Transient digitizer with displacement current samplers

• US 5,519,342 A
• Filed: 05/11/1994
• Issued: 05/21/1996
• Est. Priority Date: 09/08/1992
• Status: Expired due to Term

• Current Assignee: Lawrence Livermore National Security LLC (Government of the United States of America)
• Original Assignee: Regents of the University of California (University of California)
• Inventors: McEwan, Thomas E.
• Primary Examiner(s): Dolinar, Andrew M.
• Application Number:
  US08/240,999
• Time in Patent Office: 741 Days
• Field of Search: 327/91, 327/94, 327/92, 324/76.15
• US Class Current: 327/94
• CPC Class Codes: G01R 19/0053 Noise discrimination; Analog sampling; Measuring transients measuring characteristics of individual pulses G01R29/02; digital sampling G01R19/2509; measuring noise figure G01R29/26
• CPC Class Codes: G11C 27/024 using a capacitive memory element G11C27/04 takes precedence
• CPC Class Codes: H03K 5/14 by the use of delay lines H03K5/133 takes precedence

Abstract

A low component count, high speed sample gate, and digitizer architecture using the sample gates is based on use of a signal transmission line, a strobe transmission line and a plurality of sample gates connected to the sample transmission line at a plurality of positions. The sample gates include a strobe pickoff structure near the strobe transmission line which generates a charge displacement current in response to propagation of the strobe signal on the strobe transmission line sufficient to trigger the sample gate. The sample gate comprises a two-diode sampling bridge and is connected to a meandered signal transmission line at one end and to a charge-holding cap at the other. The common cathodes are reverse biased. A voltage step is propagated down the strobe transmission line. As the step propagates past a capacitive pickoff, displacement current i=c(dv/dT), flows into the cathodes, driving the bridge into conduction and thereby charging the charge-holding capacitor to a value related to the signal. A charge amplifier converts the charge on the charge-holding capacitor to an output voltage. The sampler is mounted on a printed circuit board, and the sample transmission line and strobe transmission line comprise coplanar microstrips formed on a surface of the substrate. Also, the strobe pickoff structure may comprise a planar pad adjacent the strobe transmission line on the printed circuit board.

Claims

1. A high speed sampler, comprising:

a sample transmission line for transmitting an input signal;

a single unbalanced strobe transmission line for transmitting a strobe signal; and

sampler circuitry, coupled to the strobe transmission line and the sample transmission line at a plurality of positions, which samples the input signal at the plurality of positions in response to charge displacement caused by propagation of the strobe signal on the strobe transmission line to supply a plurality of samples of the input signal.

2. The high speed sampler of claim 1, wherein the sampler circuitry includes a plurality of sample gates having sample line inputs coupled to the sample transmission line at respective ones of the plurality of positions, and having strobe line inputs positioned near the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement sufficient to trigger the sample gate.

3. The high speed sampler of claim 2, wherein the strobe transmission line, sample transmission line and strobe line inputs comprise substantially co-planar conductors.

4. The high speed sampler of claim 1, wherein the sampler circuitry includes a plurality of sample gates, at least one of the plurality of sample gates comprising charge holding circuitry;

a first diode having an anode coupled to the sample transmission line at one of the plurality of positions and a cathode;

a second diode having an anode coupled to the charge holding circuitry and a cathode;

a bias circuit coupled to the cathodes of the first and second diodes which tends to reverse bias the first and second diodes; and

a strobe line input coupled to the cathodes of the first and second diodes, positioned adjacent the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement current in the bias circuit sufficient to forward bias the first and second diodes for a short time interval.

5. The high speed sampler of claim 4, wherein the charge holding circuitry comprises:

a first capacitor coupled to the anode of the second diode;

an amplifier coupled to the first capacitor which generates an output indicating an amount of charge in the first capacitor; and

a track and hold circuit coupled to the output of the amplifier.

6. The high speed sampler of claim 1, wherein the strobe transmission line and sample transmission line comprise substantially co-planar conductors.

7. A high speed sampler, comprising:

a substantially planar substrate having a particular surface;

a sample transmission line on the particular surface of the planar substrate for transmitting an input signal;

a strobe transmission line on the particular surface of the planar substrate for transmitting a strobe signal; and

sampler circuitry, coupled to the strobe transmission line and the sample transmission line at a plurality of positions, which samples the input signal at the plurality of positions in response to the strobe signal on the strobe transmission line to supply a plurality of samples of the input signal;

wherein the sampler circuitry includes a plurality of sample gates, having sample line inputs coupled to the sample transmission line at respective ones of the plurality of positions, and having strobe line inputs positioned near the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement sufficient to trigger the sample gate.

