Coordinate measurement machine having a probe head and an electronic system for processing probe signals

• US 5,526,576 A
• Filed: 09/12/1994
• Issued: 06/18/1996
• Est. Priority Date: 09/13/1993
• Status: Expired due to Term

• Current Assignee: Carl Zeiss Industrielle Messtechnik GmbH (Carl-Zeiss-Stiftung)
• Original Assignee: Heidenheim Carl-Zeiss-Stiftung
• Inventors: Aubele, Eugen, Fuchs, Anton, Kern, Rudi, Puntigam, Walter, Aubele, Karl-Eugen, Rogele, Rudolf
• Primary Examiner(s): Cuchlinski, Jr., William A.
• Assistant Examiner(s): Bennett, G. Bradley
• Application Number:
  US08/304,709
• Time in Patent Office: 645 Days
• Field of Search: 33/1 M, 33/503, 33/504, 33/505, 33/556, 33/557, 33/558.3, 33/559, 33/560
• US Class Current: 33/503
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G01B 7/012 Contact-making feeler heads therefor

Abstract

The electronic system (20) of the probe head of a coordinate measuring machine permits the digital setting of parameters which determine the nature and manner of signal processing, such as trigger levels, the characteristic of frequency filters, and time intervals between several coherent probe signal pulses. Different parameter combinations are stored together in data files which can be called up in accordance with the selected measurement task or in accordance with the probe configuration which has been installed in probe head.

Claims

1. A coordinate-measurement machine having one or more probe heads (10) with associated replaceable probes (15, 61 to 64) and an electronic system (20) for processing probe signals (a, b, c, k) produced in the course of a work-probing procedure, wherein the electronic system (20) includes resettable means that permits parameters to be set to determine the manner and nature of signal processing, the parameters being set digitally, a plurality of data files for storage of a plurality of different sets of parameter values, and means for calling up a selected set of values of different parameters stored in a data file (*.ST3) to reset said resettable means in accordance with a selected measurement task.

2. A coordinate-measurement machine according to claim 1, in which the data files (*.ST3) are associated with a plurality of selected probe pins (61 to 64), and the values of the parameters stored in the corresponding data file (*.ST3) can be set upon workpiece contact with the corresponding probe pin (61 to 64).

3. A coordinate-measurement machine according to claim 2, in which an identification code (61) is associated with the replaceable probes to be introduced, and in which the selection of the corresponding parameter data file is effected under the control of the code.

4. A coordinate-measurement machine according to claim 1, in which the data files (*.ST3) are associated with selected types of machine operation within the capability of the coordinate-measurement machine, and are activated upon a change in the type of machine operation, the values of the stored parameters being set for operation of the coordinate-measurement machine upon making such a change in machine operation.

5. A coordinate-measurement machine according to claim 1, in which the electronic system includes a digitally encoded analysis program for analysis of the course of a probe signal at different points in the probe-pin electronic system and for setting parameters in accordance with the analysis.

6. A coordinate-measurement machine according to claim 1, in which the electronic system includes a digitally encoded module which sets different parameter combinations during a trial run in which a workpiece is contacted several times and which sets the parameters in accordance with the measurement results thereby obtained.

7. A coordinate-measurement machine according to claim 1, in which the machine includes a computer and in which the electronic system (20) is connected via a serial bus (CAN) to control means (21), the control means (21) being connected to the computer (22) of the coordinate-measurement machine.

8. A coordinate-measurement machine according to claim 1, in which the electronic system contains a microprocessor having several analog inputs (A1 to A8) which are respectively connected with different points (A1 to A8) within the electronic system for probe-signal processing, and that the course in time of the probe signals occurring during a work-contacting procedure at the analog-input points (A1 to A8) are stored in a memory component (RAM 26) of the microprocessor (23).

9. A coordinate-measurement machine according to claim 8, in which the electronic system (20) includes means for connecting the electronic system to a modem over which stored signal courses (A1 to A8) can be remotely transmitted.

10. A coordinate-measurement machine according to claim 8, including means for serial-bus (CAN) transmission of signal courses stored in the memory component (RAM 26) of the microprocessor.

11. A coordinate-measurement machine according to claim 1, in which the values of the parameters set by the electronic system (20) are stored in a random-access memory (25).

12. A coordinate-measurement machine according to claim 1, in which the probe head supplies at least two different contact signals (a, b, c, k), and the electronic system concurrently processes each of the at least two signals (a, b, c) in parallel in separate signal branches (N1M1, N1M2, MESK).

13. A coordinate-measurement machine according to claim 1, in which the machine includes a computer (22), and in which the electronic system (20) is connected via a serial bus directly to the computer (22) of the coordinate-measurement machine.

14. A coordinate-measurement machine according to claim 1, in which the data files (*.ST3) are associated with a plurality of selected probe configurations, and the values of the parameters stored in the corresponding data file (*.ST3) are set upon workpiece contact with the selected probe configuration.

15. A coordinate-measurement machine according to claim 1, in which the data files (*.ST3) are associated with a plurality of selected different types of probe heads, and the values of the parameters stored in the corresponding data file (*.ST3) can be set upon workpiece-contact involvement of a selected probe head.

16. A coordinate-measurement machine according to claim 1, in which the data files (*.ST3) are associated with different measurement tasks, and are activated upon a change in measurement task, the values of the stored parameters being set for operation of the coordinate-measuring machine upon making a change in measurement task.

