Test disk having defect patterns uniformly distributed in recording areas
First Claim
1. A test disk having defect patterns in recording areas, comprising:
- a plurality of recording areas in which test data signals are recorded in a form of data pits; and
a plurality of defect patterns which are uniformly arranged in the recording areas and interrupt the data pits in the recording areas,said defect patterns comprising a set of lines of small patterns, said small patterns extending along each line in a first direction of the test disk, said lines of said small patterns overlapping each other with respect to a direction perpendicular to the first direction, and said small patterns being shifted relative to one another along the lines.
2 Assignments
0 Petitions
Accused Products
Abstract
A test disk having defect patterns uniformly arranged in recording areas is produced by a production method including: producing a stamper having a plurality of data pits in accordance with test data signals recorded on the test disk; radiating laser light to the stamper by using a laser system so that a plurality of small patterns are produced at laser-light exposed portions along first lines on the stamper, to form interruptions, which interrupt the data pits on the stamper, in accordance with the small patterns; and performing injection molding with plastic material to produce a disk based on the stamper, so that the disk has interruptions corresponding to the interruptions of the stamper, and the interruptions of the disk are included in a recording layer of the disk.
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Citations
4 Claims
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1. A test disk having defect patterns in recording areas, comprising:
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a plurality of recording areas in which test data signals are recorded in a form of data pits; and a plurality of defect patterns which are uniformly arranged in the recording areas and interrupt the data pits in the recording areas, said defect patterns comprising a set of lines of small patterns, said small patterns extending along each line in a first direction of the test disk, said lines of said small patterns overlapping each other with respect to a direction perpendicular to the first direction, and said small patterns being shifted relative to one another along the lines. - View Dependent Claims (2, 3, 4)
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Specification