8. The high speed sampler of claim 7, wherein the strobe line inputs comprise conductors on the particular surface of the planar substrate.

9. The high speed sampler of claim 7, wherein the sample transmission line comprises a meandered strip, such that propagation times between respective ones of the plurality of positions are longer for the input signal on the sample transmission line than for the strobe signal on the strobe transmission line.

10. The high speed sampler of claim 7, wherein the sampler circuitry includes a plurality of sample gates, at least one of the charge holding circuitry;

a first diode having an anode coupled to the sample transmission line at one of the plurality of positions and a cathode;

a second diode having an anode coupled to the charge holding circuitry and a cathode;

a bias circuit coupled to the cathodes of the first and second diodes which tends to reverse bias the first and second diodes; and

a strobe line input coupled to the cathodes of the first and second diodes, positioned adjacent the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement current in the bias circuit sufficient to forward bias the first and second diodes for a short time interval.

11. The high speed sampler of claim 10, wherein the charge holding circuitry comprises:

a first capacitor coupled to the anode of the second diode;

an amplifier coupled to the first capacitor which generates an output indicating an amount of charge in the first capacitor; and

a track and hold circuit coupled to the output of the amplifier.

12. A high speed sampler, comprising:

a substantially planar substrate having a particular surface;

a sample transmission line on the particular surface of the planar substrate for transmitting an input signal, the sample transmission line comprising a meandered strip conductor;

a strobe transmission line on the particular surface of the planar substrate for transmitting a strobe signal; and

sampler circuitry, having a plurality of sample gates in a corresponding plurality of positions coupled to the strobe transmission line and the sample transmission line, which samples the input signal at the plurality of positions in response to the strobe signal on the strobe transmission line to supply a plurality of samples of the input signal, sample gates in the plurality of sample gates comprising charge holding circuitry;

a first diode having an anode coupled to the sample transmission line at one of the plurality of positions and a cathode;

a second diode having an anode coupled to the charge holding circuitry and a cathode;

a bias circuit coupled to the cathodes of the first and second diodes which tends to reverse bias the first and second diodes; and

a strobe line input coupled to the cathodes of the first and second diodes, positioned adjacent the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement current in the bias circuit sufficient to forward bias the first and second diodes for a short time interval.

13. The high speed sampler of claim 12, wherein the charge holding circuitry comprises:

a first capacitor coupled to the anode of the second diode;

an amplifier coupled to the first capacitor which generates an output indicating an amount of charge in the first capacitor; and

a track and hold circuit coupled to the output of the amplifier.

14. An apparatus, comprising:

a sample transmission line for transmitting an input signal;

a strobe transmission line for transmitting a strobe signal;

sampler circuitry, coupled to the strobe transmission line and the sample transmission line at a plurality of positions, which samples the input signal at the plurality of positions in response to the strobe signal on the strobe transmission line to supply a plurality of samples of the input signal, wherein the plurality of positions are spaced apart on the sample transmission line by intervals corresponding to expected characteristics of the input signal; and

an output circuit which receives the plurality of samples and generates an output in response to the plurality of samples;

wherein the output circuit comprises a multiplier.

15. The apparatus of claim 14, wherein the sampler circuitry includes a plurality of sample gates having sample line inputs coupled to the sample transmission line at respective ones of the plurality of positions, and having strobe line inputs positioned near the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement sufficient to trigger the sample gate.

16. The apparatus of claim 15, wherein the strobe transmission line, sample transmission line and strobe line inputs comprise substantially co-planar conductors.

17. The apparatus of claim 14, wherein the sampler circuitry includes a plurality of sample gates, at least one of the plurality of sample gates comprising

charge holding circuitry;

a first diode having an anode coupled to the sample transmission line at one of the plurality of positions and a cathode;

a second diode having an anode coupled to the charge holding circuitry and a cathode;

a bias circuit coupled to the cathodes of the first and second diodes which tends to reverse bias the first and second diodes; and

a strobe line input coupled to the cathodes of the first and second diodes, positioned adjacent the strobe transmission line such that propagation of the strobe signal on the strobe transmission line induces charge displacement current in the bias circuit sufficient to forward bias the first and second diodes for a short time interval.

18. The apparatus of claim 17, wherein the charge holding circuitry comprises:

a first capacitor coupled to the anode of the second diode;

an amplifier coupled to the first capacitor which generates an output indicating an amount of charge in the first capacitor; and

a track and hold circuit coupled to the output of the amplifier.

19. The apparatus of claim 14, wherein the strobe transmission line and sample transmission line comprise substantially co-planar conductors.