17. A coordinate-measurement machine according to claim 1, in which the machine includes a computer and in which the electronic system (20) is connected via a serial interface to control means (21), the control means (21) being connected to the computer (22) of the coordinate-measurement machine.

18. A method for coordinate-measurement on workpieces using a probe head (i) adapted for interchangeable use of a selected one of a plurality of associated replaceable probes (61 to 64) and (ii) having an electronic system (20) for processing signals (a, b, c, k) produced upon probe contact with a workpiece, (iii) wherein the electronic system permits the resetting of at least two different parameters which determine the nature and manner of signal processing, and further wherein

for specific measurement tasks and for each selectable probe, particularly suitable sets of parameter values are determined and the thus-determined sets of parameter values are stored in different data files;

the corresponding data files are called up upon a change in measurement task, and the applicable stored set of parameter values is loaded into the electronic system to reset parameter values therein; and

signal-processing then proceeds for the changed measurement task using the newly loaded set of parameter values.

19. A method according to claim 18, in which different measurement tasks are selected in accordance with at least one of the following criteria:

the speed of measurement,

the relative accuracy of measurement to be obtained, and

the type or material of the object to be measured.

20. A method according to claim 18, in which at least two of the following parameters can be set:

the sensitivity of an amplifier (37) for the probe signal;

the characteristics of a frequency filter (31,

     41) for the probe signal;

the threshold level of a trigger circuit (35, 38, 45,

     48) for the probe signals;

the permissible duration (F1, F2, F3) of the probe signal;

the permissible timing of several interrelated probe-signal pulses (51 to

     54);

the selection as to which of several probe signals (51 to

     54) is to be further processed (mode of operation).

21. A method according to claim 20, in which the frequency filter is a band-pass filter in the form of a switched-capacitance filter having a microprocessor connection.

22. A method according to claim 20, in which the frequency filter is a high-pass filter in the form of a switched-capacitance filter having a microprocessor connection.

23. A method according to claim 18, in which the loading of sets of parameter values and the setting of said values in the electronic system takes place automatically in accordance with a program-controlled analysis of the probe signal obtained in the course of a workpiece-contacting procedure.

24. A method according to claim 18 in which, for the selection of optimal parameters, several contacting procedures with different parameters are performed in a test run.

25. A method according to claim 18, in which the loading and setting of sets of parameter values in the electronic system takes place automatically, pursuant to and controlled by a change of probe head.

26. A method according to claim 18, in which, for the selection of optimal parameters, several contacting procedures with different combinations of parameters are performed in a test run.

27. A method according to claim 18, in which the loading and setting of sets of parameter values in the electronic system takes place automatically, pursuant to and controlled by a change of probe pin.

28. A method according to claim 18, in which the loading and setting of sets of parameter values in the electronic system takes place automatically, pursuant to and controlled by a change of probe combination.

29. A coordinate-measuring machine, comprising:

a computer;

probe means including means for producing a probe signal in the course of a work-probing procedure;

signal-processing electronics for processing said probe signal, said electronics being connected to said signal-producing means and comprising means for setting at least two different parameters determining the manner and nature of processing said signal;

setting means for digitally setting said parameters to predetermined values;

one or more data files stored in said computer, each data file containing a set of values for said at least two different parameters; and

means for calling up from said computer a selected one of said data files and forwarding the set of values contained therein to said setting means.

30. A coordinate-measuring machine, comprising:

a computer;

probe means with means for mounting exchangeable probe pins of differing type, and means for producing a probe signal when one of said probe pins touches a workpiece;

signal-processing means for processing said probe signal, said signal-processing means being connected to said signal-producing means and comprising means for setting at least two different parameters determining the manner and nature of processing said probe signal according to the type of probe pin mounted to said probe means;

setting means for digitally setting said parameters to predetermined values;

one or more data files stored in said computer, each data file containing a set of values for said at least two different parameters; and

means for calling up a selected one of said data files and for forwarding the set of values contained therein to said setting means.

31. A method for coordinate-measurement on workpieces using a probe head adapted for interchangeable use of a selected one of a plurality of associated replaceable probes and being connected to an electronic signal-processing system for processing signals produced upon probe contact with a workpiece, wherein the electronic system permits the setting of at least two different parameters, said method comprising the steps of:

creating at least two different data files, each data file containing a set of at least two different parameter values which determine the nature and manner of processing said signals;

storing said data files;

calling up a selected one of said data files, and loading the set of parameter values contained therein into said electronic system, thereby resetting said different parameters to the parameter values contained in the selected data file; and

using the newly loaded set of parameter values in the processing of one or more signals produced upon probe contact with the workpiece.

32. A method for coordinate-measurement on workpieces using a probe head adapted for interchangeable use of a selected one of a plurality of associated replaceable probes and being connected to an electronic signal-processing system for processing signals produced upon probe contact with a workpiece, wherein the electronic system permits the resetting of at least two different parameters, said method comprising the steps of:

creating at least two different data files, each data file containing a set of at least two different parameter values which determine the nature and manner of processing said signals according to a selected one of several different measurement tasks;

storing said data files;

selecting one of the different measurement tasks;

calling up the selected one of said data files and loading the set of parameter values contained therein into said electronic system, thereby resetting said different parameters to the parameter values contained in said selected data file; and

processing said signals during performance of the selected measurement task using the newly loaded set of parameter values.