Device for measuring parameters, in particular parameters relating to aircraft or vehicle wheels
First Claim
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1. A device for measuring parameters, said device comprising:
- a sensor for generating a parameter measuring signal, said sensor being subject to drift caused by at least one interference factor;
means responsive to said interference factor for generating an interference measuring signal related to the magnitude of said interference factor;
a first memory means connected to said sensor for storing particular sensor data comprising response data relating to the response curve of said sensor for a reduced number of possible values of the interference factor;
a second memory means independent of said sensor for storing typical sensor data comprising typical drift data relating to typical sensor drift for at least one type of sensor over substantially the entire range of interference;
transmitting means for conditioning and transmitting said parameter measuring signal and said interference measuring signal together with said particular sensor data; and
processing means for receiving said typical sensor data from said second memory means, for receiving from said transmitting means said interference measuring signal and said parameter measuring signal together with said particular sensor data, and for determining from said particular sensor data and said typical sensor data, and from the values of said interference measuring signal and said parameter measuring signal, the correction to be applied to the value of said parameter measuring signal to compensate for drift.
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Abstract
A device for measuring parameters such as the pressure in a tire comprises a pressure sensor subject to drift conditioned by temperature. The sensor comprises a temperature-sensitive arrangement to generate a temperature signal and transmit it with the pressure signal to a processor. The processor is adapted to deduce a correction to the value of the pressure measurement signal from the value of the signal representative of the interference.
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Citations
8 Claims
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1. A device for measuring parameters, said device comprising:
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a sensor for generating a parameter measuring signal, said sensor being subject to drift caused by at least one interference factor; means responsive to said interference factor for generating an interference measuring signal related to the magnitude of said interference factor; a first memory means connected to said sensor for storing particular sensor data comprising response data relating to the response curve of said sensor for a reduced number of possible values of the interference factor; a second memory means independent of said sensor for storing typical sensor data comprising typical drift data relating to typical sensor drift for at least one type of sensor over substantially the entire range of interference; transmitting means for conditioning and transmitting said parameter measuring signal and said interference measuring signal together with said particular sensor data; and processing means for receiving said typical sensor data from said second memory means, for receiving from said transmitting means said interference measuring signal and said parameter measuring signal together with said particular sensor data, and for determining from said particular sensor data and said typical sensor data, and from the values of said interference measuring signal and said parameter measuring signal, the correction to be applied to the value of said parameter measuring signal to compensate for drift. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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Specification