Structure capable of simultaneously testing redundant and non-redundant memory elements during stress testing of an integrated circuit memory device
First Claim
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1. An integrated circuit memory device, comprising:
- a plurality of non-redundant memory elements, arranged in a plurality of rows and a plurality of columns;
at least one redundant memory element, suitable for replacing a non-redundant memory element that is defective; and
enabling means, coupled to said plurality of non-redundant memory elements and said at least one redundant memory element and contained within a redundant element circuit, for selectively enabling the at least one redundant memory element when a stress test signal is equal to a first predetermined logic level indicative of a stress test mode such that the at least one redundant memory element and the plurality of non-redundant memory elements may be concurrently stress tested when the plurality of non-redundant memory elements are also enabled.
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Abstract
The redundant elements of an integrated circuit memory device having a plurality of redundant and non-redundant elements such as rows, columns, wordlines, and blocks, may be selectively enabled during a stress test mode so that both redundant elements and non-redundant elements may be stress tested concurrently. Enabling capabilities contained within the redundant element circuitry selectively enables the redundant elements when a stress test signal is equal to a predetermined value, indicative of a stress test mode.
33 Citations
42 Claims
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1. An integrated circuit memory device, comprising:
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a plurality of non-redundant memory elements, arranged in a plurality of rows and a plurality of columns; at least one redundant memory element, suitable for replacing a non-redundant memory element that is defective; and enabling means, coupled to said plurality of non-redundant memory elements and said at least one redundant memory element and contained within a redundant element circuit, for selectively enabling the at least one redundant memory element when a stress test signal is equal to a first predetermined logic level indicative of a stress test mode such that the at least one redundant memory element and the plurality of non-redundant memory elements may be concurrently stress tested when the plurality of non-redundant memory elements are also enabled. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A method for enabling and stress testing one or more redundant memory elements of an integrated circuit memory device, comprising the steps of:
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selectively enabling at least one redundant memory element of the integrated circuit memory device, through an enabling means contained within a redundant element circuit, when a stress test signal is equal to a first predetermined logic level, wherein the integrated circuit memory device comprises a plurality of non-redundant memory elements and the redundant memory element, wherein the plurality of non-redundant memory elements are arranged in a plurality of rows and a plurality of columns, and the redundant memory element is suitable for replacing a non-redundant memory element that is defective; and concurrently stress testing the redundant memory element and the plurality of non-redundant memory elements when the plurality of non-redundant memory elements are also enabled. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42)
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Specification