser, as set forth in claim 4, further comprising a Faraday rotator for rotating a polarization of the reference portion of the coherent light beam by 90 degrees to direct the reference portion of the light beam to said detector.

6. The laser, as set forth in claim 4, further comprising:

means for transmitting said signal portion of said coherent light beam into a test fiber and generating said backscattered signal light; and

said detector further receiving said backscattered signal light and coherently mixing with said reference portion of the light beam.

7. The laser, as set forth in claim 6, further comprising an optical amplifier amplifying said signal portion of said light beam prior to its entry into said test fiber.

8. The laser, as set forth in claim 7, wherein said optical amplifier produces an optical pulse train with high peak power for coherent time domain reflectometry.

9. The laser, as set forth in claim 1, wherein said means for communicating and directing comprises:

at least one polarizing beam splitter transmitting only portions of the coherent light beam having a selected axis of polarization; and

means for maintaining said selected axis of polarization of portions of said light beam traveling back to said back facet of said semiconductor optical amplifier.

10. The laser, as set forth in claim 1, wherein said means for communicating and directing directs said portion of said light beam back to said back facet through said front facet as in a standing-wave cavity.

11. The method, as set forth in claim 10, wherein said step of communicating and directing comprises the steps of:

transmitting only portions of the coherent light beam having a selected axis of polarization; and

maintaining said selected axis of polarization of portions of said light beam traveling back to said origination point.

12. A method for coherent frequency and time domain reflectometry using an external cavity laser, comprising the steps of:

generating a coherent light beam at an origination point;

phase modulating said coherent light beam and linearly varying an optical frequency of the laser;

selecting and stabilizing one longitudinal mode of the laser cavity for lasing;

varying the length of the laser cavity and thereby tuning the optical frequency of said selected longitudinal mode to match the transmission frequency of an etalon by maintaining maximum power intensity;

narrowing the linewidth and reducing the noise of the laser; and

communicating and directing a portion of said coherent light beam back to said origination point, whereby a reference portion of said coherent light beam is coherently mixed with a back scattered signal portion of said light beam to yield coherent frequency and time domain reflectometry measurement or detection.

13. The method, as set forth in claim 12, wherein the step of varying the laser cavity length comprises the steps of:

receiving the coherent light beam at a wavelength selective grating;

varying a position of the wavelength selective grating by actuating a piezoelectric drive coupled thereto.

14. The method, as set forth in claim 12, wherein the step of varying the laser cavity size further comprises the steps of:

receiving a portion of said coherent light beam and detecting its power intensity; and

actuating said piezoelectric drive in response to the detected power intensity to maintain a maximum power intensity.

15. The method, as set forth in claim 12, wherein the phase modulating step further applies a periodic ramp waveform modulation voltage for modulating the optical frequency of the laser.

16. The method, as set forth in claim 12, further comprising the steps of:

generating a reference portion of the coherent light beam; and

detecting said reference portion of the coherent light beam.

17. The method, as set forth in claim 16, further comprising the steps of:

transmitting said signal portion of said coherent light beam into a test fiber and generating said backscattered signal light; and

receiving said backscattered signal light and coherently mixing with said reference portion of the light beam.

18. The method, as set forth in claim 17, further comprising the step of amplifying said signal portion of said light beam prior to its entry into said test fiber.

19. The method, as set forth in claim 18, further comprising the step of generating an optical pulse train with high peak power for coherent time domain reflectometry.

20. A semiconductor laser having an external cavity used for coherent frequency and time domain reflectometry comprising:

a light source generating and emitting a coherent light beam;

a phase modulator receiving said coherent light beam and linearly varying an optical frequency of the laser;

an etalon receiving and selectively transmitting said coherent light beam thereby selecting and stabilizing one longitudinal mode of the laser external cavity for lasing and narrowing the linewidth and reducing the noise thereof;

means for lengthening and shortening a total path length of said coherent light beam and thereby tuning the optical frequency of said selected longitudinal mode for maintaining maximum power intensity and stabilizing the selected longitudinal mode;

means for communicating and directing a portion of said coherent light beam back to said coherent light source; and

said coherent light source amplifying said returned coherent light beam and further emitting said amplified coherent light beam in the same direction, whereby a reference portion of said coherent light beam is coherently mixed with a back scattered signal portion of said light beam to yield coherent frequency and time domain reflectometry measurement or detection.