Apparatus and method for ion beam polishing and for in-situ ellipsometric deposition of ion beam films
First Claim
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1. The method of polishing a surface of a substrate to an improved surface flatness, comprising the steps of:
- establishing a vacuum equal to or exceeding 10-8 torr in a vacuum chamber;
mounting the substrate for rotation in the chamber;
directing an ion beam from a gun at the rotating substrate surface at an oblique angle of approximately 45 to 60 degrees between the substrate and the center line of the gun to the substrate; and
,maintaining the ion beam until 200 or more angstroms of surface have been removed from the substrate to achieve a surface smoothness of 1/2 to 3/4 angstrom.
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Abstract
The invention uses an ion beam to polish a rotatable substrate from an oblique angle between the horizontal and the center line of the gun to the substrate to upgrade the quality of substrates. Alternatively, the substrates are left in the high vacuum chamber without breaking the vacuum for in-situ deposition of thin films thereby avoiding contamination, and to provide premium optics. A wobble stick arrangement is provided to align the ellipsometer reflected beam with the ellipsometer detector during operation without breaking the vacuum which, if broken, would admit contamination.
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Citations
26 Claims
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1. The method of polishing a surface of a substrate to an improved surface flatness, comprising the steps of:
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establishing a vacuum equal to or exceeding 10-8 torr in a vacuum chamber; mounting the substrate for rotation in the chamber; directing an ion beam from a gun at the rotating substrate surface at an oblique angle of approximately 45 to 60 degrees between the substrate and the center line of the gun to the substrate; and
,maintaining the ion beam until 200 or more angstroms of surface have been removed from the substrate to achieve a surface smoothness of 1/2 to 3/4 angstrom. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. The method of polishing and in-situ coating a substrate in a vacuum chamber comprising the steps of:
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using an ion gun beam to polish the substrate to a flatness of 1/2 to 3/4 angstrom by directing the ion gun beam at the substrate from an oblique angle of 45-60 degrees relative to the substrate while the substrate is being rotated; and using a second ion gun to deposit the coating in-situ without breaking the vacuum to achieve super reflectivity in the coating. - View Dependent Claims (9)
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10. The method of polishing and coating substrates using a vacuum gas chamber to produce anti-reflection coatings, comprising the steps of:
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using a first ion gun integral with the chamber using a first gas to polish the substrates to 1/2 to 3/4 angstrom flatness by directing the ion beam at the rotating substrate from an oblique angle of 45 to 60 degrees relative to the substrates for a length of time necessary to obtain said degree of flatness determined by timing the polishing based on prior known polishing times for the same materials; using a second ion gun having a second gas to deposit said coating to form the anti-reflection coating; and
,using a cryogenic pump to maintain said chamber free of contaminants and at about 10-8 torr. - View Dependent Claims (11, 12, 13)
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14. An apparatus for polishing substrate surfaces to an improved surface flatness, comprising in combination:
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a vacuum chamber having an ultra high vacuum equal to or exceeding 10-8 torr; an ion beam gun; means mounting a substrate having a previously polished surface in the chamber; means for directing the ion beam from said gun at the substrate polished surface at an oblique angle of 45-60 degrees between the substrate and the centerline of the gun to the substrate; means for rotating said substrate; and means for maintaining the ion beam until 200 or more angstroms of surface have been removed from the substrate to achieve a surface flatness of 1/2 to 3/4 angstrom. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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21. Apparatus for further polishing and in-situ coating a previously polished substrate in a vacuum chamber comprising in combination:
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means for mounting the previously polished substrate for rotation in the chamber; an ion gun having a beam to polish the substrate to a flatness of 1/2 to 3/4 angstrom; means for directing the ion gun beam at the substrate from an oblique angle of 45-60 degrees relative to the horizontal; means for rotating the substrate while in the beam; and
,a second ion gun to deposit the coating in-situ without breaking the vacuum to achieve improved reflectivity in the coating. - View Dependent Claims (22)
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23. Apparatus for further polishing and coating previously polished substrates using a vacuum gas chamber to produce anti-reflection coatings, comprising in combination:
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means for rotating the substrates in the chamber; a first ion gun integral with the chamber in a first gas to polish the substrates to 1/2 to 3/4 angstrom flatness by directing the ion beam at the rotating substrate from an oblique angle of approximately 45 to 60 degrees relative to the substrate for an amount of time necessary to obtain said degree of flatness determined by timing the polishing based on prior known polishing times for the same materials; a second gas and a second ion gun to deposit said coating, layer by layer, to form the anti-reflection coating; and
,a cryogenic pump to maintain said chamber free of contaminants and at about 10-8 torr. - View Dependent Claims (24, 25, 26)
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Specification