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System and method for stable analysis of sampled transients arbitrarily aligned with their sample points

  • US 5,517,585 A
  • Filed: 05/05/1993
  • Issued: 05/14/1996
  • Est. Priority Date: 05/05/1993
  • Status: Expired due to Fees
First Claim
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1. A method of stably identifying and characterizing a transient data pattern contained in an electrical signal representing a physical event, a sampled representation of the electrical signal comprising a first data set having a plurality of sample points, wherein alignment of the sample points with the transient data pattern is arbitrary, the method comprising the steps of:

  • (a) analyzing the first data set using a predefined mathematical operator, the predefined mathematical operator including preselected parameters, to produce a second data set in which the transient data pattern can be detected and isolated;

    (b) detecting and isolating the transient data pattern in the second data set;

    (c) determining a location of the detected and isolated transient data pattern in the second data set;

    (d) measuring a difference between the location of the detected and isolated transient data pattern and a predetermined location of the predefined mathematical operator at a point of optimal alignment;

    (e) adjusting the preselected parameters of the predefined mathematical operator in accordance with the measured location difference such that the adjusted mathematical operator is now aligned with the detected and isolated transient data pattern at the point of optimal alignment;

    (f) reanalyzing the first data set using the aligned mathematical operator; and

    (g) characterizing the detected and isolated transient data pattern to identify the physical event causing the transient data pattern.

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