Speed sensor and conditioning circuit

• US 5,517,431 A
• Filed: 02/28/1994
• Issued: 05/14/1996
• Est. Priority Date: 02/28/1994
• Status: Expired due to Fees

• Current Assignee: Alliedsignal Inc. (Honeywell International Inc.)
• Original Assignee: Alliedsignal Truck Brake Systems Company (Estate of Heinz Hermann Thiele)
• Inventors: Pattantyus, Tamas I., Squires, Ronald E.
• Primary Examiner(s): Cosimano, Edward R.
• Application Number:
  US08/202,319
• Time in Patent Office: 806 Days
• Field of Search: 73/1 R, 73/2, 73/517 R, 73/518, 324/207.11, 324/207.15, 324/166, 324/167, 324/173, 364/481, 364/561, 364/565
• US Class Current: 702/116
• CPC Class Codes: G01P 21/02 of speedometers

Abstract

A speed signal conditioning and test circuit includes a comparator which is connected to a digital input port of a microprocessor and which switches its output in response to the alternating current generated by the sensor when sensing wheel speed. A test sequence is initiated by injecting a signal into a tuned circuit formed by the inductance of the sensor coil, the filtering capacitors, and associated circuit resistances. The voltage output of the tuned circuit increases exponentially and switches the comparator to provide a test pulse of a predetermined time period. The microprocessor times the pulse to establish that an operative sensor is present. Since the inductance of the coil is switched out of the circuit in the case of an open or shorted sensor coil, no pulse is generated and the microprocessor accordingly determines that a defective sensor is present.

Claims

1. Speed sensor and conditioning circuit for measuring the rotational speed of a rotating member, comprising a sensing head including an inductive coil, said conditioning circuit including a comparator having an active input receiving the pulses generated by the sensing head, said comparator comparing the pulses generated by the sensing head with a reference signal and generating an output signal transmitted to a digital input port of a microprocessor, said conditioning circuit further including test circuit means for receiving a test signal from said microprocessor and causing said comparator to generate an output pulse of a predetermined duration if the speed sensing head is operative, said output pulse being transmitted to said digital input port.

2. Speed sensor and conditioning circuit as claimed in claim 1, wherein said test circuit includes means for generating a time varying signal when said sensing head is operative, said comparator receiving the time varying signal at said active input and comparing said time varying signal with said reference signal to generate said output signal when the level of the time varying signal attains said reference signal.

3. Speed sensor and conditioning circuit as claimed in claim 9, wherein said test circuit means includes means responsive to said test signal for switching the value of said reference signal from a normal sensing value to at test value.

4. Speed sensor and conditioning circuit as claimed in claim 1, wherein said test circuit means includes capacitance and resistive means defining with the inductive coil a tuned electronic circuit excited by said test signal when the sensing head is operative for generating a time varying signal, said comparator receiving the time varying signal at said active input and comparing said time varying signal with said reference signal to generate said output signal when the level of the time varying signal attains said reference signal.

5. Speed sensor and conditioning circuit as claimed in claim 4, wherein said test circuit means includes means for clamping a predetermined voltage level at the active input when said coil is an open circuit thereby preventing said comparator from switching states.

6. Speed sensor and conditioning circuit as claimed in claim 4, wherein said test circuit means includes means for maintaining a level at the active input causing said comparator to switch states and remaining in the state to which said comparator is switch for indefinite time period, whereby an output signal is generated for an indefinite duration instead of an output pulse generated for said predetermined duration.

7. Speed sensor and conditioning circuit as claimed in claim 4, wherein said test circuit means includes means responsive to said test signal for switching the value of said reference signal from a normal sensing value to a test value.

8. Speed sensor and conditioning circuit as claimed in claim 7, wherein a hystersis circuit switches said normal sensing value between higher and lower level as the output of the comparator is switched between levels and also switches said test value between higher and lower values as the output of the comparator is switched during generation of said test signal.

9. Speed sensor and conditioning circuit as claimed in claim 8, wherein said test circuit means includes means for clamping a predetermined voltage level at the active input when said coil is an open circuit thereby preventing said comparator from switching states.

10. Speed sensor and conditioning circuit as claimed in claim 8, wherein said test circuit means includes means for maintaining a level at the active input causing said comparator to generate an output signal for an indefinite duration instead of said output pulse generated for said predetermined duration.

11. Method of testing a speed sensor and conditioning circuit for measuring the rotational speed of a rotating member and for transmitting a signal representing said rotational speed to a digital input port of a microprocessor, said speed sensor including a sensing head including an inductive coil, said conditioning circuit including a comparator having an active input receiving the pulses generated by the sensing head, said method including the steps of causing said microprocessor to generate a test signal, transmitting said test signal to said conditioning circuit, exciting a tuned electronic circuit including said inductive coil with said test signal for causing said tuned electronic circuit to generate a time varying signal if the sensing head is operative, transmitting said time varying circuit to said comparator, causing said comparator to generate an output pulse of a predetermined duration if the time varying signal is generated, and transmitting said output pulse to said digital input port of the microprocessor.

12. Method of testing a speed sensor as claimed in claim 11, including the steps of comparing said time varying signal with said reference signal, and generating said output signal when the level of the time varying signal attains said reference signal.

13. Method of testing a speed sensor as claimed in claim 12, including the steps of clamping a predetermined voltage level at an active input of said comparator when said coil is an open circuit thereby preventing said comparator from switching states.

14. Method of testing a speed sensor as claimed in claim 12, including the steps of maintaining a level at said active input of said comparator causing said comparator to generate an output signal for an indefinite duration instead of said output pulse generated for said predetermined duration.

15. Speed sensor and conditioning circuit for measuring the rotational speed of a rotating member, comprising a sensing head including an inductive coil, and a serrated tone wheel having circumferentially spaced serrations, said tone wheel being mounted for rotation with said rotating member, said sensing head being mounted adjacent said tone wheel and being responsive to rotation of the serrations past said sensing head to generate a pulsed output signal, said conditioning circuit including a comparator having an active input receiving the pulses generated by the sensing head, said comparator comparing the pulses generated by the sensing head with a reference signal and generating an output signal transmitted to a digital input port of a microprocessor, said conditioning circuit further including test circuit means for receiving a test signal from said microprocessor and causing said comparator to generate an output pulse of a predetermined duration if the speed sensing head is operative, said output pulse being received at said digital input port.

16. Speed sensor and conditioning circuit as claimed in claim 15, wherein said test circuit means includes capacitance and resistive means defining with the inductive coil a tuned electronic circuit excited by said test signal when the sensing head is operative for generating a time varying signal, said comparator receiving the time varying signal at said active input and comparing said time varying signal with said reference signal to generate said output signal when the level of the time varying signal attains said reference signal.

17. Speed sensor and conditioning circuit as claimed in claim 16, wherein said test circuit means includes means for clamping a predetermined voltage level at the active input when said coil is an open circuit thereby preventing said comparator from switching states.

18. Speed sensor and conditioning circuit as claimed in claim 16, wherein said test circuit means includes means for maintaining a level at the active input causing said comparator to generate an output signal for an indefinite duration instead of said output pulse generated for said predetermined duration.